IPC분류정보
국가/구분 |
United States(US) Patent
등록
|
국제특허분류(IPC7판) |
|
출원번호 |
US-0209493
(2011-08-15)
|
등록번호 |
US-8294201
(2012-10-23)
|
발명자
/ 주소 |
- Yu, Chen-Hua
- Yao, Liang-Gi
|
출원인 / 주소 |
- Taiwan Semiconductor Manufacturing Company, Ltd.
|
대리인 / 주소 |
|
인용정보 |
피인용 횟수 :
2 인용 특허 :
29 |
초록
▼
A device and method of formation are provided for a high-k gate dielectric and gate electrode. The high-k dielectric material is formed, and a silicon-rich film is formed over the high-k dielectric material. The silicon-rich film is then treated through either oxidation or nitridation to reduce the
A device and method of formation are provided for a high-k gate dielectric and gate electrode. The high-k dielectric material is formed, and a silicon-rich film is formed over the high-k dielectric material. The silicon-rich film is then treated through either oxidation or nitridation to reduce the Fermi-level pinning that results from both the bonding of the high-k material to the subsequent gate conductor and also from a lack of oxygen along the interface of the high-k dielectric material and the gate conductor. A conductive material is then formed over the film through a controlled process to create the gate conductor.
대표청구항
▼
1. A semiconductor device, comprising: a substrate;an oxide layer disposed over the substrate;a high-k dielectric layer disposed over the oxide layer;a silicon-rich semiconductor film disposed over the high-k dielectric layer, wherein the silicon-rich semiconductor film contains impurities that bond
1. A semiconductor device, comprising: a substrate;an oxide layer disposed over the substrate;a high-k dielectric layer disposed over the oxide layer;a silicon-rich semiconductor film disposed over the high-k dielectric layer, wherein the silicon-rich semiconductor film contains impurities that bond to the high-k dielectric layer; anda conductive layer disposed over the silicon-rich semiconductor film. 2. The semiconductor device of claim 1, wherein the silicon-rich semiconductor film is oxidized, and wherein the impurities include oxygen. 3. The semiconductor device of claim 1, wherein the silicon-rich semiconductor film is nitrided, and wherein the impurities include nitrogen. 4. The semiconductor device of claim 1, wherein a gate stack is formed by the high-k dielectric layer, the silicon-rich semiconductor film, and the conductive layer, the gate stack having sidewalls; and further comprising: source/drain regions disposed in the substrate on opposing sides of the gate stack; andspacers disposed on the sidewalls of the gate stack. 5. The semiconductor device of claim 1, wherein the silicon-rich semiconductor film is free of dangling bonds. 6. The semiconductor device of claim 1, wherein a bonding structure of Si—Si—O—Si—O—Si(Mx)—Si(Mx) is formed downward from the silicon-rich film to the high-k dielectric layer, and wherein Si(Mx) is silicate oxide. 7. The semiconductor device of claim 1, wherein a bonding structure of Si—Si—O—Si—O—Si(Mx)-Mx is formed downward from the silicon-rich film to the high-k dielectric layer, wherein Si(Mx) is metal silicate oxide, and wherein the Mx is metal oxide high-k dielectric. 8. The semiconductor device of claim 1, wherein a bonding structure of Si—Si—N—Si—O(N)—Si(Mx)—Si(Mx) is formed downward from the silicon-rich film to the high-k dielectric layer, and wherein Si(Mx) is silicate oxide and O(N) is oxynitride. 9. The semiconductor device of claim 1, wherein a bonding structure of Si—Si—N—Si—O(N)—Si(Mx)-M is formed downward from the silicon-rich film to the high-k dielectric layer, wherein Si(Mx) is metal silicate oxide, and wherein the M is metal oxide, and wherein O(N) is oxynitride. 10. A semiconductor device, comprising: a substrate;an oxide layer formed on the substrate;a layer of high-k dielectric material formed over the oxide layer;a semiconductor film formed over the layer of high-k dielectric material, the semiconductor film comprising mostly silicon, the semiconductor film containing impurities, at least a portion of the impurities being bonded to the high-k dielectric material; anda layer of conductive material formed over the semiconductor film. 11. The semiconductor device of claim 10, wherein the impurities include one of oxygen and nitrogen. 12. The semiconductor device of claim 10, wherein the layer of high-k dielectric, the semiconductor film, and the layer of conductive material collectively form a gate structure; and further including source/drain regions formed in the substrate on either side of the gate structure. 13. The semiconductor device of claim 10, wherein the high-k dielectric material comprises a silicate. 14. The semiconductor device of claim 10, wherein the high-k dielectric material comprises a metal. 15. The semiconductor device of claim 10, wherein the semiconductor film is substantially free of dangling bonds. 16. A transistor, comprising: a substrate having isolation regions formed therein;an oxide layer located on the substrate;a layer of high-k material located over the oxide layer, the high-k material having a plurality of dangling bonds;a film located over the layer of high-k material, the film being a semiconductor material and comprising mostly silicon, wherein a portion of the dangling bonds are bonded to the film;a gate electrode layer located over the treated film, wherein a gate stack is formed by the layer of high-k material, the film, and the gate electrode layer;source/drain regions located in the substrate on opposing sides of the gate stack; andforming spacers on the sidewalls of the gate stack. 17. The transistor of claim 16, wherein the film is oxidized. 18. The transistor of claim 16, wherein the film is nitrided. 19. The transistor of claim 16, wherein the high-k dielectric material comprises a silicate. 20. The transistor of claim 16, wherein the dangling bonds are located at an interface between the layer of high-k dielectric material and the film, and wherein at least a portion of the dangling bonds are bonded to the semiconductor film.
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