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Instrumentation ATS/TPS mitigation utilizing I/O data stream 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G06F-009/44
  • G06F-009/45
출원번호 US-0938991 (2007-11-13)
등록번호 US-8359585 (2013-01-22)
발명자 / 주소
  • Spinner, Robert
  • Leippe, William Harold
  • McKenna, James
  • Fox, Timothy
출원인 / 주소
  • Advanced Testing Technologies, Inc.
인용정보 피인용 횟수 : 5  인용 특허 : 27

초록

Methods and systems for obsolescence mitigation of electronic systems including hardware and software components, in particular methods and systems for managing obsolete instrument hardware and application software used in legacy Automated Test Systems (ATS) or Automatic Test Equipment (ATE). When o

대표청구항

1. A method for replacing an obsolete instrument or set of instruments in an automated test system or automatic test equipment while maintaining functionality provided by the obsolete instrument or set of instruments and allowing continued use of test program sets including commands for the obsolete

이 특허에 인용된 특허 (27)

  1. Archambeau Paula Marie ; Hajjar James Michael ; Mix Douglas Scott, Automated testing system with minimized dependency on specific test instruments.
  2. Sollman Larry C. (Bloomington IN), Automation initialization of reconfigurable on-line automatic test system.
  3. Robertsson, Per-Ola, Bi-directional probing and testing of software.
  4. Cho, Kyung Y; Lim, Jong Y; Lee, Geun T; Han, Sang S; Min, Byung G; Lee, Heui, Central processing unit for easily testing and debugging programs.
  5. Li, Zhiyuan; Wu, Youfeng, Compressing “warm” code in a dynamic binary translation environment.
  6. Shei Darlene (Milpitas CA) Cheng Jiurong (Sunnyvale CA), Configuration management and automated test system ASIC design software.
  7. Nishibata Motohide,JPX ; Iwamura Yoshiyuki,JPX ; Sumi Fumio,JPX, Debugging apparatus for debugging a program by changing hardware environments without changing program operation state.
  8. Alverson,Gail A.; Smith,Burton J.; Kaplan,Laurence S.; Niehaus,Mark L., Debugging techniques in a multithreaded environment.
  9. Stimson,Randall B., Delayed processing of site-aware objects.
  10. Cannon,William J.; Zwirner,Eric W.; Hoerig,Timothy R.; Ward,Paul D., Direct instructions rendering emulation computer technique.
  11. Sutton,Christopher K, Electronic test program that can distinguish results.
  12. Click ; Jr. Clifford N. ; Vick Christopher A. ; Paleczny Michael H., Instruction selection in a multi-platform environment.
  13. Mann, George A.; Noyes, Bruce A.; Chevance, Rene-Joseph, Method and apparatus for emulating self-modifying code.
  14. Chen,Xiaoxin; Rihan,Sahil, Method and apparatus for managing registers in a binary translator.
  15. Pramanick,Ankan; Elston,Mark; Krishnaswamy,Ramachandran; Adachi,Toshiaki, Method and structure to develop a test program for semiconductor integrated circuits.
  16. Hall David W., Method for converting an integrated circuit design for an upgraded process.
  17. Hekmatpour, Amir, Method for verifying the design of a microprocessor.
  18. Stubbs David D. (Portland OR) Barnett Mark P. (Portland OR) Greenseth William A. (Portland OR), Method of generating instruction sequences for controlling data flow processes.
  19. Scalzi Casper A. (Poughkeepsie NY) Starke William J. (Austin TX), Method of using a target processor to execute programs of a source architecture that uses multiple address spaces.
  20. Cherny,Jeffrey G.; Gehring,David A.; Lupica,Robert L.; Wojcik,James A., Object oriented scaleable test executive.
  21. Menno M. Lindwer NL, Processing device for executing virtual machine instructions that includes instruction refeeding means.
  22. Ryan Arthur ; Andrade Hugo, Reconfigurable test system.
  23. Barnishan, Wesley V., Software rehosting system and method.
  24. Andreasen David A. (Blue Bell PA) Shea Dean J. (Minneapolis MN) Hackney Gregory P. (Ramona CA), System for transferring test program information.
  25. Agiwal, Uttam, Terminology customization in a processing environment.
  26. Spinner, Robert, Test program set obsolescence mitigation through software and automatic test equipment system processes.
  27. Singh, Sanjai; Ciolfi, John, Transforming graphical objects in a graphical modeling environment.

이 특허를 인용한 특허 (5)

  1. Spinner, Robert; Levi, Eli; McKenna, Jim; Leippe, William Harold; Biagiotti, William; Engel, Richard, Automated waveform analysis methods using a parallel automated development system.
  2. Spinner, Robert; Levi, Eli; McKenna, Jim; Leippe, William Harold; Biagiotti, William; Engel, Richard, Automated waveform analysis using a parallel automated development system.
  3. Spinner, Robert; Levi, Eli; McKenna, Jim; Leippe, William Harold; Biagiotti, William; Engel, Richard, Automated waveform analysis using a parallel automated development system.
  4. Ligman, Joseph William; Pistoia, Marco; Ponzo, John; Thomas, Gegi, System, method and apparatus for transparently enabling software applications with adaptive user interfaces.
  5. Du, Haishan, Virtual intelligent platform management interface for hardware components.
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