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To provide a semiconductor device including an A/D converter circuit that is capable of performing A/D conversion with high accuracy and high resolution and that can be reduced in size. One loop resistance wiring is shared by a plurality of power supply switches and a plurality of output circuits, a

To provide a semiconductor device including an A/D converter circuit that is capable of performing A/D conversion with high accuracy and high resolution and that can be reduced in size. One loop resistance wiring is shared by a plurality of power supply switches and a plurality of output circuits, and a reference voltage having a triangular (step-like) wave generated using the resistance wiring and the plurality of power supply switches is utilized. Thus, high-accuracy digital signals can be obtained using such an A/D converter circuit that can be reduced in size as an output circuit, without using a complicated circuit structure. Further, the number of constituent elements of the A/D converter circuit is small, whereby in the case of providing A/D converter circuits in parallel, variation between the A/D converter circuits can be made small.

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1. A semiconductor device comprising: a plurality of sensors arranged in rows and columns;a plurality of sensor output signal lines wherein the sensors in the same column are connected to a corresponding one of the plurality of sensor output signal lines;an output circuit connected to the correspond

1. A semiconductor device comprising: a plurality of sensors arranged in rows and columns;a plurality of sensor output signal lines wherein the sensors in the same column are connected to a corresponding one of the plurality of sensor output signal lines;an output circuit connected to the corresponding one of the plurality of sensor output signal lines, the output circuit comprising: an analog-to-digital converter circuit configured to convert an analog signal input to the corresponding one of the sensor output signal lines from the sensor into a digital signal and output the digital signal;a resistance wiring including a plurality of resistors connected in series in a loop shape;a first switch configured to control connection between the resistance wiring and a first power supply line;a second switch configured to control connection between the resistance wiring and a second power supply line; anda reference voltage output signal line,wherein the analog-to-digital converter circuit and the resistance wiring are connected to each other through the reference voltage output signal line, andwherein one or more of the resistors are connected in series between the first switch and the second switch in the resistance wiring. 2. The semiconductor device according to claim 1, wherein the output circuit includes a sample-and-hold circuit configured to capture the analog signal at a certain timing, hold a value of the analog signal constant, and output the held value of the analog signal to the analog-to-digital converter circuit. 3. The semiconductor device according to claim 1, wherein the analog-to-digital converter circuit includes a counter and a comparator configured to compare a voltage of the sensor output signal line with a voltage of the reference voltage output signal line. 4. The semiconductor device according to claim 3, wherein the comparator is a switched capacitor comparator. 5. The semiconductor device according to claim 3, wherein the comparator is a differential amplifier circuit. 6. The semiconductor device according to claim 3, wherein the counter is an asynchronous counter. 7. The semiconductor device according to claim 3, wherein the counter is a synchronous counter. 8. The semiconductor device according to claim 1, wherein the voltage of the reference voltage output signal line has a triangular (step-like) wave and changes with time. 9. A semiconductor device comprising: a plurality of sensors arranged in rows and columns;a plurality of sensor output signal lines wherein the sensors in the same column are connected to a corresponding one of the plurality of sensor output signal lines;an analog-to-digital converter circuit connected to the corresponding one of the plurality of sensor output signal lines, configured to convert an analog signal input to the corresponding one of the sensor output signal lines from the sensor into a digital signal, and configured to output the digital signal;a resistance wiring including a plurality of resistors connected in a loop shape, wherein the analog-to-digital converter circuit is connected to a corresponding one of the plurality of resistors;a first switch configured to control connection between the resistance wiring and a first power supply line, the first switch being connected to a corresponding one of the resistors of the resistance wiring;a second switch configured to control connection between the resistance wiring and a second power supply line, the second switch being connected to a corresponding one of the resistors of the resistance wiring; anda reference voltage output signal line connected to a corresponding one of the resistors of the resistance wiring,wherein the analog-to-digital converter circuit and the resistance wiring are connected to each other through the reference voltage output signal line, andwherein one or more of the resistors are connected in series between the first switch and the second switch in the resistance wiring. 10. The semiconductor device according to claim 9, further comprising a sample-and-hold circuit connected to the sensor output signal line and the analog-to-digital converter circuit, wherein the sample-and-hold circuit captures the analog signal at a certain timing, holds a value of the analog signal constant, and outputs the held value of the analog signal to the analog-to-digital converter circuit. 11. The semiconductor device according to claim 9, wherein the analog-to-digital converter circuit includes a counter and a comparator configured to compare a voltage of the sensor output signal line with a voltage of the reference voltage output signal line. 12. The semiconductor device according to claim 11, wherein the comparator is a switched capacitor comparator. 13. The semiconductor device according to claim 11, wherein the comparator is a differential amplifier circuit. 14. The semiconductor device according to claim 11, wherein the counter is an asynchronous counter. 15. The semiconductor device according to claim 11, wherein the counter is a synchronous counter. 16. The semiconductor device according to claim 9, wherein the voltage of the reference voltage output signal line has a triangular (step-like) wave and changes with time. 17. A method for driving a semiconductor device including: a plurality of sensors arranged in rows and columns;a plurality of sensor output signal lines wherein the sensors in the same column are connected to a corresponding one of the plurality of sensor output signal lines;output circuits each connected to a corresponding one of the plurality of sensor output signal lines and each including a comparator, a counter, and a sample-and-hold circuit;a resistance wiring including a plurality of resistors connected in series in a loop shape, the plurality of resistors each being connected to a corresponding one of the output circuits;a first switch configured to control connection between the resistance wiring and a first power supply line, the first switch being connected to a corresponding one of the resistors of the resistance wiring;a second switch configured to control connection between the resistance wiring and a second power supply line, the second switch being connected to a corresponding one of the resistors of the resistance wiring;a reference voltage output signal line connected to a corresponding one of the resistors of the resistance wiring and connected to a corresponding one of the output circuits;a first shift register configured to control the first switch so that the first switch is conducting in a first period; anda second shift register configured to control the second switch so that the second switch is conducting in a second period including the first period, wherein the first shift register and the second shift register are connected with one or more of the resistors in the resistance wiring provided therebetween.wherein the sample-and-hold circuit captures a voltage of a corresponding one of the sensor output signal lines at a certain timing, holds a value of the voltage of a corresponding one of the sensor output signal lines constant, and outputs the held value to the comparator,wherein the comparator compares the voltage of the corresponding one of the sensor output signal lines with a voltage of the reference voltage output signal line,wherein a high signal is output when the voltage of the corresponding one of the sensor output signal lines is higher than the voltage of the reference voltage output signal line,wherein a low signal is output when the voltage of the corresponding one of the sensor output signal lines is lower than the voltage of the reference voltage output signal line,wherein the counter counts and digitalizes a period in which the high signal is output, andwherein the output circuits convert an input analog signal into a digital signal and output the digital signal.