IPC분류정보
국가/구분 |
United States(US) Patent
등록
|
국제특허분류(IPC7판) |
|
출원번호 |
US-0612275
(2009-11-04)
|
등록번호 |
US-8552384
(2013-10-08)
|
우선권정보 |
CN-2008 1 0202229 (2008-11-05) |
발명자
/ 주소 |
- Zhang, Jian
- Chen, Guofeng
- Liu, Xingyan
|
출원인 / 주소 |
- Shanghai Kohler Electronics, Ltd.
|
대리인 / 주소 |
|
인용정보 |
피인용 횟수 :
3 인용 특허 :
1 |
초록
▼
A mirror reflection processing method for a position sensitive detector device in intelligent bathroom products. The infrared emitter in the position sensitive detector device is provided with two infrared emitting intensity modes. The position sensitive detector device determines whether to conside
A mirror reflection processing method for a position sensitive detector device in intelligent bathroom products. The infrared emitter in the position sensitive detector device is provided with two infrared emitting intensity modes. The position sensitive detector device determines whether to consider that no signal is collected in current collection according to the result of comparison between the reflected infrared signal intensity received by the infrared receiver and the preset value therein, thereby overcoming the mis-operation of the position sensitive detector device when being opposite to objects with relatively high reflectivity, and making the position sensitive detector device even more widely applied.
대표청구항
▼
1. A mirror reflection processing method for a position sensitive detector device, wherein the position sensitive detector device comprises an infrared emitter for emitting infrared rays and an infrared receiver for receiving reflected infrared rays, wherein the infrared emitter has four infrared em
1. A mirror reflection processing method for a position sensitive detector device, wherein the position sensitive detector device comprises an infrared emitter for emitting infrared rays and an infrared receiver for receiving reflected infrared rays, wherein the infrared emitter has four infrared emitting intensity modes sequentially switchable which are first, second, third and fourth infrared emitting intensity modes in a descending order of intensity, and the mirror reflection processing method is provided with a mirror interference determination procedure, comprising: calculating a designated voltage value according to infrared signals received by the infrared receiver so as to indicate an infrared signal intensity of the infrared rays received by the infrared receiver, wherein the voltage value in the fourth infrared emitting intensity mode is calculated; andsetting a first fixed value and comparing the voltage value calculated in the fourth infrared emitting intensity mode with the first fixed value, and determining that the reflected infrared rays are caused by a mirror interference when the voltage value is greater than the first fixed value;wherein in the mirror interference determination procedure, there are two voltage values which are calculated from the infrared signals received by the infrared receiver and one of the two voltage values is said designated voltage value;calculating, in the fourth infrared emitting intensity mode with the lowest intensity, the two voltage values according to the infrared signals received; andsetting a second fixed value and a first set range so as to determine that the reflected infrared rays are caused by the mirror interference when the difference between the two voltage values is below the second fixed value and the designated voltage value falls within the first set range,wherein the mirror interference processing procedure further comprises considering that no signal was collected by the position sensitive detector device in response to the determination of the mirror interference. 2. The mirror reflection processing method for the position sensitive detector device according to claim 1, wherein the mirror interference determination procedure comprises: setting a lowest threshold so as to determine that the reflected infrared rays are caused by the mirror interference in any of the infrared emitting intensity modes if the designated voltage value which is output according to the received infrared signals is below the lowest threshold. 3. The mirror reflection processing method for the position sensitive detector device according to claim 1, wherein in the mirror interference determination procedure, the determining comprises performing a processing of delaying or performing a processing of increasing the number of determinations. 4. A mirror reflection processing method for a position sensitive detector device, wherein the position sensitive detector device comprises an infrared emitter for emitting infrared rays and an infrared receiver for receiving reflected infrared rays, wherein the infrared emitter has four infrared emitting intensity modes sequentially switchable which are first, second, third and fourth infrared emitting intensity modes in a descending order of intensity, and the mirror reflection processing method is provided with a mirror interference determination procedure, comprising: calculating a designated voltage value according to infrared signals received by the infrared receiver so as to indicate an infrared signal intensity of the infrared rays received by the infrared receiver, wherein the voltage value in the fourth infrared emitting intensity mode is calculated;setting a first fixed value and comparing the voltage value calculated in the fourth infrared emitting intensity mode with the first fixed value, and determining that the reflected infrared rays are caused by a mirror interference when the voltage value is greater than the first fixed value; andsetting a second set range so as to determine that the reflected infrared rays are caused by the mirror interference in the third emitting intensity modes if the designated voltage value which is output according to the received infrared signals exceeds the second set range,wherein in the mirror interference determination procedure, there are two voltage values which are calculated from the infrared signals received by the infrared receiver and one of the two voltage values is said designated voltage value, andwherein the mirror reflection processing method is provided with a mirror interference processing procedure, comprising considering that no signal is collected by the position sensitive detector device when determining the mirror interference. 5. The mirror reflection processing method for the position sensitive detector device according to claim 4, wherein the mirror interference determination procedure comprises: setting a lowest threshold so as to determine that the reflected infrared rays are caused by the mirror interference in any of the infrared emitting intensity modes if the designated voltage value which is output according to the received infrared signals is below the lowest threshold. 6. The mirror reflection processing method for the position sensitive detector device according to claim 4, wherein the mirror interference determination procedure includes delaying a determination or increasing the number of determinations. 7. The mirror reflection processing method for the position sensitive detector device according to claim 4, wherein considering that no signal is collected includes disregarding or ignoring the signal received by the infrared receiver. 8. A mirror reflection processing method for a position sensitive detector device, wherein the position sensitive detector device comprises an infrared emitter for emitting infrared rays and an infrared receiver for receiving reflected infrared rays, wherein: the infrared emitter is provided with at least two infrared emitting intensity modes sequentially switchable; andthe mirror reflection processing method is provided with a mirror interference determination procedure, comprising:calculating a designated voltage value according to infrared signals received by the infrared receiver so as to indicate an infrared signal intensity of the infrared rays received by the infrared receiver, wherein two voltage values in the infrared emitting intensity mode with relatively lower intensity are calculated; andsetting a second fixed value and a first set range and comparing a difference between the two voltage values with the second fixed value and determining that the reflected infrared rays are caused by a mirror interference when the difference is below the second fixed value and the designated voltage value falls within the first set range;wherein the mirror reflection processing method is provided with a mirror interference processing procedure, comprising considering that no signal is collected by the position sensitive detector device when determining that the mirror interference exists. 9. The mirror reflection processing method for the position sensitive detector device according to claim 8, wherein: in the mirror interference determination procedure, there are two voltage values which are calculated from the infrared signals received by the infrared receiver and one of the two voltage values is said designated voltage value. 10. The mirror reflection processing method for the position sensitive detector device according to claim 8, wherein, in the mirror interference determination procedure, the determining comprises performing a processing of delaying or performing a processing of increasing the number of determinations.
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