[미국특허]
Method and system for correcting aberrations of the eye for an ophthalmic instrument
원문보기
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
A61B-003/14
A61B-003/00
출원번호
US-0064065
(2005-08-18)
등록번호
US-8262222
(2012-09-11)
국제출원번호
PCT/FR2005/002098
(2005-08-18)
§371/§102 date
20080711
(20080711)
국제공개번호
WO2007/020334
(2007-02-22)
발명자
/ 주소
Levecq, Xavier Jean-François
Chateau, Nicolas
출원인 / 주소
Imagine Eyes
대리인 / 주소
Greer, Burns & Crain, Ltd.
인용정보
피인용 횟수 :
0인용 특허 :
8
초록▼
A method for correcting aberrations of the eye applied to an ophthalmic instrument operating with an analysis light beam, including: measurement of aberrations of the eye capable of interfering with the analysis beam, correction of the phase of the wave front of the analysis beam as a function of th
A method for correcting aberrations of the eye applied to an ophthalmic instrument operating with an analysis light beam, including: measurement of aberrations of the eye capable of interfering with the analysis beam, correction of the phase of the wave front of the analysis beam as a function of the measured values of the aberrations, measurement of eye movements carried out independently of the measurement of aberrations, and modification of the correction of the phase of the wave front of the analysis beam as a function of the measurement of eye movements.
대표청구항▼
1. A method for correcting aberrations of the eye by correcting a phase of a wave front of an analysis light beam as a function of measured aberrations of the eye, comprising: measurement of aberrations of the eye capable of interfering with the analysis light beam,correction of the phase of the wav
1. A method for correcting aberrations of the eye by correcting a phase of a wave front of an analysis light beam as a function of measured aberrations of the eye, comprising: measurement of aberrations of the eye capable of interfering with the analysis light beam,correction of the phase of the wave front of the analysis light beam as a function of the measured aberrations,measurement of eye movements carried out independently of said measured aberrations, andmodification of the correction of the phase of the wave front of the analysis light beam as a function of said measured eye movements,wherein the aberration measurement is carried out at a given frequency and the modification of the correction of the phase of the wave front is carried out at an operating frequency greater than said aberration measurement frequency. 2. The correction method according to claim 1, in which said measurement of eye movements is carried out at a frequency strictly greater than said aberration measurement frequency, and that is a multiple of said aberration measurement frequency, the operating frequency being greater than or equal to the eye movement measurement frequency. 3. The correction method according to claim 1, in which the aberration measurement frequency is comprised between a few Hertz and a few tens of Hertz, and the eye movement measurement frequency is of the order of a hundred Hertz. 4. The correction method according to claim 1, in which the measurement of eye movements comprises a measurement of said movements carried out with a time shift with respect to said measurement of aberrations. 5. The method according to claim 1, in which the ophthalmic instrument having a sight axis which must be stabilized with respect to the ocular axis, the measurement of eye movements comprises the estimation of the relative rotation of the axis of the eye with respect to a predetermined position, and the modification of the correction is carried out as a function of said estimation of the rotation of the axis of the eye. 6. The method according to claim 1, in which said measurement of eye movements comprises the estimation of the lateral and/or axial displacements of the pupil of the eye with respect to a predetermined position. 7. The method according to claim 5, applied to a retinal imaging instrument having a sight axis which must be stabilized with respect to the ocular axis, in which the measurement of eye movements comprises for each image of the retina taken, the estimation of the relative rotation of the axis of the eye with respect to a predetermined position, and the method can also comprise a subsequent stage of processing of said images allowing the adjustment of the images as a function of the estimations of rotation of the sight axis. 8. A system for correcting aberrations of the eye by correcting a phase of a wave front of an analysis light beam as a function of measured aberrations of the eye, comprising: means for measuring aberrations of the eye capable of interfering with said analysis light beam,correction means including an optical device and a control unit, for correcting the phase of the wave front of said analysis light beam as a function of the measured aberrations, anda device for measuring eye movements independently of said means for measuring the aberrations, said device for measuring eye movements comprising an array detector, an objective forming the image of the pupil of the eye on the detector, illumination means for forming two collimated beams incident on the pupil of the eye and forming two light spots on said pupil and processing means for determining variations in the eye movements from the relative positions of the spots with respect to the image of the pupil,said control unit being arranged for modifying the correction of the phase of the wave front of the analysis light beam as a function of said measured eye movements. 9. The correction system according to claim 8, in which the device for measuring eye movements makes estimates at least one of the lateral and axial displacements of the pupil of the eye with respect to a predetermined position, said modification of the phase of the wave front is carried out by applying new correction values calculated by said processing means as a function of said displacement values of the pupil. 10. The correction system according to claim 8 in which, the device for measuring eye movements makes estimates at least one of the lateral and axial displacements of the pupil of the eye with respect to a predetermined position, the system also comprises a first optical element for deflecting the analysis light beam, positioned in a plane close to a conjugated plane of the retina of the eye, connected to the control unit, and making it possible to stabilize the position of the image of the pupil of the eye on the correction device as a function of said displacement values of the pupil. 11. The correction system according to claim 8 intended for an ophthalmic instrument having a sight axis which must be controlled with respect to the ocular axis, in which the device for measuring eye movements allows the estimation of the relative rotation of the axis of the eye with respect to a predetermined position, said rotation values being sent to the control unit in order to modify the correction of the phase of the wave front of the analysis light beam. 12. The correction system according to claim 11, in which the modification of the correction of the phase of the wave front of the analysis light beam is carried out by applying new correction values calculated by the control unit of the correction device as a function of the values of relative rotation of the axis of the eye. 13. The correction system according to claim 11, also comprising an optical element for deflecting the analysis light beam, positioned in a plane close to a conjugated plane of the pupil of the eye, connected to the control unit, and making it possible to control, at said operating frequency, the orientation of the line of sight as a function of said relative rotation values of the axis of the eye. 14. The correction system according to claim 8, in which the optical correction device is a deformable mirror constituted by a reflective surface which can be deformed by a set of actuators on which said analysis light beam is incident, substantially positioned in a conjugated plane of the pupil of the eye, each actuator being controlled by the control unit in order to correct the local phase of the wave front of the analysis light beam. 15. The correction system according to claim 8, in which the means for measuring aberrations of the eye comprise an illumination system with a source for emitting an illumination beam in order to form a secondary light source on the retina by backscattering, said secondary source emitting a measurement beam emerging from the eye, and means for analyzing the phase of the wave front of said measurement beam. 16. The correction system according to claim 15, in which the analysis means comprise a Shack-Hartmann type analyzer with an array detector, an array of microlenses receiving said measurement beam and forming on the array detector a set of light spots, and means for processing said light spots for determination of the aberrations. 17. A retinal imaging instrument comprising: a retina illumination system emitting an illumination beam of given axis, an imaging and detection system receiving an analysis light beam emerging from the eye and carrying out the function of detection of the image of the retina on the detector of said imaging and detection system, and a system for correcting aberrations of the eye according to claim 11, allowing the correction of the phase of the wave front of the analysis light beam as a function of the estimation of the relative rotation of the axis of the eye with respect to a predetermined position. 18. An instrument for optical laser treatment on the retina comprising a laser source for the emission of an analysis light beam intended to be focused on the retina of the eye along a given sight axis, and a system for correcting aberrations of the eye according to claim 11, allowing the correction of the phase of the wave front of the analysis light beam as a function of the estimation of the relative rotation of the axis of the eye with respect to a predetermined position. 19. An instrument for simulation of the vision of a patient comprising a fixation system with a light source emitting an analysis light beam and a target illuminated by the analysis light beam and intended to be seen by the patient, and a system for correcting aberrations of the eye according to claim 8, allowing the correction of the phase of the wave front of the analysis light beam as a function of movements of the eye. 20. A retinal imaging instrument comprising: a retina illumination system emitting an illumination beam of given axis, an imaging and detection system receiving an analysis light beam emerging from the eye and carrying out the function of detection of the image of the retina on the detector of said imaging and detection system, and a system for correcting aberrations of the eye according to claim 8, allowing the correction of the phase of the wave front of the analysis light beam. 21. An instrument for optical laser treatment on the retina comprising a laser source for the emission of an analysis light beam intended to be focussed on the retina of the eye along a given sight axis, and a system for correcting aberrations of the eye according to claim 8, allowing the correction of the phase of the wave front of the analysis light beam.
Frey Rudolph W. ; Burkhalter James H. ; Gray Gary P. ; Zepkin Neil ; Downes ; Jr. George Richard ; McWhirter John E., Laser beam delivery and eye tracking system.
Jean, Benedikt; Bende, Thomas K.; Fercher, Adolf F., Method and apparatus for the simultaneous determination of surface topometry and biometry of the eye.
Frey Rudolph W. ; Burkhalter James H. ; Zepkin Neil ; Poppeliers Edward ; Campin John A., Objective measurement and correction of optical systems using wavefront analysis.
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