초록 ▼

A flip-chip fan-out wafer level package for package-on-package applications includes a semiconductor die with solder bumps on an upper surface in a flip chip configuration. The die is inverted, with an upper surface facing an upper side of a redistribution layer, with the solder bumps in electrical

A flip-chip fan-out wafer level package for package-on-package applications includes a semiconductor die with solder bumps on an upper surface in a flip chip configuration. The die is inverted, with an upper surface facing an upper side of a redistribution layer, with the solder bumps in electrical contact with respective chip contact pads of the redistribution layer. The redistribution layer includes conductive traces that place each of the solder bumps in electrical contact with one or both of one of a plurality of upper redistribution contact pads and one of a plurality of lower redistribution contact pads. Each of the plurality of upper redistribution contact pads has an upper solder ball in electrical contact therewith. The die and the upper solder balls are at least partially encapsulated in a layer of mold compound positioned on the upper surface of the redistribution layer, and whose lateral dimensions are defined by the lateral dimensions of the redistribution layer. The layer of mold compound has a back-ground surface at which a portion of each of the upper solder balls is exposed, for electrical contact with an upper package. Each of the lower redistribution contact pads has a lower solder ball a coupled thereto.

대표청구항 ▼

1. A wafer, comprising: a rigid redistribution layer on the wafer having a plurality of sections, each section including: a first plurality of contact pads positioned on a first side of the redistribution layer,a second plurality of contact pads positioned on a second side of the redistribution laye

1. A wafer, comprising: a rigid redistribution layer on the wafer having a plurality of sections, each section including: a first plurality of contact pads positioned on a first side of the redistribution layer,a second plurality of contact pads positioned on a second side of the redistribution layer, anda plurality of conductive traces, each extending in the redistribution layer and placing two or more of the contact pads of the first and second pluralities of contact pads in electrical communication;a plurality of semiconductor dice, each of the semiconductor die having a third plurality of contact pads on a first surface, the semiconductor die being positioned with its first surface facing the first side of a respective section of the redistribution layer, with a fan-out portion of the redistribution layer extending beyond the respective semiconductor die in at least one direction parallel to the first side, each fan-out portion of the redistribution layer including a first set of contact pads of the first plurality of contact pads, wherein a second set of contact pads of the first plurality of contact pads is located proximate the semiconductor die, and wherein the first set of contact pads are electrically isolated from the third plurality of contact pads on the first surface of the respective semiconductor die;a plurality of solder connectors placing each of the third plurality of contact pads of a respective die in electrical communication with a respective one of the second set of the first plurality of contact pads;a plurality of solder balls coupled to the second plurality of contact pads, respectively, on the fan-out portion of the redistribution layer;an encapsulating layer positioned on the first side of the redistribution layer and encapsulating side surfaces of the semiconductor die, side surfaces of the plurality of solder balls, and entire side surfaces of the plurality of solder connectors, each of the plurality of solder balls having an upper surface that is coplanar with an upper surface of the encapsulating layer and a second surface of the semiconductor die anda spacing between each of the semiconductor die indicative of a kerf line for separating the semiconductor die into individual packages. 2. The wafer of claim 1, further comprising a semiconductor package positioned over the upper surface of the encapsulating layer, and having a plurality of contact pads, each having a solder contact placing the respective one of the contact pads of the semiconductor package in electrical communication with a corresponding one of the plurality of solder balls. 3. The wafer of claim 1, further comprising a plurality of solder balls coupled to respective ones of the second plurality of contact pads. 4. The wafer of claim 1, wherein the redistribution layer further includes a first dielectric layer and a second dielectric layer. 5. The wafer of claim 2, wherein the semiconductor package is spaced over and apart from the second surface of the semiconductor die. 6. A device comprising: a rigid redistribution layer having a first surface having a first portion with a first set of first contacts pads and a second fan-out portion with a second set of first contact pads;a plurality of first and second solder connectors, the plurality of first solder connectors being located on the first set of first contact pads of the redistribution layer, the plurality of second solder connectors being located on the second set of first contact pads of the redistribution layer;a semiconductor die having a first surface and a second surface, the first and second surfaces being connected by side surfaces, the first surface of the semiconductor die being positioned on the first portion of the first surface of the redistribution layer, the semiconductor die having a plurality of second contact pads on the first surface and in electrical communication with a respective one of the first set of first contact pads of the redistribution layer via the plurality of first solder connectors, the plurality of second contact pads being electrically isolated from the second set of first contact pads; andencapsulating material positioned on the first surface of the redistribution layer and encapsulating side surfaces of the semiconductor die and entire side surfaces of the plurality of first and second solder connectors, each of the plurality of first and second solder connectors, the encapsulating layer, and semiconductor die having a common coplanar surface. 7. The device of claim 6, further comprising a semiconductor package positioned over the upper surface of the encapsulating layer, the semiconductor package having a plurality of contact pads, each having a solder contact placing the respective one of the contact pads of the semiconductor package in electrical communication with a corresponding one of the plurality of second solder connectors. 8. The device of claim 7, wherein the semiconductor package is spaced over and apart from the second surface of the semiconductor die.