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CVD flowable gap fill 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-021/76
출원번호 US-0625468 (2009-11-24)
등록번호 US-8187951 (2012-05-29)
발명자 / 주소
  • Wang, Feng
  • Lu, Victor Y.
  • Lu, Brian
  • Yau, Wai-Fan
  • Draeger, Nerissa
출원인 / 주소
  • Novellus Systems, Inc.
대리인 / 주소
    Weaver Austin Villeneuve & Sampson LLP
인용정보 피인용 횟수 : 82  인용 특허 : 36

초록

Methods of lining and/or filling gaps on a substrate by creating flowable silicon oxide-containing films are provided. The methods involve introducing vapor-phase silicon-containing precursor and oxidant reactants into a reaction chamber containing the substrate under conditions such that a condense

대표청구항

1. A method comprising: introducing process gases comprising a silicon-containing precursor, an oxidant and a catalyst compound to a reaction chamber; andexposing a substrate in the reaction chamber to the process gases under conditions such that a condensed flowable film forms and at least partiall

이 특허에 인용된 특허 (36)

  1. Lang, Chi I; Huang, Judy H.; Barnes, Michael; Shanker, Sunil, CVD flowable gap fill.
  2. Lang, Chi-I; Huang, Judy H.; Barnes, Michael; Shanker, Sunil, CVD flowable gap fill.
  3. Wang, Feng; Lu, Victor Y.; Lu, Brian; Yau, Wai Fan; Draeger, Nerissa, CVD flowable gap fill.
  4. MacNeil, John, Delivery of liquid precursors to semiconductor processing reactors.
  5. Wang, Feng; Lu, Victor Y.; Lu, Brian; Yau, Wai-Fan, Density gradient-free gap fill.
  6. Steven Carter GB; Christine Janet Shearer GB, Deposition of a siloxane containing polymer.
  7. MacNeil, John, Dielectric layer for a semiconductor device and method of producing the same.
  8. MacNeil, John, Dielectric layer for a semiconductor device and method of producing the same.
  9. Gauri, Vishal; Humayun, Raashina; Lang, Chi I; Huang, Judy H.; Barnes, Michael; Shanker, Sunil, Flowable film dielectric gap fill process.
  10. Gauri, Vishal; Humayun, Raashina; Lang, Chi-I; Huang, Judy H.; Barnes, Michael; Shanker, Sunil, Flowable film dielectric gap fill process.
  11. Farhad K. Moghadam ; David W. Cheung ; Ellie Yieh ; Li-Qun Xia ; Wai-Fan Yau ; Chi-I Lang ; Shin-Puu Jeng TW; Frederic Gaillard FR; Shankar Venkataraman ; Srinivas Nemani, Formation of a liquid-like silica layer by reaction of an organosilicon compound and a hydroxyl forming compound.
  12. Byun,Jeong Soo; Yuan,Zheng; Venkataraman,Shankar; Karim,M. Ziaul; Pham,Thanh N.; Yieh,Ellie Y., Gap filling with a composite layer.
  13. Chinn, Jeffrey D.; Guenther, Rolf A.; Rattner, Michael B.; Cooper, James A.; Leung, Toi Yue Becky; Bjorkman, Claes H., Integrated method for release and passivation of MEMS structures.
  14. Galli Carol (Odenton MD) Hsu Louis L. (Fishkill NY) Ogura Seiki (Hopewell Junction NY) Shepard Joseph F. (Hopewell Junction NY), Isolation structure using liquid phase oxide deposition.
  15. Weimin Li, Low dielectric constant material for integrated circuit fabrication.
  16. Lu,Victor; Jin,Lei; Suedmeyer,Arlene J.; Endisch,Denis H.; Apen,Paul G.; Daniels,Brian J.; Zhou,Deling; Naman,Ananth, Materials with enhanced properties for shallow trench isolation/premetal dielectric applications.
  17. Schneegans, Manfred; Jaeger, Wolfgang; Rogalli, Michael, Method for fabricating thin metal layers from the liquid phase.
  18. Dobson Christopher David,GBX ; McGeown Arthur John,GBX, Method for filling substrate recesses using pressure and heat treatment.
  19. Chang Ting-Chang,TWX ; Mei Yu-Jane,TWX, Method for forming a planarized dielectric layer.
  20. Ooka Hideyuki (Tokyo JPX), Method for forming a semiconductor device with trench isolation structure.
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  26. Dobson Christopher David,GBX, Method of treating a semi-conductor wafer.
  27. Dobson Christopher David,GBX ; Kiermasz Adrian,GBX, Method of treating a semi-conductor wafer.
  28. Dobson Christopher David,GBX, Method of treating a semiconductor wafer in a chamber using hydrogen peroxide and silicon containing gas or vapor.
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  30. Park Tai-su,KRX, Methods for forming isolation trenches including doped silicon oxide.
  31. Gauri,Vishal; Humayun,Raashina, Selective gap-fill process.
  32. Ouellet, Luc, Spin-on glass processing technique for the fabrication of semiconductor devices.
  33. Yoshiro Shiokawa JP, Surface treated vacuum material and a vacuum chamber having an interior surface comprising same.
  34. Halliyal, Arvind; Singh, Bhanwar; Templeton, Michael K.; Subramanian, Ramkumar, System and method for active control of BPSG deposition.
  35. Xia Li-Qun ; Yieh Ellie ; Galiano Maria ; Campana Francimar ; Chandran Shankar, Two-step borophosphosilicate glass deposition process and related devices and apparatus.
  36. Yim,Kang Sub; Zheng,Yi; Nemani,Srinivas D.; Xia,Li Qun; Hollar,Eric P., Ultra low dielectric materials based on hybrid system of linear silicon precursor and organic porogen by plasma-enhanced chemical vapor deposition (PECVD).

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  2. Spence, Daniel P.; Lei, Xinjian; Pearlstein, Ronald Martin; Xiao, Manchao; Ho, Richard, Alkoxyaminosilane compounds and applications thereof.
  3. Oosterlaken, Theodorus; de Ridder, Chris; Jdira, Lucian, Apparatus and method for manufacturing a semiconductor device.
  4. Kamiya, Tatsuo, Apparatus and method for transporting wafers between wafer carrier and process tool under vacuum.
  5. Lang, Chi-I; Huang, Judy H.; Barnes, Michael; Shanker, Sunil, CVD flowable gap fill.
  6. Wang, Feng; Lu, Victor Y.; Lu, Brian; Yau, Wai-Fan; Draeger, Nerissa; Gauri, Vishal; Humayun, Raashina; Danek, Michal; van Schravendijk, Bart; Nittala, Lakshminarayana, CVD flowable gap fill.
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  14. Mui, Collin K. L.; Nittala, Lakshminarayana; Draeger, Nerissa, Flowable oxide deposition using rapid delivery of process gases.
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  22. Van Cleemput, Patrick A.; Ndiege, Nicholas Muga; Mohn, Jonathan D., Low k dielectric deposition via UV driven photopolymerization.
  23. Ndiege, Nicholas Muga; Nittala, Krishna; Wong, Derek B.; Antonelli, George Andrew; Draeger, Nerissa Sue; Van Cleemput, Patrick A., Low-K oxide deposition by hydrolysis and condensation.
  24. Jung, Sung-Hoon, Metal oxide protective layer for a semiconductor device.
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  36. Shiba, Eiichiro, Method for forming aluminum nitride-based film by PEALD.
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  69. Arai, Izumi, Single-and dual-chamber module-attachable wafer-handling chamber.
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  71. Weeks, Keith Doran, Structures and devices including a tensile-stressed silicon arsenic layer and methods of forming same.
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  73. Jeong, Sang Jin; Han, Jeung Hoon; Choi, Young Seok; Park, Ju Hyuk, Susceptor for semiconductor substrate processing apparatus.
  74. Mohn, Jonathan D.; te Nijenhuis, Harald; Hamilton, Shawn M.; Madrigal, Kevin; Lingampalli, Ramkishan Rao, System and apparatus for flowable deposition in semiconductor fabrication.
  75. Tang, Fu; Givens, Michael Eugene; Xie, Qi; Raisanen, Petri, System and method for gas-phase sulfur passivation of a semiconductor surface.
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