IPC분류정보
국가/구분 |
United States(US) Patent
등록
|
국제특허분류(IPC7판) |
|
출원번호 |
US-0100679
(2011-05-04)
|
등록번호 |
US-8153506
(2012-04-10)
|
우선권정보 |
JP-2002-365566 (2002-12-17) |
발명자
/ 주소 |
- Anzai, Aya
- Maruyama, Junya
|
출원인 / 주소 |
- Semiconductor Energy Laboratory Co., Ltd.
|
대리인 / 주소 |
|
인용정보 |
피인용 횟수 :
4 인용 특허 :
24 |
초록
▼
It is provided a contacting method when a plurality of films to be peeled are laminating. Reduction of total layout area, miniaturization of a module, weight reduction, thinning, narrowing a frame of a display device, or the like can be realized by sequentially laminating a plurality of films to be
It is provided a contacting method when a plurality of films to be peeled are laminating. Reduction of total layout area, miniaturization of a module, weight reduction, thinning, narrowing a frame of a display device, or the like can be realized by sequentially laminating a plurality of films to be peeled which are once separately formed over a plastic film or the like. Moreover, reliable contact having high degree of freedom is realized by forming each layer having a connection face of a conductive material and by patterning with the use of a photomask having the same pattern.
대표청구항
▼
1. A method for manufacturing a semiconductor device, comprising the steps of: forming a first thin film transistor and a first connecting portion, over a first substrate;forming a second thin film transistor and a second connecting portion, over a second substrate;connecting the first connecting po
1. A method for manufacturing a semiconductor device, comprising the steps of: forming a first thin film transistor and a first connecting portion, over a first substrate;forming a second thin film transistor and a second connecting portion, over a second substrate;connecting the first connecting portion electrically with the second connecting portion, andinterposing a first adhesive between the first substrate and the second substrate to fix the first substrate and the second substrate,wherein the first connecting portion comprises a first patterned conductive material,wherein the second connecting portion comprises a second patterned conductive material,wherein the first patterned conductive material has at least a same pattern as the second patterned conductive material, andwherein the same pattern has at least one reentrant angle and at least five salient angles. 2. The method for manufacturing a semiconductor device according to claim 1, wherein the first thin film transistor and the first connecting portion are included in a first film,wherein the second thin film transistor and the second connecting portion are included in a second film,wherein the first film is fixed to the first substrate by a second adhesive, andwherein the second film is fixed to the second substrate by a third adhesive. 3. The method for manufacturing a semiconductor device according to claim 1, wherein the first thin film transistor is electrically connected to the first connecting portion, andwherein the second thin film transistor is electrically connected to the second connecting portion. 4. The method for manufacturing a semiconductor device according to claim 1, wherein the first adhesive is an anisotropic conductive adhesive. 5. The method for manufacturing a semiconductor device according to claim 1, wherein the first substrate and the second substrate are flexible substrates. 6. A method for manufacturing a semiconductor device, comprising the steps of: forming a first thin film transistor and a first connecting portion, over a first substrate;forming an EL layer and a second connecting portion, over a second substrate;connecting the first connecting portion electrically with the second connecting portion, andinterposing a first adhesive between the first substrate and the second substrate to fix the first substrate and the second substrate,wherein the first connecting portion comprises a first patterned conductive material,wherein the second connecting portion comprises a second patterned conductive material,wherein the first patterned conductive material has at least a same pattern as the second patterned conductive material, andwherein the same pattern has at least one reentrant angle and at least five salient angles. 7. The method for manufacturing a semiconductor device according to claim 6, wherein the first thin film transistor and the first connecting portion are included in a first film,wherein the EL layer and the second connecting portion are included in a second film,wherein the first film is fixed to the first substrate by a second adhesive, andwherein the second film is fixed to the second substrate by a third adhesive. 8. The method for manufacturing a semiconductor device according to claim 6, wherein the first thin film transistor is electrically connected to the first connecting portion, andwherein the EL layer is electrically connected to the second connecting portion. 9. The method for manufacturing a semiconductor device according to claim 6, wherein the first adhesive is an anisotropic conductive adhesive. 10. The method for manufacturing a semiconductor device according to claim 6, wherein the first substrate and the second substrate are flexible substrates. 11. The method for manufacturing a semiconductor device according to claim 7, wherein the second film further comprises a second thin film transistor.
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