초록 ▼

A charged particle beam system wherein the output of the secondary electron detector is detected while the retarding voltage is varied between the values for which the secondary electrons do not reach the sample and the values for which the secondary electrons reach the sample, and the surface poten

A charged particle beam system wherein the output of the secondary electron detector is detected while the retarding voltage is varied between the values for which the secondary electrons do not reach the sample and the values for which the secondary electrons reach the sample, and the surface potential of the sample is determined on the basis of the relationship between the retarding voltage and the detected output of the secondary electron detector.

대표청구항 ▼

1. A scanning electron microscope comprising: a source of an electron beam;an acceleration electrode for accelerating the electron beam;a detector for detecting a signal generated based on an irradiation of the electron beam to a sample;a negative voltage generator for applying a variable potential

1. A scanning electron microscope comprising: a source of an electron beam;an acceleration electrode for accelerating the electron beam;a detector for detecting a signal generated based on an irradiation of the electron beam to a sample;a negative voltage generator for applying a variable potential to the sample; anda controller for controlling a plurality of voltage generators which include the negative voltage generator, the controller comprising a computer readable medium containing instructions, wherein the controller:varies energy of electrons accelerated toward the source side by-an electric field formed by potential applied to the sample, in a potential state of the sample to which a potential larger than energy of the electron beam is given, andmeasures a surface potential of the sample in accordance with change of detectable amount of electrons by change of the energy of the electrons or change of brightness information by the signal. 2. A scanning electron microscope according to claim 1, wherein the controller measures the surface potential of the sample in accordance with change of an average brightness value of an image formed on the basis of the signal. 3. A scanning electron microscope according to claim 1, wherein the controller measures the surface potential of the sample in accordance with a potential at which the brightness of an image formed on the basis of the signal is not larger than a predetermined value. 4. A scanning electron microscope according to claim 1, wherein the controller varies in stepwise fashion the energy of the electrons accelerated toward the source side and measures the surface potential of the sample in accordance with the change of the detectable amount of electrons by the change of the energy of the electrons or the change of the brightness information by the signal. 5. A scanning electron microscope according to claim 1, wherein the controller controls the negative voltage generator in order to offset a voltage corresponding to the measured surface potential of the sample. 6. A scanning electron microscope comprising: a source of an electron beam;an acceleration electrode for accelerating the electron beam;a detector for detecting a signal generated based on an irradiation of the electron beam to a sample;a negative voltage generator for applying a variable potential to the sample; anda controller for controlling a plurality of voltage generators which include the negative voltage generator, the controller comprising a computer readable medium containing instructions, wherein the controller:varies energy of electrons accelerated toward the source side by an electric field formed by potential applied to the sample, in a potential state of the sample to which a potential larger than energy of the electron beam is given, andcontrols a potential which is applied to the sample in accordance with change of detectable amount of electrons by change of the energy of the electrons or change of brightness information by the signal. 7. A scanning electron microscope according to claim 6, wherein the controller controls the potential which is applied to the sample on the basis of change of average brightness of an image formed by the signal. 8. A scanning electron microscope according to claim 6, wherein the controller controls the potential which is applied to the sample on the basis of a potential at which the brightness of an image formed on the basis of the signal is not larger than a predetermined value. 9. A scanning electron microscope according to claim 6, wherein the controller varies in stepwise fashion the energy of the electrons accelerated toward the source side and controls the potential which is applied to the sample in accordance with the change of the detectable amount of electrons by the change of the energy of the electrons or the change of the brightness information by the signal.