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An optical measurement instrument includes: an excitation light source (120) arranged to produce an excitation beam for at least one of samples to be measured and a detector (132) arranged to detect an emission beam emitted by one of the samples to be measured and to produce a detection signal respo

An optical measurement instrument includes: an excitation light source (120) arranged to produce an excitation beam for at least one of samples to be measured and a detector (132) arranged to detect an emission beam emitted by one of the samples to be measured and to produce a detection signal responsive to the detected emission beam. The optical measurement instrument further includes an arrangement for controlling temperature of the samples to be measured. The arrangement includes: one or more temperature sensors (176) for producing one or more temperature signals responsive to temperature of a measurement chamber (170) of the optical measurement instrument, one or more heating resistors (171-175) arranged to warm the measurement chamber, and a controller (177) arranged to control electrical power supplied to the heating resistors on the basis of the one or more temperature signals.

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1. A base module for an optical measurement instrument, the base module comprising: a mechanical structure for forming a measurement chamber and for supporting one or more optical measurement elements,a reception device inside the measurement chamber for receiving samples to be measured,heating resi

1. A base module for an optical measurement instrument, the base module comprising: a mechanical structure for forming a measurement chamber and for supporting one or more optical measurement elements,a reception device inside the measurement chamber for receiving samples to be measured,heating resistors placed at different places of the measurement chamber, each heating resistor being arranged to warm the measurement chamber,at least one temperature sensor, each temperature sensor being arranged to produce a temperature signal responsive to temperature of the measurement chamber, anda controller arranged to control electrical power supplied to each of the at least one heating resistor on the basis of the at least one temperature signal produced by the at least one temperature sensor,wherein the controller is arranged to control the electrical powers supplied to the heating resistors so that the electrical power supplied to a first one of the heating resistors is proportional to B1×q and the electrical power supplied to a second one of the heating resistors is proportional to B2×q, wherein q is a quantity controlled on the basis of one of the at least one temperature signal, B1 is a pre-determined balancing coefficient specific to the first one of the heating resistors, and B2 is a pre-determined balancing coefficient specific to the second one of the heating resistors, the balancing coefficient B1 having a different value than the balancing coefficient B2 in order to compensate effect of differences in temperature/power-characteristics related to surroundings of the first and second ones of the heating resistors. 2. A base module according to claim 1, wherein the at least one temperature sensor comprises temperature sensors placed at different places of the measurement chamber and the controller is arranged to control the electrical power supplied to each of the heating resistors on the basis the temperature signal produced by the particular temperature sensor nearest to that heating resistor. 3. A base module according to claim 2, wherein the base module comprises a blower arranged to blow cooling air towards outer walls of the measurement chamber. 4. A base module according to claim 1, wherein the base module comprises a blower arranged to blow cooling air towards outer walls of the measurement chamber. 5. A base module according to claim 1, wherein the base module comprises a blower (281) arranged to blow cooling air into the measurement chamber. 6. A base module according to claim 1, wherein the mechanical structure for forming the measurement chamber comprises: a first plate,a second plate substantially parallel with the first plate and movably supported with respect to the first plate, the second plate being movable in a direction substantially perpendicular to the first and second plates, andwalls extending from outer edges of the first plate to outer edges of the second plate,wherein the measurement chamber is constituted by the walls and the first and second plates and the second plate comprises at least one fastening interface suitable for an optical measurement element to be mounted to the second plate. 7. A base module according to claim 6, wherein at least one of the at least one heating resistor is mounted on the surface of the first plate. 8. A base module according to claim 7, wherein at least one of the at least one heating resistor is mounted on the surface of the second plate. 9. A base module according to claim 6, wherein at least one of the at least one heating resistor is mounted on the surface of the second plate. 10. A base module according to claim 1, wherein the controller is arranged to control driving voltage of each of the at least one heating resistor with pulse width modulation (PWM) for controlling the electrical power of that heating resistor. 11. A base module according to claim 1, wherein the controller is arranged to operate as a proportional-integrative-derivative (PID) regulator for controlling the electrical power supplied to each of the at least one heating resistor on the basis of the at least one temperature signal produced by the at least one temperature sensor. 12. A base module according to claim 1, wherein, the base module comprises said first and second heating resistors and a first said temperature sensor, said first and second heating resistors being controlled by said first temperature sensor,the controller arranged to control the electrical power supplied to said first heating resistor on the basis of the one temperature signal produced by the first temperature sensor,wherein the controller is arranged to control the electrical powers supplied to the first and second heating resistors so thati) the electrical power supplied to the first heating resistor is proportional to B1×q, andii) the electrical power supplied to the second heating resistor is proportional to B2×q,wherein q is the quantity controlled on the basis of the one temperature signal of the first temperature sensor,B1 is the pre-determined balancing coefficient specific to the first heating resistor,B2 is the pre-determined balancing coefficient specific to the second heating resistor, andthe balancing coefficients of B1 and B2 compensate for the effect of the differences in the temperature characteristics and the power-characteristics of the surroundings of the first and second heating resistors, and respectively depend on the temperature characteristics and the power-characteristics of the surroundings of the first and second heating resistors. 13. An optical measurement instrument comprising optical measurement elements and a base module, at least one of the optical measurement elements including an excitation light source arranged to produce an excitation beam for at least one of samples to be measured, and at least one of the optical measurement elements including a detector arranged to detect an emission beam emitted by one of the samples to be measured and to produce a detection signal responsive to the detected emission beam, and the base module comprising: a mechanical structure for forming a measurement chamber,a reception device inside the measurement chamber for receiving the samples to be measured,heating resistors placed at different places of the measurement chamber, each heating resistor being arranged to warm the measurement chamber,at least one temperature sensor, each temperature sensor being arranged to produce a temperature signal responsive to temperature of the measurement chamber, anda controller arranged to control electrical power supplied to each of the at least one heating resistor on the basis of the at least one temperature signal produced by the at least one temperature sensor,wherein at least one of the optical measurement elements is mounted to the mechanical structure forming the measurement chamber and the controller is arranged to control the electrical powers supplied to the heating resistors so that the electrical power supplied to a first one of the heating resistors is proportional to B1×q and the electrical power supplied to a second one of the heating resistors is proportional to B2×q, wherein q is a quantity controlled on the basis of one of the at least one temperature signal, B1 is a pre-determined balancing coefficient specific to the first one of the heating resistors, and B2 is a pre-determined balancing coefficient specific to the second one of the heating resistors, the balancing coefficient B1 having a different value than the balancing coefficient B2 in order to compensate effect of differences in temperature/power-characteristics related to surroundings of the first and second ones of the heating resistors. 14. A method for controlling temperature of samples being measured with an optical measurement instrument, the method comprising: producing, with at least one temperature sensor, a temperature signal responsive to temperature of a measurement chamber of the optical measurement instrument, the samples being located in the measurement chamber,controlling electrical powers supplied to heating resistors placed at different places of the measurement chamber on the basis of the temperature signal, andwarming the measurement chamber with the heating resistors,wherein the electrical powers supplied to the heating resistors are controlled so that the electrical power supplied to a first one of the heating resistors is proportional to B1×q and the electrical power supplied to a second one of the heating resistors is proportional to B2×q, wherein q is a quantity controlled on the basis of one of the at least one temperature signal, B1 is a pre-determined balancing coefficient specific to the first one of the heating resistors, and B2 is a pre-determined balancing coefficient specific to the second one of the heating resistors, the balancing coefficient B1 having a different value than the balancing coefficient B2 in order to compensate effect of differences in temperature/power-characteristics related to surroundings of the first and second ones of the heating resistors.