초록 ▼

An embodiment disperses a force acting on a border portion between an extending portion and a pedestal portion or a reinforcing member to prevent breakage of a probe tip portion of a probe. An electrical test probe includes a probe main body, a recess provided at an end of the main body and having a

An embodiment disperses a force acting on a border portion between an extending portion and a pedestal portion or a reinforcing member to prevent breakage of a probe tip portion of a probe. An electrical test probe includes a probe main body, a recess provided at an end of the main body and having an inner surface, and a probe tip having a part received in the recess. The inner surface has a central area and two lateral areas on both sides of the central area, and the part of the probe tip is located at the central area and at least at either one of the lateral areas.

대표청구항 ▼

1. A probe, comprising: a probe main body portion including an attaching end configured to attach to a probe board, and a probe-tip-receiving end;a recess provided at the probe-tip-receiving end of the probe main body portion and having an inner surface; anda probe-tip portion having a part received

1. A probe, comprising: a probe main body portion including an attaching end configured to attach to a probe board, and a probe-tip-receiving end;a recess provided at the probe-tip-receiving end of the probe main body portion and having an inner surface; anda probe-tip portion having a part received in the recess,wherein the inner surface has a central area and two lateral areas on both sides of the central area, and the part of the probe tip portion is located at the central area and at least at either one of the lateral areas,wherein the central area and at least either one of the lateral areas define a border portion between the probe main body portion and the part of the probe tip portion received in the recess, and the border portion is concave-shaped such as arc-shaped, one-side open rectangular-shaped, or V-shaped along a first direction in which the central area and the lateral areas are arranged. 2. The probe according to claim 1, wherein a zone of the central area and the lateral areas at which the part of the probe-tip portion is located is in an arc along the first direction in which the central area and the lateral areas are arranged. 3. The probe according to claim 2, wherein the probe-tip portion is in a plate shape perpendicular to the inner surface, and the part of the probe-tip portion is located at a center of the inner surface in a second direction perpendicular to the first direction of the inner surface. 4. A probe assembly, comprising: a plurality of probes wherein each probe has a respective probe main body portion including a respective attaching end configured to attach to a probe board, and a respective probe-tip-receiving end, a respective recess provided at the respective probe-tip-receiving end and having a respective inner surface, and a respective probe-tip portion having a respective part received in the respective recess and wherein the respective inner surface has a respective central area and two respective lateral areas on both sides of the respective central area, and the respective part of the respective probe-tip portion is located at the respective central area and at least at either one of the respective lateral areas;wherein the respective central area and at least either one of the respective lateral areas define a respective border portion between the respective part of the probe tip portion and the probe main body portion, and the respective border portion is concave-shaped such as arc-shaped or one-side open rectangular-shaped or V-shaped or W-shaped along a first direction in which the respective central area and the respective lateral areas are arranged; anda probe board to which the probes are attached. 5. An electrical test probe, comprising: a probe main body portion;an attaching portion configured to attach to a probe board, the attaching portion being provided at the probe main body portion;a plate-like pedestal portion that is provided at the probe main body portion and whose right-left direction is a thickness direction; anda probe-tip portion that extends downward from the pedestal portion and whose lower end is a tip end to contact on a device under test,wherein the pedestal portion has a recess opened at least downward and defined by a central area opposed to an open surface thereof and lateral areas continuing into respective ends of the central area in a front-back direction and reaching open ends of the recess from the central area,wherein the probe-tip portion is made of a harder material than that of the pedestal portion and has a coupling portion coupled with the pedestal portion by being buried or fitted in the pedestal portion and a plate-like extending portion extending downward from the recess and having a smaller thickness dimension than a thickness dimension of the recess, andwherein the extending portion has a border portion contacting the recess from the central area to the lateral areas, and the border portion is concave-shaped such as arc-shaped, one-side open rectangular-shaped or V-shaped along the first direction in which the central area and the lateral areas are arranged. 6. The electrical test probe according to claim 5, wherein the central area and the lateral areas collectively form one arc surface extending in a front-back direction. 7. The electrical test probe according to claim 5, wherein the coupling portion is located approximately at a center of the recess in a right-left direction. 8. A probe assembly, comprising: a probe board having a plurality of probe lands on a lower surface; anda plurality of probes attached to the probe lands,wherein the plurality of probes are the electrical test probes according to claim 5. 9. The probe assembly according to claim 4, wherein each probe is attached to the probe board in a cantilevered manner. 10. The probe assembly according to claim 8, wherein each probe is attached to the probe board in a cantilevered manner. 11. The probe according to claim 1, wherein a zone of the central area and the lateral areas at which the part of the probe-tip portion is located is in an arc along the first direction in which the central area and the lateral areas are arranged, or in one-side open rectangular-shaped or V-shaped along the first direction in which an angle with the central area and the lateral areas is more than perpendicular.