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[미국특허] Process chamber component having yttrium—aluminum coating 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • C23C-004/10
  • B05C-011/00
  • B32B-015/04
  • B32B-015/20
  • C25D-003/54
  • C23C-016/44
  • C23C-030/00
  • C25D-005/50
  • H01J-037/32
  • H01L-021/67
  • C23C-028/00
  • C25D-003/44
  • C25D-003/56
  • C25D-005/18
출원번호 US-0368255 (2012-02-07)
등록번호 US-9012030 (2015-04-21)
발명자 / 주소
  • Han, Nianci
  • Xu, Li
  • Shih, Hong
출원인 / 주소
  • Applied Materials, Inc.
대리인 / 주소
    Janah, Ashok K.
인용정보 피인용 횟수 : 2  인용 특허 : 90

초록

A substrate processing chamber component comprising a chamber component structure having an yttrium-aluminum coating. The yttrium-aluminum coating comprises a compositional gradient through a thickness of the coating.

대표청구항

1. A substrate processing chamber component comprising: (a) a process chamber component structure composed of a metal alloy; and(b) an yttrium-aluminum coating on the chamber component structure, the yttrium-aluminum coating having a compositional gradient through a thickness of the coating. 2. A co

이 특허에 인용된 특허 (90) 인용/피인용 타임라인 분석

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이 특허를 인용한 특허 (2) 인용/피인용 타임라인 분석

  1. Sun, Jennifer Y.; Firouzdor, Vahid, High purity metallic top coat for semiconductor manufacturing components.
  2. Wu, Xiaowei; Fenwick, David; Sun, Jennifer Y.; Zhan, Guodong, Multi-layer plasma resistant coating by atomic layer deposition.

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