IPC분류정보
국가/구분 |
United States(US) Patent
등록
|
국제특허분류(IPC7판) |
|
출원번호 |
US-0977009
(2007-10-23)
|
등록번호 |
US-8614437
(2013-12-24)
|
발명자
/ 주소 |
- Dimitrakopoulos, Christos D.
- Kosbar, Laura Louise
- Mascaro, Debra Jane
|
출원인 / 주소 |
- International Business Machines Corporation
|
대리인 / 주소 |
|
인용정보 |
피인용 횟수 :
0 인용 특허 :
5 |
초록
▼
A process for producing high performance organic thin film transistors in which the molecules in the organic thin film are highly ordered and oriented to maximize the mobility of current charge carriers. The uniform monolayer surface over various substrate materials so formed, result in a more repro
A process for producing high performance organic thin film transistors in which the molecules in the organic thin film are highly ordered and oriented to maximize the mobility of current charge carriers. The uniform monolayer surface over various substrate materials so formed, result in a more reproducible and readily manufacturable process for higher performance organic field effect transistors that can be used to create large area circuits using a range of materials.
대표청구항
▼
1. An organic thin film transistor having a structural arrangement of elements comprising: a substrate, said substrate having an upper and a lower surface;a gate selected from the group consisting of a conductive metal, a doped single crystalline Si, polysilicon, andan organic conductor, having an u
1. An organic thin film transistor having a structural arrangement of elements comprising: a substrate, said substrate having an upper and a lower surface;a gate selected from the group consisting of a conductive metal, a doped single crystalline Si, polysilicon, andan organic conductor, having an upper surface, a lower surface and side surfaces, said lower surface of said gate positioned on and in contact with a portion of said upper surface of said substrate;a gate insulator having an upper surface and a lower surface, said lower surface of said gate insulator covering, and in contact with, said upper and side surfaces of said gate, and any remaining exposed area of said substrate not covered by said bottom surface of said gate, said gate insulator being selected from the group consisting of an inorganic oxide dielectric material, and an organic dielectric material,a self-assembled monolayer having an upper surface and a lower surface wherein said lower surface of self-assembled monolayer is formed on and is in contact with said substrate or said upper surface of said gate insulator;an organic thin film semiconductor having an upper surface and a lower surface, and having a thickness of from about 100 to about 1000 Å wherein said lower surface of said organic thin film semiconductor is in contact with said upper surface of said self-assembled monolayer;a source electrode and a drain electrode, each said electrode having an upper surface and a lower surface and being positioned adjacent to each other, said lower surface of said source electrode and said lower surface of said drain electrode being in contact with said upper surface of said organic thin film semiconductor,said self-assembled monolayer comprising a compounds having the formula: RZwherein Z is a reactive group selected from the group consisting mono-chlorosilane, di-chlorosilane, trichlorosilane, triethoxysilane; mono-chlorogermane, di-chlorogermane, tri-chlorogermane, carboxylic acids, and thiols;said (Z) reactive groups capable forming a covalent bond or strong chemical interaction with said upper surface of said gate insulator or said substrate,said parallel orientation being accomplished using said cyclic ring structures with an odd number of carbon atoms that are attached to said upper surface of said gate insulator or said substrate surface through a single point of attachment, orusing said cyclic ring structures with an even number of carbon atoms that are attached to said upper surface of said gate insulator or said substrate through two points of attachment on adjacent ring atoms. 2. The organic thin film transistor of claim 1 wherein said gate is formed below said organic thin film semiconductor. 3. The thin film transistor of claim 1 wherein said organic conductor is selected from the group consisting of polyaniline and polythiophene surrounded by said gate insulator. 4. The organic thin film transistor of claim 1 wherein said source electrode and said drain electrodes are selected from the group consisting of the same or different conductive metal, metal alloy, metal oxide, metal alloy oxide, or a stack thereof. 5. The organic thin film transistor of claim 4 wherein said same or different conductive metal is a metal selected from the group consisting of gold, platinum, tungsten, palladium, aluminum, chromium, titanium, and a stack thereof. 6. The organic thin film transistor of claim 4 wherein said conductive metal is gold, chromium, platinum, titanium or a stack thereof. 7. The organic thin film transistor of claim 1 wherein said organic thin film semiconductor is a material selected from the group consisting of pentacene, tetracene, or other fused ring organic semiconductors. 8. The organic thin film transistor of claim 7 wherein said organic thin film semiconductor is pentacene. 9. The organic thin film transistor of claim 1 wherein said substrate is a Si-containing substrate selected from the group consisting of SiO2, Si, SiGe, silicon-on-insulator and glass. 10. The organic thin film transistor of claim 1 wherein said substrate is an Al-containing substrate.
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