초록 ▼

A system for sensing characteristics of a volume can include a mirror input configured to connect to a first mirror plate. The first mirror plate can be physically isolated from a first monitored space for containing a material. A sense input can be configured to connect to a first sense plate. The

A system for sensing characteristics of a volume can include a mirror input configured to connect to a first mirror plate. The first mirror plate can be physically isolated from a first monitored space for containing a material. A sense input can be configured to connect to a first sense plate. The first sense plate can be positioned between the first mirror plate and the first monitored space, and can have a surface that faces the first monitored space. A capacitance sense section can generate a first sense value based on a capacitance at the sense input, and a mirror value based on a capacitance at the mirror input.

대표청구항 ▼

1. A system for sensing characteristics of a volume, comprising: at least one mirror input configured to connect to at least a first mirror plate, the first mirror plate being physically isolated from a first monitor space for containing a material;at least one sense input configured to connect to a

1. A system for sensing characteristics of a volume, comprising: at least one mirror input configured to connect to at least a first mirror plate, the first mirror plate being physically isolated from a first monitor space for containing a material;at least one sense input configured to connect to at least a first sense plate that is interposed between the at least first mirror plate and the first monitored space and that has one surface that faces the first monitored space; anda capacitance sense section that generates a first sense value based on a capacitance at the at least one sense input, and a mirror value based on the capacitance at the at least one mirror input. 2. The system of claim 1, wherein: the first monitored space is enclosed by a container having at least one inner container surface exposed to the first monitored space and an outer container surface not exposed to the first monitored space; andthe at least first sense plate has a first surface attached to the outer container surface. 3. The system of claim 1, wherein: the first monitored space is enclosed by a container having at least one inner container surface exposed to the first monitored space and an outer container surface not exposed to the first monitored space; andthe at least first sense plate has a first surface that is physically exposed to the first monitored space. 4. The system of claim 1, wherein: the first monitored space is enclosed by a container; andthe material is selected from the group consisting of a liquid, a gas, and solid in particulate form. 5. The system of claim 1, wherein: the at least first mirror plate is formed from the same material as the at least first sense plate. 6. The system of claim 5, wherein: the at least first mirror plate has the same physical dimensions as the at least first sense plate. 7. The system of claim 1, wherein: the space occupied by the material can vary in at least a first direction with respect to a surface of the container; andthe at least first mirror plate comprises a plurality of mirror plates separated from one another in the first direction; andthe at least first sense plate comprises a plurality of sense plates, each sense plate being interposed between a corresponding one of the mirror plates and the first monitored space. 8. The system of claim 1, wherein: a portion of the space occupied by the material can vary with respect to at least a first direction;the at least first mirror plate comprises a plurality of mirror plates separated from one another in a second direction essentially perpendicular to the first direction; andthe at least first sense plate comprises a plurality of sense pates, each sense plate being interposed between a corresponding one of the mirror plates and the first monitored space. 9. The system of claim 1, further including: the at least a first mirror plate is physically isolated from a second monitored space;a second sense input configured to connect to at least a second sense plate that is interposed between the at least mirror plate and the second monitored space and that has one surface that faces the second monitored space; andthe capacitance sense section generates a second sense value based on a capacitance at the second sense input. 10. The system of claim 1, wherein: the at least first mirror plate has a reference surface that faces a second monitored space different from the first monitored space, the reference surface being a side of the mirror plate opposite to a side that faces the at least first sense plate. 11. The system of claim 1, wherein: the at least first sense plate has different physical dimensions than the at least first mirror plate. 12. The system of claim 1, wherein: the space is enclosed by a container having a wall;the at least first sense plate is fixed to the wall; andthe at least first mirror plate is removable and can be removed from a position adjacent to the at least first sense plate. 13. The system of claim 1, wherein: the capacitance sense section includes ain input multiplexer for selectively connecting the at least one sense input and at least one mirror input to a common sense node. 14. The system of claim 13, wherein: the capacitance sense section further includes at least one comparator having a first input coupled to the sense node and a second input coupled to a threshold voltage source, anda switch circuit having a controllable impedance path coupled to the sense node operable in response to an output of the at least one comparator. 15. The electronic system of claim 13, wherein: the capacitance sense section further includes a counter having an input coupled to the output of the comparator that generates a value that varies according to a sensed capacitance at the sense node. 16. A system for detecting the characteristics of at least one material occupying at volume, comprising: at least one sense plate having a first sense side that faces a first volume and an opposing second sense side;at least one mirror plate that is isolated from the first volume having a first mirror side that faces the first sense side; anda controller section that generates a characteristic value based on a capacitance of the at least one sense plate and the at least one mirror plate measured independently of one another. 17. The system of claim 16, wherein: the controller section includes a capacitance sense section comprising at least one relaxation oscillator circuit having an oscillation rate that varies according to at least the capacitance of the at least one the sense plate. 18. The system of claim 17, wherein: the relaxation oscillator circuit oscillation rate varies according to at least the capacitance at a sense node, anda switch circuit for selectively connecting the sense plate or the mirror plate to the sense node. 19. The system of claim 16, wherein: the capacitance sense section comprises a delta sigma modulation circuit that includes a comparator that switches output states according to at least the capacitance of the at least one the sense plate. 20. The electronic system of claim 16, wherein the characteristic value varies according to the amount of monitored space occupied by the material. 21. The system of claim 16, further including: the at least one mirror plate has a second mirror side that faces a second volume; andthe characteristic value corresponds to a difference in capacitance arising from a first material opposite the first sense side and a second material opposite the second mirror side. 22. The system of claim 16, wherein: the characteristic value activates an indicator selected from the group consisting of: an illumination source, a character display, an audio alarm. 23. The system of claim 16, wherein: the controller section further includes a wireless transmitter that transmits at least the material value over a wireless connection. 24. The system of claim 16, wherein: the controller section further includes a network interface that transmits at least the material value in packet form over a data communication network. 25. The system of claim 16, further including: a reservoir having a bottom and at least a surrounding side surface that defines at least a portion of the first volume;a heating element disposed at the bottom of the reservoir;the at least one sense plate being attached to the side surface of the reservoir; andthe characteristic value being coupled to the heating element. 26. A method of sensing the characteristic of a material occupying a volume: measuring a mirror capacitance of a mirror plate positioned adjacent to, but outside of a monitored volume;measuring a sense capacitance of a sense plate positioned between the mirror plate and the monitored volume; andgenerating a characteristic value based on the mirror capacitance and sense capacitance. 27. The method of claim 26, wherein: the step of measuring the mirror capacitance includes generating a mirror count corresponding to an amount of time needed to charge and discharge the mirror plate between two predetermined potentials; andthe step of measuring the sense capacitance includes generating a sense count corresponding to an amount of time needed to charge and discharge the sense plate between the two predetermined potentials. 28. The method of claim 27, wherein: generating the characteristic value includes activating a limit indication when the sense count varies from the mirror count by a predetermined amount. 29. The method of claim 26, wherein: the step of measuring the mirror capacitance includescoupling the mirror plate to the first potential node,coupling the mirror plate to a first input of a comparator that has a second input coupled to a reference voltage node,coupling the input of the comparator to a second node based on the output of the comparator, andthe mirror count corresponds to the number of times the comparator output is high versus the number of times the comparator output is low. 30. The method of claim 26, wherein: measuring the mirror capacitance includes periodically measuring the mirror capacitance at a first rate;measuring the sense capacitance includes periodically measuring the sense capacitance at the first rate. 31. The method of claim 26, wherein: measuring the mirror capacitance includes periodically measuring the mirror capacitance at a first rate;measuring the sense capacitance includes periodically measuring the sense capacitance at a second rate different from the first rate.