Method and device for shielding a high-power laser apparatus and high-power-laser optical system employing such a device
원문보기
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
H01S-003/13
H01S-003/00
G02B-026/06
G02B-027/46
H01S-003/23
출원번호
US-0738117
(2008-10-13)
등록번호
US-8971363
(2015-03-03)
우선권정보
FR-07 58323 (2007-10-15)
국제출원번호
PCT/FR2008/051857
(2008-10-13)
§371/§102 date
20100708
(20100708)
국제공개번호
WO2009/053642
(2009-04-30)
발명자
/ 주소
Levecq, Xavier
Riboulet, Gilles
출원인 / 주소
Imagine Optic
대리인 / 주소
Young & Thompson
인용정보
피인용 횟수 :
4인용 특허 :
8
초록▼
Method for shielding a high-power laser apparatus (S) in which a laser beam is generated and then amplified in at least a first amplification stage, including spatial filtering (4) of the amplified laser beam, phase correction (3) carried out on the laser beam before it is spatially filtered, and a
Method for shielding a high-power laser apparatus (S) in which a laser beam is generated and then amplified in at least a first amplification stage, including spatial filtering (4) of the amplified laser beam, phase correction (3) carried out on the laser beam before it is spatially filtered, and a measurement of the aberrations (7) on the laser beam. The phase of the beam is corrected so as to produce a beam having minimal aberrations after spatial filtering. The shielding device (D, D′) implementing this method may in particular be employed in apparatus using an intense laser beam of high (terawatt) peak power and in proton therapy units.
대표청구항▼
1. A method for shielding a high-power laser apparatus in which a laser beam is generated and then amplified in at least a first amplification stage, comprising: spatial filtering of said amplified laser beam by a filter pinhole, the laser beam being focused on the filter pinhole;correcting the phas
1. A method for shielding a high-power laser apparatus in which a laser beam is generated and then amplified in at least a first amplification stage, comprising: spatial filtering of said amplified laser beam by a filter pinhole, the laser beam being focused on the filter pinhole;correcting the phase of the laser beam prior to the spatial filtering; andmeasuring aberrations of the laser beam,wherein the correcting the phase of the laser beam is controlled so as to produce the laser beam with minimized aberrations after the spatial filtering,the filter pinhole is configured having a size to eliminate, from the laser beam, the aberrations at spatial frequencies that can give rise, by propagation, to surges in the laser beam, andthe laser beam passes through the filter pinhole only once. 2. The method for shielding according to claim 1, wherein the measuring aberrations is carried out before the spatial filtering of the laser beam. 3. The method for shielding according to claim 1, wherein the measuring aberrations is carried out after the spatial filtering of the laser beam. 4. The method for shielding according to claim 3, further comprising translating means for spatial filtering in a direction approximately orthogonal to a direction of the spatially filtered laser beam, so that said means for spatial filtering are withdrawn from said laser beam to permit the measuring aberrations of a wave front of the laser beam. 5. The method for shielding according to claim 1, further comprising sampling a fraction of the phase corrected laser beam, prior to the measuring aberrations. 6. The method for shielding according to claim 1, wherein the filter pinhole is sized to be approximately less than ten times a diffraction limit of the laser beam. 7. The method for shielding according to claim 1, further comprising detecting degradation of the filter pinhole. 8. A device for shielding a high-power laser apparatus, the apparatus comprising means for generating a laser beam and first means for amplifying the laser beam, the device comprising: means for spatial filtering constructed and arranged to receive said amplified laser beam, the means for spatial filtering comprising a filter pinhole located at a position such that the laser beam is focused on the pinhole;means for correcting a phase of the laser beam arranged upstream of said means for spatial filtering; andmeans for measuring aberrations arranged downstream of said means for correcting the phase of the laser beam;wherein the means for correcting the phase of the laser beam is controlled so as to produce the laser beam with minimized aberrations after spatial filtering by the means for spatial filtering,the filter pinhole is configured having a size to eliminate, from the laser beam, the aberrations at spatial frequencies that can give rise, by propagation, to surges in the laser beam, andthe filter pinhole being disposed in the device such that the laser beam passes through the filter pinhole only once. 9. The device according to claim 8, further comprising means for detecting degradation of the means for spatial filtering. 10. The device according to claim 9, wherein the means for detecting degradation comprises a camera for imaging the means for spatial filtering. 11. The device according to claim 8, wherein the means for measuring aberrations is arranged upstream of the means for spatial filtering. 12. The device according to claim 8, wherein the means for measuring aberration is arranged downstream of the means for spatial filtering. 13. The device according to claim 12, further comprising means for effecting translation of the means for spatial filtering in a direction approximately orthogonal to a direction of the laser beam coming from said means for spatial filtering. 14. The device according to claim 8, further comprising means for sampling a fraction of the laser beam downstream of said means for correcting the phase of the laser beam and directing said fraction towards the means for measuring aberrations. 15. The device according to claim 8, wherein the means for correcting the phase of the laser beam comprises a deformable mirror. 16. A high-power-laser optical system, comprising: means for generating a laser beam,means for amplifying said laser beam,means for spatially filtering said laser beam, the means for spatially filtering the laser beam comprising a filter pinhole located at a position such that the laser beam is focused on the pinhole,means for focusing said spatially filtered beam onto a target,means for correcting a phase of the laser beam upstream of said means for spatially filtering, andmeans for measuring aberrations of the laser beam arranged downstream of said means for correcting the phase of the laser beam,wherein the means for correcting the phase of the laser beam is controlled so as to produce the laser beam with minimized aberrations after spatial filtering by the means (4) for spatial filtering,the filter pinhole is configured having a size to eliminate, from the laser beam, the aberrations at spatial frequencies that can give rise, by propagation, to surges in the laser beam, andthe filter pinhole being disposed in the device such that the laser beam passes through the filter pinhole only once. 17. The high-power-laser system according to claim 16, further comprising means for amplifying the laser beam coming from the means for spatial filtering. 18. The high-power-laser system according to claim 16, further comprising means for compressing the laser beam coming from the means for spatial filtering. 19. The high-power-laser system according to claim 16, further comprising means for detecting degradation of the means for spatial filtering. 20. The high-power-laser system according to claim 16, wherein the means for measuring aberrations is arranged upstream of the means for spatial filtering. 21. The high-power-laser system according to claim 16, wherein the means for measuring aberrations is arranged downstream of the means for spatial filtering. 22. The high-power-laser system according to claim 21, further comprising means for effecting translation of the means for spatial filtering in a direction approximately orthogonal to a direction of the laser beam passing through said means for spatial filtering. 23. The high-power-laser system according to claim 16, further comprising means for sampling a fraction of the laser beam downstream of said means for correcting the phase of the laser beam, and for directing the sampled fraction towards the means for measuring aberrations. 24. An application of the method for shielding according to claim 1, in a proton therapy apparatus. 25. An application of the method for shielding according to claim 1, in an installation for experimentation at high peak power.
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이 특허에 인용된 특허 (8)
Franck, Jerome B., High power laser using controlled, distributed foci juxtaposed in a stimulate Brillouin scattering phase conjugation cell.
Chanteloup Jean-Christophe,FRX ; Huignard Jean-Pierre,FRX ; Loiseaux Brigitte,FRX ; Tournois Pierre,FRX, System for correction the shape of a wave-front of a laser beam.
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