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Structures and methods of forming moisture barrier capacitor on a semiconductor component are disclosed. The capacitor is located on the periphery of a semiconductor chip and includes an inner plate electrically connected to a voltage node, an outer plate with fins for electrically connecting to a d

Structures and methods of forming moisture barrier capacitor on a semiconductor component are disclosed. The capacitor is located on the periphery of a semiconductor chip and includes an inner plate electrically connected to a voltage node, an outer plate with fins for electrically connecting to a different voltage node.

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1. A method of forming a moisture barrier capacitor, the method comprising: forming an outer plate and an inner plate of the moisture barrier capacitor, the capacitor disposed on a periphery of a chip edge;forming electrical connections to the outer plate of the capacitor to an active circuitry thro

1. A method of forming a moisture barrier capacitor, the method comprising: forming an outer plate and an inner plate of the moisture barrier capacitor, the capacitor disposed on a periphery of a chip edge;forming electrical connections to the outer plate of the capacitor to an active circuitry through a upper layer not porous to moisture, wherein the outer plate is electrically connected by fins, wherein at least a portion of the fins are disposed above the inner plate and embedded in the upper layer comprising oxide or nitride region;forming electrical connections to the inner plate of the capacitor to the active circuitry; andforming a moisture barrier structure in the outer plate of the moisture barrier capacitor. 2. The method of claim 1, wherein the outer plate, the inner plate and the moisture barrier structure are formed as a part of a metallization process, and wherein forming the outer plate, the inner plate, and the moisture barrier structure do not require any additional masks or masking steps than masks needed to form a metallization layer over the active circuitry. 3. The method of claim 1, forming the outer and the inner plate of the parasitic capacitor comprises forming via and metal levels, wherein forming the via and metal levels comprises: depositing a dielectric material layer;patterning the dielectric material layer forming an aperture;depositing a conductive liner on sidewalls and a bottom surface of the aperture;filling the aperture with a conductive material after depositing the conductive liner; andplanarising the conductive material. 4. The method of claim 1, wherein the upper layer is a silicon oxide layer. 5. The method of claim 1, wherein the outer plate and the inner plate do not overlap and are laterally separated. 6. The method of claim 5, wherein the outer plate comprises first vias adjacent a first edge of the outer plate and second vias adjacent an opposite second edge of the outer plate, the second vias being conductively coupled to the first vias. 7. The method of claim 6, wherein only the first vias are substantially capacitively coupled to the inner plate. 8. The method of claim 1, wherein a portion of the inner plate and the outer plate are separated by an insulating material, wherein the insulating material is not a low-k dielectric material, and wherein a corresponding portion between the outer plate and the chip edge is separated by a low-k insulating material. 9. The method of claim 1, wherein the outer plate comprises a moisture barrier. 10. The method of claim 9, wherein the moisture barrier comprises additional vias and additional length and width of metal lines, and wherein each of the inner plate and outer plate comprises vertically stacked metal lines and vias. 11. The method of claim 10, wherein at least a portion of the vertically stacked metal lines and the vias are disposed in a low-k insulating material. 12. The method of claim 1, and wherein the outer plate extends vertically without disruption in a low-k insulating material. 13. A method of forming a moisture barrier capacitor, the method comprising: forming an outer plate and an inner plate of the moisture barrier capacitor, the capacitor disposed on a periphery of a chip edge;forming electrical connections to the outer plate of the capacitor to an active circuitry through a upper layer not porous to moisture;forming electrical connections to the inner plate of the capacitor to the active circuitry, wherein a portion of the inner plate and the outer plate are separated by an insulating material, wherein the insulating material is not a low-k dielectric material, and wherein a corresponding portion between the outer plate and the chip edge is separated by a low-k insulating material;forming a moisture barrier structure in the outer plate of the moisture barrier capacitor. 14. The method of claim 13, wherein the outer plate, the inner plate and the moisture barrier structure are formed as a part of a metallization process, and wherein forming the outer plate, the inner plate, and the moisture barrier structure do not require any additional masks or masking steps than masks needed to form a metallization layer over the active circuitry. 15. The method of claim 13, forming the outer and the inner plate of the parasitic capacitor comprises forming via and metal levels, wherein forming the via and metal levels comprises: depositing a dielectric material layer;patterning the dielectric material layer forming an aperture;depositing a conductive liner on sidewalls and a bottom surface of the aperture;filling the aperture with a conductive material after depositing the conductive liner; andplanarising the conductive material. 16. The method of claim 13, wherein the upper layer is a silicon oxide layer. 17. The method of claim 13, wherein the outer plate and the inner plate do not overlap and are laterally separated. 18. The method of claim 17, wherein the outer plate comprises first vias adjacent a first edge of the outer plate and second vias adjacent an opposite second edge of the outer plate, the second vias being conductively coupled to the first vias. 19. The method of claim 18, wherein only the first vias are substantially capacitively coupled to the inner plate. 20. The method of claim 13, wherein the outer plate comprises a moisture barrier. 21. The method of claim 20, wherein the moisture barrier comprises additional vias and additional length and width of metal lines, and wherein each of the inner plate and outer plate comprises vertically stacked metal lines and vias. 22. The method of claim 21, wherein at least a portion of the vertically stacked metal lines and the vias are disposed in a low-k insulating material. 23. The method of claim 13, wherein the outer plate is electrically connected by fins, wherein at least a portion of the fins are disposed above the inner plate and embedded in the upper layer comprising oxide or nitride region, and wherein the outer plate extends vertically without disruption in a low-k insulating material.