Trimming of operative parameters in electronic devices based on corrections mappings
원문보기
IPC분류정보
국가/구분 |
United States(US) Patent
등록
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국제특허분류(IPC7판) |
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출원번호 |
US-0970771
(2010-12-16)
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등록번호 |
US-8447571
(2013-05-21)
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우선권정보 |
EP-06117967 (2006-07-27) |
발명자
/ 주소 |
- Seo, Donghyun
- Nam, Kijun
- Yoon, Seokseong
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출원인 / 주소 |
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대리인 / 주소 |
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인용정보 |
피인용 횟수 :
1 인용 특허 :
5 |
초록
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An embodiment of an electronic device having a plurality of operative parameters is provided. The electronic device includes means for applying a plurality of trimming actions to each parameter for causing a corresponding correction of the parameter, for at least one reference parameter, means for m
An embodiment of an electronic device having a plurality of operative parameters is provided. The electronic device includes means for applying a plurality of trimming actions to each parameter for causing a corresponding correction of the parameter, for at least one reference parameter, means for measuring the reference parameter responsive to the application of at least part of the trimming actions, and means for forcing the application of the selected trimming action for the reference parameter. For each non-reference parameter different from the at least one reference parameter, the electronic device includes means for selecting one of the trimming actions for the non-reference parameter corresponding to the selected trimming action for the at least one reference parameter, and means for forcing the application of the selected trimming action for each non-reference parameter.
대표청구항
▼
1. An electronic device having a plurality of operative parameters, wherein the electronic device includes: means for applying a plurality of trimming actions to each operative parameter for causing a corresponding correction of the operative parameter,for at least one reference parameter, means for
1. An electronic device having a plurality of operative parameters, wherein the electronic device includes: means for applying a plurality of trimming actions to each operative parameter for causing a corresponding correction of the operative parameter,for at least one reference parameter, means for measuring the at least one reference parameter responsive to the application of at least part of the trimming actions to select one of the trimming actions providing a target value of the at least one reference parameter, andmeans for forcing the application of the selected trimming action for the at least one reference parameter,further comprising for each non-reference parameter different from the at least one reference parameter, means for selecting one of the trimming actions for the non-reference parameter corresponding to the selected trimming action for the at least one reference parameter according to a predetermined mapping of each group of multiple corrections of the at least one reference parameter on a single correction of the non-reference parameter, andmeans for forcing the application of the selected trimming action for each non-reference parameter. 2. The electronic device according to claim 1, further including: means for storing a code in the electronic device for each reference parameter being indicative of the selected trimming action for the reference parameter, means for converting the code for the at least one reference parameter into a code for each non-reference parameter being indicative of the selected trimming action for the non-reference parameter, and means for causing the application of the selected trimming action corresponding to each code. 3. The electronic device according to claim 1, wherein the at least one reference parameter consists of a single reference parameter, the number of the trimming actions for the reference parameter being higher than the number of the trimming actions for each non-reference parameter. 4. The electronic device according to claim 3, wherein the means for selecting the trimming action for each non-reference parameter includes means for selecting the trimming action for the non reference parameter as corresponding to the correction for the non-reference parameter related to a conversion value associated with the correction corresponding to the selected trimming action for the reference parameter according to a predefined relationship between the corrections for the reference parameter and the corrections for the non-reference parameter. 5. The electronic device according to claim 1, wherein the at least one reference parameter comprises a plurality of reference parameters. 6. The electronic device according to claim 5, wherein the means for selecting the trimming action for each non-reference parameter includes means for selecting the trimming action for the non-reference parameter as corresponding to the correction for the non-reference parameter related to a conversion value associated with a combination of the corrections corresponding to the selected trimming actions for the reference parameters according to a predefined relationship between the corrections for the reference parameter and the corrections for the non-reference parameter. 7. The electronic device according to claim 4, wherein the predefined relationship is a linear relationship. 8. The electronic device according to claim 7, wherein the means for selecting the trimming action for each non-reference parameter includes means for selecting the trimming action for the non-reference parameter according to an approximation of the conversion value to the closest correction for the non-reference parameter. 9. The electronic device according to claim 1, wherein the at least one reference parameter includes a characteristic of a clock signal of the electronic device. 10. The electronic device according to claim 1, wherein each non-reference parameter is not measurable from outside the electronic device. 11. A method for tuning a plurality of operative parameters of an electronic device, for each operative parameter a plurality of trimming actions being applicable each one for causing a corresponding correction of the operative parameter, wherein the method includes the steps of: for at least one reference parameter, measuring the at least one reference parameter responsive to the application of at least part of the trimming actions to select one of the trimming actions providing a target value of the at least one reference parameter, andforcing the application of the selected trimming action for the at least one reference parameter,for each non-reference parameter different from the at least one reference parameter, selecting one of the trimming actions for the non-reference parameter corresponding to the selected trimming action for the at least one reference parameter according to a predetermined mapping of each group of multiple corrections of the at least one reference parameter on a single correction of the non-reference parameter, andforcing the application of the selected trimming action for each non-reference parameter.
이 특허에 인용된 특허 (5)
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Zarrabian Morteza ; Carroll Kenneth J., Digitally controlled trim circuit.
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Scott Derner, Method and apparatus for testing adjustment of a circuit parameter.
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Romas, Jr., Gregory G.; Wang, Jian, Methods and apparatus for trimming packaged electrical devices.
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Rajivan Sathyanandan ; Salem Raoul B., Parametric tuning of an integrated circuit after fabrication.
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Rajivan Sathyanandan ; Salem Raoul B., Parametric tuning of an intergrated circuit after fabrication.
이 특허를 인용한 특허 (1)
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Seo, Donghyun; Nam, Kijun; Yoon, Seokseong, Trimming of operative parameters in electronic devices based on corrections mappings.
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