$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

X-ray inspection tool 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01B-015/06
출원번호 US-0965159 (2010-12-10)
등록번호 US-8396187 (2013-03-12)
발명자 / 주소
  • Safai, Morteza
출원인 / 주소
  • The Boeing Company
대리인 / 주소
    Yee & Associates, P.C.
인용정보 피인용 횟수 : 8  인용 특허 : 36

초록

The different advantageous embodiments provide an apparatus and a method for inspecting a surface of a work piece. In one advantageous embodiment, an apparatus comprising a number of tracks, a support structure, connection system, and controller is disclosed. The number of tracks are configured for

대표청구항

1. An apparatus comprising: a number of tracks configured for placement along a path;a support structure configured to move on the number of tracks;an X-ray system moveably connected to the support structure, wherein the X-ray system is configured to send a plurality of X-rays toward a work piece an

이 특허에 인용된 특허 (36)

  1. Garvey, III, Raymond E.; Skeirik, Robert Darrell, Apparatus and method for infrared imaging with performance algorithm.
  2. Vossmeyer,Tobias; Yasuda,Akio; Bauer,Roland E.; M체llen,Klaus, Chemical sensors from nanoparticle/dendrimer composite materials.
  3. Ying, Jackie Y.; Selvan, Subramanian T.; Yi, Dong Kee; Lee, Su Seong, Coated composites of magnetic material and quantum dots.
  4. Sager,Brian M.; Yu,Dong; Robinson,Matthew R., Coated nanoparticles and quantum dots for solution-based fabrication of photovoltaic cells.
  5. Fristad, William E.; Liang, Jengi-Li; Montrose, David C., Coating composition.
  6. Harrison,Dale A.; Weldon,Matthew, Contamination monitoring and control techniques for use with an optical metrology instrument.
  7. Morkoc, Hadis, Defect reduction in GaN and related materials.
  8. Hunt,Jeffrey H., Difference-frequency surface spectroscopy.
  9. Mohseni,Hooman; Chan,Winston Kong, Electrically tunable quantum dots and methods for making and using same.
  10. Safai, Morteza; Georgeson, Gary Ernest, Flexible detector for x-ray applications.
  11. Barbera-Guillem, Emilio, Fluorescent ink compositions comprising functionalized fluorescent nanocrystals.
  12. Hother,John Anthony; Cockshott,Robert Alexander, Imaging sensor optical system.
  13. Mitchell,Joseph N.; Haby,Spring M.; Rushforth,Dennis S.; Van Dyke,Mark E.; Oviatt, Jr.,Henry W.; Philips,Andrew J.; Hill, Jr.,Ralph H.; Marshall,Mary C., Indicators for early detection of potential failures due to water exposure of polymer-clad fiberglass.
  14. Safai, Mortenza; Georgeson, Gary, Low profile vision system for remote x-ray inspection.
  15. Safai, Morteza; Georgeson, Gary, Method and apparatus for nondestructive corrosion detection using quantum dots.
  16. Jonsson, Elias, Method and device for estimating a signal to interference ratio (SIR) in wideband code division multiple access (WCDMA) systems.
  17. Glaunsinger William (Chandler AZ) Sorensen Ian (Phoenix AZ) Bao Qingcheng (Tempe AZ) McKelvy Michael J. (Mesa AZ), Method for detection of chemical components.
  18. Falat Ladislav (College Park MD), Method for measuring atmospheric corrosion.
  19. Liu Der-Cherng (Taipei Hsien TWX) Lee Chien-Ping (Hsinchu TWX), Method of fabricating quantum dot structures.
  20. Komiyama, Susumu; Oleg, Astafiev; Vladimir, Antonov; Hirai, Hiroshi; Kutsuwa, Takeshi, Millimeter wave and far-infrared detector.
  21. Lee, Howard Wing Hoon; Keshavarz, Majid, Nanocomposite materials with engineered properties.
  22. Farmer, Joseph C., Paint for detection of corrosion and warning of chemical and radiological attack.
  23. Santra, Swadeshmukul; Sabui, Subir Kumar; Holloway, Paul H.; Yang, Heesun, Partially passivated quantum dots, process for making, and sensors therefrom.
  24. Frey, Matthew H.; Rosenflanz, Anatoly Z.; Budd, Kenton D., Pavement marking, reflective elements, and methods of making micospheres.
  25. Safai, Morteza; Georgeson, Gary E., Portable corrosion detection apparatus.
  26. Wang, Cheng-I; Dai, Haixia; Heidecker, Manfred, Prevention of quantum dot quenching on metal surfaces.
  27. Davis, Keith J.; Dehuff, Nicole L.; Safai, Morteza, Quantum dot-based environmental indicators.
  28. Lee,Howard Wing Hoon, Quantum dots, nanocomposite materials with quantum dots, devices with quantum dots, and related fabrication methods.
  29. Wolfe Court L. (Pittsburgh PA) Siegel Mel (Pittsburgh PA) Alberts Christopher J. (Monroeville PA), Robot with cruciform geometry.
  30. Anthony Polak ; Ji Zhu, Sensor incorporating a quantum dot as a reference.
  31. Wallach,Morton L.; Lincoln,Walter B., Smart polymeric multilayer sensors.
  32. Georgeson, Gary E.; Safai, Morteza; Edwards, William T, System and method for determining dimensions of structures/systems for designing modifications to the structures/systems.
  33. Safai, Morteza; Georgeson, Gary E.; Edwards, William T., System and method for improved field of view X-ray imaging using a non-stationary anode.
  34. Floyd, Joseph F.; Linn, John R., System and method for inspecting a beam using micro fiber-optic technology.
  35. Safai, Morteza; Georgeson, Gary E.; Edwards, William T., System and methods for x-ray backscatter reverse engineering of structures.
  36. Jaeger, Paul, Visually indicating corrosion sensing.

이 특허를 인용한 특허 (8)

  1. Lou, Taisia Tsukruk; Edwards, William Talion; Saguto, Gregory Paul, Detecting gaps between fasteners and openings.
  2. Safai, Morteza; Meredith, Kimberly D., Heating system for composite rework of aircraft.
  3. Safai, Morteza; Meredith, Kimberly D., Heating system for composite rework of aircraft.
  4. Safai, Morteza, Integrated backscatter X-ray system.
  5. Safai, Morteza, Integrated backscatter X-ray system.
  6. Safai, Morteza, Quantum dot detection.
  7. Safai, Morteza, Quantum dot detection.
  8. Safai, Morteza; Scholes, Dallas Steven, System for inspecting objects underwater.
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로