초록 ▼

A process for transferring a thin film includes forming a layer of inclusions to create traps for gaseous compounds. The inclusions can be in the form of one or more implanted regions that function as confinement layers configured to trap implanted species. Further, the inclusions can be in the form

A process for transferring a thin film includes forming a layer of inclusions to create traps for gaseous compounds. The inclusions can be in the form of one or more implanted regions that function as confinement layers configured to trap implanted species. Further, the inclusions can be in the form of one or more layers deposited by a chemical vapor deposition, epitaxial growth, ion sputtering, or a stressed region or layer formed by any of the aforementioned processes. The inclusions can also be a region formed by heat treatment of an initial support or by heat treatment of a layer formed by any of the aforementioned processes, or by etching cavities in a layer. In a subsequent step, gaseous compounds are introduced into the layer of inclusions to form micro-cavities that form a fracture plane along which the thin film can be separated from a remainder of the substrate.

대표청구항 ▼

1. A process for forming a thin film from a substrate comprising the steps of: (a) forming a material layer on the substrate;(b) etching cavities in the material layer to form a gaseous compound trap zone at a depth in the substrate corresponding to a required thickness of the thin film and extendin

1. A process for forming a thin film from a substrate comprising the steps of: (a) forming a material layer on the substrate;(b) etching cavities in the material layer to form a gaseous compound trap zone at a depth in the substrate corresponding to a required thickness of the thin film and extending parallel to a surface of the substrate;(c) after etching cavities, introducing into the material layer, a dose of gaseous compounds sufficient to cause formation of micro-cavities in a fracture plane including the gaseous compound trap zone and along which the thin film can be separated from the remainder of the substrate, the gaseous compound trap zone substantially confining the gaseous compounds therein; and(d) separating the thin film from the substrate along the fracture plane and thereafter recovering the thin film. 2. The process for forming a thin film according to claim 1 further comprising filling the cavities with a material before introducing the dose of gaseous compounds. 3. The process for forming a thin film according to claim 2 wherein filling the cavities with a material comprises filling with a material having a parametric crystalline mismatch with the adjacent regions of the substrate. 4. The process for forming a thin film according to claim 1, wherein etching cavities comprises forming a patterned thin film on the material layer and etching cavities using a dry or wet etching technique to form an inclusion layer using the patterned thin film as an etching mask. 5. The process for forming a thin film according to claim 4, wherein forming a patterned thin film comprises etching a grid of openings in a thin film deposited on the material layer. 6. The process for forming a thin film according to claim 1, wherein recovering the thin film comprises placing a support in intimate contact with the substrate such that the thin film bonds to the support thereby transferring the thin film from the substrate to the support. 7. A process for forming a thin film comprising: etching openings in a surface of a substrate to form a gaseous compound trap zone at a depth in the substrate corresponding to a required thickness of the thin film and extending parallel to a surface of the substrate;after etching the openings, introducing gaseous compounds in the substrate in an amount sufficient to form micro-cavities in a fracture plane therein including the gaseous compound trap zone,wherein the openings comprise inclusions in the fracture plane that trap at least a portion of the gaseous compounds; andseparating the thin film from the substrate along the fracture plane. 8. The process for forming a thin film according to claim 7, wherein forming openings comprises forming a patterned layer on the substrate surface and etching the substrate using the patterned layer as an etch mask. 9. The process for forming a thin film according to claim 7 further comprising filling the openings with a material before introducing the gaseous compounds. 10. The process for forming a thin film according to claim 9, wherein filling the openings with a material comprises filling with a material having a parametric crystalline mismatch with the adjacent regions of the substrate. 11. The process for forming a thin film according to claim 7 further comprising applying a heat treatment to close at least a portion of the openings after introducing the gaseous compounds. 12. A process for forming a thin film comprising: providing a support having a silicon layer thereon;forming a patterned silicon nitride layer on the silicon layer;using the patterned silicon nitride layer to etch openings in the silicon layer to form a gaseous compound trap zone extending parallel to a surface of the substrate;after etching the openings, introducing gaseous compounds in the gaseous compound trap zone sufficient to form micro-cavities in a fracture plane therein,wherein the openings comprises inclusions in the fracture plane that trap at least a portion of the gaseous compounds; andseparating the thin film from the substrate along the fracture plane. 13. The process for forming a thin film according to claim 12, wherein forming a patterned silicon nitride layer comprises forming a silicon nitride layer having openings of a first lateral dimension, and wherein the openings in the silicon layer are etched to have a second dimension larger than the first dimension. 14. The process for forming a thin film according to claim 13 further comprising filling the openings in the silicon layer with a material before introducing the gaseous compounds. 15. The process for forming a thin film according to claim 14, wherein filling the openings with a material comprises filling with a material having a parametric crystalline mismatch with the adjacent regions of the substrate. 16. The process for forming a thin film according to claim 14, wherein filling the openings in the silicon layer with a material comprises depositing titanium. 17. The process for forming a thin film according to claim 16, wherein introducing gaseous compounds comprises introducing oxygen. 18. The process for forming a thin film according to claim 12 further comprising applying a heat treatment to close at least a portion of the openings after introducing the gaseous compounds. 19. The process for forming a thin film according to claim 1, wherein etching cavities in the material layer comprises one of ionic etching, selective chemical etching, or electrochemical etching. 20. The process for forming a thin film according to claim 1, wherein the gaseous compound trap zone confines the gaseous compounds within a thin, disturbed layer that is thinner that obtained by introducing a dose of gaseous compounds in the absence of etching the cavities. 21. The process for forming a thin film according to claim 7, wherein etching openings in a surface of a substrate comprises one of ionic etching, selective chemical etching, or electrochemical etching. 22. The process for forming a thin film according to claim 7, wherein the gaseous compound trap zone confines the gaseous compounds within a thin, disturbed layer that is thinner than that obtained by introducing a dose of gaseous compounds in the absence of etching the openings. 23. The process for forming a thin film according to claim 12, wherein etch openings in the silicon layer comprises one of ionic etching, selective chemical etching, or electrochemical etching. 24. The process for forming a thin film according to claim 12, wherein the gaseous compound trap zone confines the gaseous compounds within a thin, disturbed layer that is thinner than that obtained by introducing a dose of gaseous compounds in the absence of etching the openings.