The present invention is to present a specimen processing apparatus, comprising: an imaging device for imaging a cap of a covered specimen container containing a specimen; an aspirating device including a specimen aspirating tube, moving the specimen aspirating tube so as to pass the specimen aspira
The present invention is to present a specimen processing apparatus, comprising: an imaging device for imaging a cap of a covered specimen container containing a specimen; an aspirating device including a specimen aspirating tube, moving the specimen aspirating tube so as to pass the specimen aspirating tube through the cap of the covered specimen container and aspirating the specimen contained in the covered specimen container via the specimen aspirating tube; an aspiration controller for controlling a movement of the specimen aspirating tube into the covered specimen container based on an image obtained by the imaging device; and a specimen processing device for processing the specimen aspirated by the aspirating device.
대표청구항▼
1. A specimen processing system, comprising: an imaging device that captures an image of a cap of a sealed specimen container containing a specimen;a system controller connected with the imaging device via a first interface, the system controller including a first computer readable memory including
1. A specimen processing system, comprising: an imaging device that captures an image of a cap of a sealed specimen container containing a specimen;a system controller connected with the imaging device via a first interface, the system controller including a first computer readable memory including a first database and a first computer program embedded thereon, the first database comprising a relationship of feature values and types of specimen container;a specimen processing device, comprising: a measurement device that prepares the specimen and detects a measurement component from the specimen for analysis, the measurement device comprising:an aspirating device including a pipette having a sharp edge, moving the pipette to pierce a cap of the sealed specimen container and aspirating the specimen in the sealed specimen container by the pipette whereby the cap of the sealed specimen container remains in the specimen container during aspiration; andan information processing unit coupled to the measurement device and operable to control an operation of the measurement device, the information processing unit connected with the system controller via a second interface, the information processing unit including a second computer readable memory including a second database and a second computer program embedded thereon, the second database comprising a relationship of the types of specimen container and movement distances of the pipette;wherein the first computer program comprises instructions to: execute the imaging device for capturing an image of the sealed specimen container and receiving the image via the first interface;extract a feature value from the captured image; anddetermine a type of the sealed specimen container corresponding to the feature value with reference to the first database;wherein the second computer program comprises instructions to: receive the determined type of the sealed specimen container from the system controller via the second interface;retrieve a movement distance corresponding to the determined type with reference to the second database; andcontrol the aspirating device to move the pipette by the movement distance and control the specimen processing device to process the specimen aspirated by the pipette;wherein the movement distance corresponds to an insertion amount of the pipette into the sealed specimen container which enables the pipette to approach near an inner bottom of the sealed specimen container without bringing into contact with the inner bottom;wherein an inner depth of the sealed specimen container varies depending on a specimen container type, and the movement distance is set to be customized for each specimen container type. 2. The specimen processing system of claim 1, wherein the image includes color information for each pixel; andthe feature value includes the color information of the image. 3. The specimen processing system of claim 1, wherein the feature value includes a value relevant to a shape of a cap. 4. The specimen processing system of claim 1, wherein the imaging device captures an image of a whole length of the sealed specimen container, andthe feature value includes a length of a specimen container. 5. The specimen processing system of claim 4, wherein the imaging device captures the image of the cap of the specimen container and an image of a specimen rack accommodating the specimen container; andthe system controller obtains a length of the specimen container based on a position of the specimen rack and a position of the cap of the sealed specimen container in the image. 6. The specimen processing system of claim 1, wherein the first database further comprises instructions that store a reference object which provides a reference image with respect to the image of the cap, andwherein the imaging device further captures an image of the cap of the sealed specimen container and the reference image of the reference object; andthe system controller extracts the feature value on the basis of the image of the reference object and the image of the cap. 7. The specimen processing system of claim 6, wherein the system controller performs further operations of:determining, on the basis of the image of the reference object, a physical feature of the background of the image;correcting the feature value based on the physical feature of the background of the image; anddetermining a type of the sealed specimen container corresponding to the corrected feature value. 8. The specimen processing system of claim 7, wherein the first computer readable memory stores reference feature information corresponding to the physical feature of the reference object, and the system controller corrects the feature value, on the basis of the reference feature information and a determined physical feature. 9. The specimen processing apparatus of claim 6, wherein the system controller performs further operations of: determining, on the basis of the image of the reference object, the physical feature of the environment of imaging;extracting the feature value on the basis of the determined physical feature and the image of the cap. 10. The specimen processing system of claim 9, wherein the system controller performs further operations of:determining, on the basis of the determined physical feature, a processing condition for processing the image of the cap;processing the image of the cap according to the determined processing condition; andextracting the feature value from the processed image of the cap. 11. The specimen processing system of claim 6, wherein the imaging device accepts a change of a setting relating to an imaging condition; andthe system controller performs operations of: determining a physical feature of the reference object, andchanging a setting according to the determined physical feature. 12. The specimen processing system of claim 6, wherein the imaging device comprises a camera and an illumination device that irradiates an object to be imaged, the system controller performs further operations of: determining a luminance of the image of the reference object; andoutputting, when the determined luminance of the image is not within a predetermined range, a notification to notify that sensitivity of the camera or light intensity of the illumination device is not at a predetermined status. 13. The specimen processing system of claim 6, wherein the system controller performs further operations of: processing the image of the cap by eliminating a background of an image therefrom, by use of the image of the reference object; andextracting the feature value from the processed image. 14. The specimen processing system of claim 6, wherein the first computer program comprises instructions to: determine a type of the sealed specimen container corresponding to one of the feature values if the extracted feature value is identical to one of the feature values in the first database, or is substantially identical to one of the feature values in a predetermined value range, andthe system controller outputs a notification of an error if the extracted feature value is not identical to, or not substantially identical to any of the feature values in the first database. 15. The specimen processing system of claim 1, further comprising: a transporting device that transports a specimen container to the aspirating device via an imaging position where the imaging device captures an image of a cap of the transported specimen container. 16. The specimen processing system of claim 1, wherein the aspirating device moves the pipette into the sealed specimen container by lowering the pipette. 17. The specimen processing system of claim 1, further comprising: a grasping member that grasps the sealed specimen container and oscillates the grasped specimen container to stir the specimen accommodated therein,wherein the aspirating device is configured to aspirate the specimen from the oscillated specimen container.
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이 특허에 인용된 특허 (2)
Sakazume Taku,JPX ; Mitsumaki Hiroshi,JPX ; Mimura Tomonori,JPX ; Kawase Kazumitsu,JPX, Analyzing apparatus having a function pipette samples.
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