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A tamper-proof, point-of-collection specimen assay apparatus including three selectively connectable and sealable chambers, including a first chamber for receiving a specimen, a second chamber housing a specimen testing device and a specimen transfer site positioned between the first chamber and the

A tamper-proof, point-of-collection specimen assay apparatus including three selectively connectable and sealable chambers, including a first chamber for receiving a specimen, a second chamber housing a specimen testing device and a specimen transfer site positioned between the first chamber and the second chamber for selectively depositing a portion of the specimen from the first chamber into the second chamber and a third chamber having inlets for depositing another portion of the specimen from the first chamber into the third chamber.

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1. A specimen collection method comprising, providing a specimen receptacle,depositing a specimen into a first chamber of the receptacle,providing a lid,forcing a first aliquot of the specimen into a second chamber in a bottom of the receptacle that contains a testing device by a plunger that is imm

1. A specimen collection method comprising, providing a specimen receptacle,depositing a specimen into a first chamber of the receptacle,providing a lid,forcing a first aliquot of the specimen into a second chamber in a bottom of the receptacle that contains a testing device by a plunger that is immobilized to a bottom side of the lid; andtransferring a second aliquot of the specimen into a third chamber defined by the plunger. 2. The method according to claim 1 wherein placing the lid onto the receptacle creates a seal between the first chamber and the second chamber. 3. The method according to claim 2 further comprising analyzing the first aliquot and the specimen in the first chamber. 4. The method according to claim 1 wherein placing the lid onto the receptacle creates a first seal between the first chamber and the third chamber chamber. 5. The method according to claim 4 wherein placing the lid onto the receptacle creates a second seal between the first chamber and the second chamber. 6. The method according to claim 4 further comprising analyzing the first aliquot and the second aliquot. 7. The method according to claim 6 further comprising analyzing the specimen contained within the first chamber. 8. The method according to claim 1 further comprising forming a plurality of seals within the receptacle by inserting the plunger into the receptacle wherein the plurality of seals separate the first aliquot, the second aliquot and the specimen contained within the first chamber away from one another. 9. The method according to claim 8 further comprising analyzing the first aliquot, the second aliquot and the specimen contained within the first chamber. 10. The method according to claim 1 further comprising contaminating the first aliquot with the testing device without contaminating the specimen contained within the first chamber. 11. A specimen collection method comprising, providing a specimen receptacle,depositing a specimen into a first chamber of the receptacle through an open top of the receptacle,forcing a first aliquot of the specimen out of the first chamber, through a passage, and downward into a second chamber containing a testing device by a plunger;transferring a second aliquot of the specimen into a third chamber defined by the plunger by inserting the plunger into the first chamber, andaccessing the specimen contained within the first chamber through a first selectively closeable opening in a lid covering the first chamber and accessing the second aliquot through a second selectively closeable opening in the lid. 12. The method according to claim 11 wherein the plunger is screwed onto the receptacle. 13. The method according to claim 11 further comprising analyzing the second aliquot and the specimen contained within the first chamber. 14. The method according to claim 11 further comprising sealing the first chamber by placing the lid over the open top of the receptacle. 15. The method according to claim 14 further comprising sealing the second chamber from the first chamber by placing the lid over the open top of the receptacle. 16. The method according to claim 15 further comprising sealing a third chamber defined by the plunger from the second chamber and the first chamber by placing the lid over the open top of the receptacle. 17. The method according to claim 14 wherein placing the lid over the open top of the receptacle inserts the plunger into the first chamber. 18. The method according to claim 11 further comprising contaminating the first aliquot with the testing device without contaminating the specimen within the first chamber. 19. A specimen collection method comprising, providing a specimen receptacle;providing a lid;depositing a specimen into a first chamber of the receptacle through an open top of the receptacle;forcing a first aliquot of the specimen out of the first chamber, through a passage, and downward into a second chamber containing a testing device by a plunger that is immobilized to a bottom side of the lid;transferring a second aliquot of the specimen into a third chamber defined by the plunger, andseparating the first aliquot, the second aliquot of the specimen and the specimen contained within the first chamber away from one another by at least one seal and separately analyzing each of the first aliquot, the second aliquot and the specimen contained within the first chamber. 20. A specimen collection method comprising, providing a receptacle including a first chamber, a second chamber extending below the first chamber and containing a testing device, an elongate third chamber and a lid;depositing a specimen into the first chamber;inserting the third chamber into the first chamber and forcing a first aliquot of the specimen out of the first chamber and into the second chamber where it contacts the testing device by attaching the lid to the receptacle; andcontaminating the first aliquot with the testing device without contaminating the specimen contained within the first chamber. 21. The method according to claim 20 whereby attaching the lid to the receptacle seals the first chamber from the second chamber. 22. The method according to claim 20 wherein the testing device is not inserted through the lid. 23. The method according to claim 22 wherein the first aliquot is forced downward by a lower wall portion of the third chamber into the second chamber. 24. The method according to claim 20 further comprising inserting the testing device into the second chamber through an opening located adjacent to an open top of the first chamber. 25. The method according to claim 20 further comprising contacting a lower wall partially defining the third chamber with a receptacle wall disposed between the first chamber and the second chamber. 26. The method according to claim 20 further comprising forcing the first aliquot out of the first chamber and into the second chamber without moving the third chamber relative to the lid. 27. A specimen collection method comprising, providing a receptacle including a first chamber, a second chamber extending below the first chamber and containing a testing device, an elongate third chamber and a lid;depositing a specimen into the first chamber; andattaching the lid to the receptacle, whereby attaching the lid to the receptacle inserts the third chamber into the first chamber and forces a first aliquot of the specimen out of the first chamber and into the second chamber where it contacts the testing device,whereby attaching the lid to the receptacle transfers a second aliquot of the specimen into the third chamber. 28. A specimen collection method comprising, providing a receptacle including a first chamber, a second chamber extending below the first chamber and containing a testing device, an elongate third chamber and a lid;depositing a specimen into the first chamber; andattaching the lid to the receptacle,whereby attaching the lid to the receptacle inserts the third chamber into the first chamber and forces a first aliquot of the specimen out of the first chamber and into the second chamber where it contacts the testing device,whereby attaching the lid to the receptacle seals the first chamber from the second chamber, andwhereby attaching the lid to the receptacle transfers a second aliquot of the specimen into the third chamber and seals the second aliquot from the first aliquot and the specimen contained within the first chamber. 29. The method according to claim 28 further comprising analyzing the first aliquot, the second aliquot and the specimen contained within the first chamber. 30. A specimen collection method comprising, providing a receptacle including a first chamber, a second chamber extending below the first chamber and containing a testing device, an elongate third chamber and a lid;depositing a specimen into the first chamber;attaching the lid to the receptacle, whereby attaching the lid to the receptacle inserts the third chamber into the first chamber and forces a first aliquot of the specimen out of the first chamber and into the second chamber where it contacts the testing device; andaccessing a second aliquot through a second capped opening through the lid and accessing the specimen contained within the first chamber through a first capped opening through the lid. 31. A specimen collection method comprising, providing a receptacle including a first chamber, a second chamber extending below the first chamber and containing a testing device, an elongate third chamber and a lid;depositing a specimen into the first chamber;attaching the lid to the receptacle, whereby attaching the lid to the receptacle inserts the third chamber into the first chamber and forces a first aliquot of the specimen out of the first chamber and into the second chamber where it contacts the testing device; andunscrewing a first cap and a second cap from a top of the lid.