Customizing operation of a test instrument based on information from a system under test
원문보기
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
G06F-011/00
G06F-011/263
G06F-011/30
출원번호
US-0398529
(2012-02-16)
등록번호
US-9135131
(2015-09-15)
발명자
/ 주소
Schroeder, Charles G.
Graf, Christopher F.
Nishiguchi, Ciro T.
D'Souza, Nigel G.
Baker, Daniel J.
Magruder, Thomas D.
출원인 / 주소
National Instruments Corporation
대리인 / 주소
Meyertons Hood Kivlin Kowert & Goetzel, P.C.
인용정보
피인용 횟수 :
1인용 특허 :
28
초록▼
Customizing a test instrument. A plurality of pairs of code modules may be provided. Each pair of code modules may include a first code module having program instructions for execution by a processor of the test instrument and a second code module for implementation on a programmable hardware elemen
Customizing a test instrument. A plurality of pairs of code modules may be provided. Each pair of code modules may include a first code module having program instructions for execution by a processor of the test instrument and a second code module for implementation on a programmable hardware element of the test instrument. For each pair of code modules, the first code module and the second code module may collectively implement a function in the test instrument. User input may be received specifying modification of a second code module of at least one of the plurality of pairs of code modules. Accordingly, a hardware description may be generated for the programmable hardware element of the test instrument based on the modified second code module.
대표청구항▼
1. A method for customizing a test instrument, comprising: utilizing a computer to perform: storing first code for execution by a processor of the test instrument;storing second code for implementation on a programmable hardware element of the test instrument;receiving user input customizing the sec
1. A method for customizing a test instrument, comprising: utilizing a computer to perform: storing first code for execution by a processor of the test instrument;storing second code for implementation on a programmable hardware element of the test instrument;receiving user input customizing the second code prior to said storing the second code, wherein the user input specifies adaptive behavior for the test instrument based on information from a system under test (SUT);generating and storing a hardware description for the programmable hardware element based on the user input;wherein, after implementation of the hardware description on the programmable hardware element and during testing of the SUT coupled to the test instrument, the test instrument is configured to determine information received from the SUT during testing of the SUT;wherein operation of the test instrument is automatically modified based on the adaptive behavior specified by the user input and the information received from the SUT during testing of the SUT, wherein modification of the operation comprises one or more of: configuration of the test instrument; orconfiguration of the SUT. 2. The method of claim 1, wherein the first code and the second code are specified in one or more graphical program portions comprising a plurality of nodes connected by wires, wherein the plurality of nodes visually represent functionality of the one or more graphical program portions, wherein said receiving user input specifying customization comprises receiving user input modifying the one or more graphical program portions. 3. The method of claim 1, wherein the operation of the test instrument is automatically modified based on a characteristic of a signal received from the SUT. 4. The method of claim 1, wherein the operation of the test instrument is automatically modified based on content of a signal received from the SUT. 5. The method of claim 1, wherein modification of the operation further comprises one or more of: modification of processing of signals received from the SUT; ormodification of signals sent to the SUT. 6. A method for customizing a test instrument, comprising: utilizing a computer to perform: providing a configuration for a test instrument, wherein the configuration comprises first code for execution by a processor of the test instrument and second code for implementation on a programmable hardware element of the test instrument;receiving user input customizing the configuration for the test instrument, wherein the user input specifies modification to the second code, wherein the modification to the second code specifies adaptive behavior for the test instrument;generating and storing a hardware description for the programmable hardware element based on the configuration and the user input, wherein, after implementation of the hardware description on the programmable hardware element, the test instrument is configured to: receive information from the system under test (SUT) coupled to the test instrument; andautomatically modify operation of the test instrument based on the information, wherein said automatically modifying comprises performing the adaptive behavior specified by the user input customizing the configuration for the test instrument, including one or more of: configuring the test instrument; orconfiguring the SUT. 7. The method of claim 6, wherein the configuration comprises a plurality of pairs of code modules, wherein each pair of code modules comprises a first code module having program instructions for execution by a processor of the test instrument and a second code module for implementation on a programmable hardware element of the test instrument, wherein, for each pair of code modules, the first code module and the second code module collectively implement a function in the test instrument, wherein the first code module of a pair of code modules is executable on the processor to perform a first portion of a function, and wherein the second code module of the pair of code modules is configured to be implemented on the programmable hardware element to perform a corresponding second portion of the function. 8. The method of claim 6, wherein the configuration is specified in one or more graphical program portions comprising a plurality of nodes connected by wires, wherein the plurality of nodes visually represent functionality of the one or more graphical program portions, wherein said receiving user input specifying customization comprises receiving user input modifying the one or more graphical program portions. 9. The method of claim 6, wherein the information comprises a characteristic of a signal received from the SUT, wherein said automatically modifying is performed based on the characteristic. 10. The method of claim 6, wherein said receiving information from the SUT comprises: receiving a signal from the SUT; anddetermining the information by analyzing content of the signal received from the SUT;wherein said automatically modifying is based on the content of the signal. 11. A non-transitory, computer accessible memory medium storing program instructions for customizing a test instrument, wherein the program instructions are executable by a computer processor to: provide first code for execution by a processor of the test instrument;provide second code for implementation on a programmable hardware element of the test instrument;receive user input customizing the second code prior to said storing the second code, wherein the user input specifies the adaptive behavior for the test instrument;generate and store a hardware description for the programmable hardware element based on the user input;wherein, after implementation of the hardware description on the programmable hardware element and during testing of a system under test (SUT) coupled to the test instrument, the test instrument is configured to determine information received from the SUT during testing of the SUT;wherein operation of the test instrument is automatically modified based on the information received from the SUT during testing of the SUT according to the adaptive behavior specified by the user input, wherein modification of the operation comprises one or more of: configuration of the test instrument; orconfiguration of the SUT. 12. The non-transitory, computer accessible memory medium of claim 11, wherein the first code and the second code are specified in one or more graphical program portions comprising a plurality of nodes connected by wires, wherein the plurality of nodes visually represent functionality of the one or more graphical program portions, wherein said receiving user input specifying customization comprises receiving user input modifying the one or more graphical program portions. 13. The non-transitory, computer accessible memory medium of claim 11, wherein the operation of the test instrument is automatically modified based on a characteristic of a signal received from the SUT. 14. The non-transitory, computer accessible memory medium of claim 11, wherein the operation of the test instrument is automatically modified based on content of a signal received from the SUT. 15. The non-transitory, computer accessible memory medium of claim 11, wherein modification of the operation further comprises one or more of: modification of processing of signals received from the SUT; ormodification of signals sent to the SUT. 16. A non-transitory, computer accessible memory medium storing program instructions for customizing a test instrument, wherein the program instructions are executable by a computer processor to: provide a first configuration for a test instrument, wherein the first configuration comprises first code for execution by a processor of the test instrument and second code for implementation on a programmable hardware element of the test instrument based on information from a system under test (SUT);receive user input customizing the first configuration for the test instrument, wherein the user input specifies modification to the second code, wherein the modification to the second code specifies adaptive behavior for the test instrument;generate and store a hardware description for the programmable hardware element based on the first configuration and the user input, wherein, after implementation of the hardware description on the programmable hardware element, the test instrument is configured to: receive information from the SUT coupled to the test instrument during testing of the SUT; andautomatically modify operation of the test instrument based on the information, wherein said automatically modifying comprises performing the adaptive behavior specified by the user input customizing the first configuration for the test instrument, including one or more of: configuring the test instrument; orconfiguring the SUT. 17. The non-transitory, computer accessible memory medium of claim 16, wherein the first configuration comprises a plurality of pairs of code modules, wherein each pair of code modules comprises a first code module having program instructions for execution by a processor of the test instrument and a second code module for implementation on a programmable hardware element of the test instrument, wherein, for each pair of code modules, the first code module and the second code module collectively implement a function in the test instrument, wherein the first code module of a pair of code modules is executable on the processor to perform a first portion of a function, and wherein the second code module of the pair of code modules is configured to be implemented on the programmable hardware element to perform a corresponding second portion of the function. 18. The non-transitory, computer accessible memory medium of claim 16, wherein the first configuration is specified in one or more graphical program portions comprising a plurality of nodes connected by wires, wherein the plurality of nodes visually represent functionality of the one or more graphical program portions, wherein said receiving user input specifying customization comprises receiving user input modifying the one or more graphical program portions. 19. The non-transitory, computer accessible memory medium of claim 16, wherein the information comprises a characteristic of a signal received from the SUT, wherein said automatically modifying is performed based on the characteristic. 20. The non-transitory, computer accessible memory medium of claim 16, wherein said receiving information from the SUT comprises: receiving a signal from the SUT; anddetermining the information by analyzing content of the signal received from the SUT;wherein said automatically modifying is based on the content of the signal. 21. A method for customizing a test instrument, comprising: utilizing a computer to perform: storing first code for execution by a processor of the test instrument;storing second code for implementation on a programmable hardware element of the test instrument, wherein the second code specifies adaptive behavior for the test instrument based on information received from a system under test; andgenerating a hardware description for the programmable hardware element based on the second code;implementing the hardware description on the programmable hardware element;operating the test instrument to test the SUT coupled to the test instrument, wherein said operating comprises the processor executing the first code and the programmable hardware element performing functionality specified by the hardware description;determining, by the test instrument, information received from the SUT during the test instrument operating to test the SUT; andautomatically modifying operation of the test instrument based on the information received from the DUT during the test instrument operating to test the SUT, including one or more of: configuring the test instrument; orconfiguring the SUT;wherein the test instrument continues operating to test the SUT after said automatically modifying operation. 22. A test instrument, comprising: a processor;a non-transitory computer readable memory medium coupled to the processor, wherein the memory medium stores program instructions that are executable by the processor to implement first functionality of the test instrument;a programmable hardware element coupled to the processor, wherein the programmable hardware element is configured to implement second functionality of the test instrument;one or more input and output ports for communicating with a system under test (SUT);wherein the processor and memory medium and the programmable hardware element are configured to: receive information from a SUT coupled to the test instrument; andautomatically modify operation of the test instrument based on the information, including one or more of: configuring the test instrument; orconfiguring the SUT.
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