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Semiconductor manufacturing process module 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-021/677
  • H01L-021/67
  • B65G-025/02
  • H01L-021/687
  • B65G-037/00
출원번호 US-0616683 (2012-09-14)
등록번호 US-8870514 (2014-10-28)
발명자 / 주소
  • van der Meulen, Peter
  • Kiley, Christopher C
  • Pannese, Patrick D.
출원인 / 주소
  • Brooks Automation, Inc.
대리인 / 주소
    Perman & Green, LLP
인용정보 피인용 횟수 : 0  인용 특허 : 56

초록

A semiconductor handling system including a vacuum workpiece handling system having a vacuum environment therein, the vacuum workpiece handling system including at least two workpiece handling robotic facilities, a mid-entry station positioned between the at least two workpiece handling robotic faci

대표청구항

1. A semiconductor handling system comprising: a vacuum workpiece handling system having a vacuum environment therein, the vacuum workpiece handling system including at least two workpiece handling robotic facilities;a mid-entry station positioned between the at least two workpiece handling robotic

이 특허에 인용된 특허 (56)

  1. McKenna, Daniel B.; Stinehelfer, James E., Aircraft-based network for wireless subscriber stations.
  2. Kurata, Shunsuke, Alignment apparatus.
  3. Hiroki Tutomu (Yamanashi-ken JPX) Abe Shoichi (Kofu JPX) Akiyama Kiyotaka (Kofu JPX) Satoyoshi Tsutomu (Niraski JPX), Apparatus for detecting and aligning a substrate.
  4. Choi, Jae-Wook; Kim, Young-Rok, Apparatus for manufacturing substrate.
  5. Muka Richard S., Automated wafer buffer for use with wafer processing equipment.
  6. Kirkpatrick Thomas I. ; Otwell Robert L., Cost effective modular-linear wafer processing.
  7. Avi Tepman ; Donald J. K. Olgado ; Allen L. D'Ambra, Dual buffer chamber cluster tool for semiconductor wafer processing.
  8. Begin Robert George, End effector assembly for inclusion in a system for producing uniform deposits on a wafer.
  9. Altwood Allen ; Colborne Kelly ; Fairbairn Kevin ; Lane Christopher ; Ponnekanti Hari K. ; Sundar Satish, Front end wafer staging with wafer cassette turntables and on-the-fly wafer center finding.
  10. Ono Hiroo (Yamanashi JPX) Oosawa Tetsu (Sagamihara JPX) Asakawa Teruo (Yamanashi JPX) Nebuka Kenji (Nirasaki JPX), Load-lock unit and wafer transfer system.
  11. Oosawa Tetsu (Sagamihara JPX) Asakawa Teruo (Yamanashi JPX) Nebuka Kenji (Nirasaki JPX) Ono Hiroo (Yamanashi JPX), Load-lock unit and wafer transfer system.
  12. Hunter, Reginald, Method and apparatus for enhanced embedded substrate inspection through process data collection and substrate imaging techniques.
  13. Hunter, Reginald, Method and apparatus to provide embedded substrate process monitoring through consolidation of multiple process inspection techniques.
  14. Hunter,Reginald, Method and apparatus to provide for automated process verification and hierarchical substrate examination.
  15. Sasaki, Yoshiaki, Method for aligning conveying position of object processing system, and object processing system.
  16. Begin Robert G. (Montecito CA) Clarke Peter J. (Santa Barbara CA), Method for processing semi-conductor wafers in a multiple vacuum and non-vacuum chamber apparatus.
  17. Benjamin W. Mooring ; Charles W. Freund, Method of and apparatus for dynamic alignment of substrates.
  18. Bright Nick ; Mooring Ben, Modular architecture for semiconductor wafer fabrication equipment.
  19. Rubin Richard H. (Fairfield NJ) Petrone Benjamin J. (Netcong NJ) Heim Richard C. (Mountain View CA) Pawenski Scott M. (Wappingers Falls NY), Modular processing apparatus for processing semiconductor wafers.
  20. White John M. ; Conner Robert B. ; Law Kam S. ; Turner Norman L. ; Lee William T. ; Kurita Shinichi, Modular substrate processing system.
  21. Vowles E. John (Deering NH) Maher Joseph A. (Wenham MA) Napoli Joseph D. (Windham NH), Modular vapor processor system.
  22. Kim, Ki-sang; Jeoung, Gyu-chan; Kwag, Gyu-hwan, Multi-chamber system having compact installation set-up for an etching facility for semiconductor device manufacturing.
  23. Edwards Richard C. ; Zielinski Marian, Multiple single-wafer loadlock wafer processing apparatus and loading and unloading method therefor.
  24. Hunter, Reginald, Optical signal routing method and apparatus providing multiple inspection collection points on semiconductor manufacturing systems.
  25. Sundar Satish, Optimal trajectory robot motion.
  26. Hunter, Reginald, Particle detection and embedded vision system to enhance substrate yield and throughput.
  27. Shimazaki Kazunori,JPX ; Yoshida Kiyoshi,JPX, Position difference detecting device and method thereof.
  28. Ishizawa, Shigeru; Saeki, Hiroaki, Processed body carrying device, and processing system with carrying device.
  29. Keiichi Matsushima JP, Processing system.
  30. Larson, Robert E.; Simondet, Sean D.; Zimmerman, David C.; Maciej, Todd K.; Matthys, Quirin W., Reduced footprint tool for automated processing of microelectronic substrates.
  31. Azumano Hidehito,JPX ; Kinase Atsushi,JPX ; Kogure Kimio,JPX ; Komatsu Hisataka,JPX, Robot apparatus and treating apparatus.
  32. Imahashi Issei (Yamanashi-ken JPX), Semiconductor processing system.
  33. Kakehi Yutaka (Hikari JPX), Semiconductor substrate transport system.
  34. Kurita, Shinichi, Shared sensors for detecting substrate position/presence.
  35. Bacchi Paul ; Filipski Paul S., Single and dual end effector, multiple link robot arm systems having triaxial drive motors.
  36. Andrews J. Randolph, Software to determine the position of the center of a wafer.
  37. Hofmeister, Christopher; Caveney, Robert T., Substrate processing apparatus.
  38. Suda Atsuhiko,JPX ; Toyoda Kazuyuki,JPX ; Makiguchi Issei,JPX ; Ozawa Makoto,JPX, Substrate processing apparatus.
  39. Takahashi, Nobuyuki, Substrate processing device and through-chamber.
  40. Okayama, Satohiro; Kanazawa, Motoichi; Ishida, Takeshige; Takeda, Tomohiko; Akita, Yukio; Ichimura, Satoru; Suzuki, Kazunori; Yoshino, Teruo; Akao, Tokunobu; Nakayama, Yasunobu, Substrate processing device, substrate conveying device, and substrate processing method.
  41. Shmookler Simon (San Francisco CA) Weinberg Andrew G. (San Jose CA) McGrath Martin J. (Sunnyvale CA), System and method for automated positioning of a substrate in a processing chamber.
  42. Mitchell, James P., System and method for internet access on a mobile platform.
  43. Savas Stephen E., System and method for rapid thermal processing with transitional heater.
  44. Tabrizi Farzad ; Kitazumi Barry ; Barker David A. ; Setton David A. ; Niewmierzycki Leszek ; Kuhlman Michael J., Systems and methods for robotic transfer of workpieces between a storage area and a processing chamber.
  45. Sha, Lin; Li, Yicheng, Transfer apparatus and method for semiconductor process and semiconductor processing system.
  46. Kato Susumu (Isawa-Cho JPX) Yamaguchi Hirofumi (Sudama-Cho JPX), Vacuum process apparaus.
  47. Ozawa,Jun; Hirose,Jun; Narushima,Masaki, Vacuum process system.
  48. Soraoka, Minoru; Yoshioka, Ken; Kawasaki, Yoshinao, Vacuum processing apparatus and semiconductor manufacturing line using the same.
  49. Tamura,Naoyuki, Vacuum processing method.
  50. Yoo, Woo Sik; Kang, Kitaek, Wafer alignment system and method.
  51. William R. Johanson ; Craig Stevens ; Steve Kleinke ; Damon Genetti, Wafer centering system and method.
  52. Freerks Frederik W. ; Berken Lloyd M. ; Crithfield M. Uenia ; Schott David ; Rice Michael ; Holtzman Michael,ILX ; Reams William ; Giljum Richard ; Reinke Lance ; Booth John S., Wafer position error detection and correction system.
  53. Berken Lloyd M. (Fremont CA) Freerks Frederik W. (Cupertino CA) Jarvi William H. (San Jose CA) Sahin Hatice (Cupertino CA), Wafer positioning system.
  54. Ho,Chih Chien; Shieh,Jenn Shiang, Wafer positioning systems and methods thereof.
  55. Toshima Masato, Wafer transfer system and method of using the same.
  56. Miller Kenneth C. (280 Easy St. ; #117 Mountain View CA 94043), Wafer transport device.
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