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[미국특허] Environmental system including a transport region for an immersion lithography apparatus 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G03F-007/20
출원번호 US-0463066 (2014-08-19)
등록번호 US-9244363 (2016-01-26)
발명자 / 주소
  • Novak, W. Thomas
  • Hazelton, Andrew J.
  • Sogard, Michael
출원인 / 주소
  • NIKON CORPORATION
대리인 / 주소
    Oliff PLC
인용정보 피인용 횟수 : 2  인용 특허 : 68

초록

An immersion lithography apparatus includes (i) an optical assembly including an optical element, and configured to project a beam onto a substrate through an immersion liquid; (ii) a containment member that surrounds a path of the beam; and (iii) a stage on which the substrate is held, the substrat

대표청구항

1. An immersion lithography apparatus comprising: an optical assembly including an optical element, the optical assembly configured to project a beam onto a substrate through an immersion liquid;a containment member arranged to surround a path of the beam;a stage on which the substrate is held, the

이 특허에 인용된 특허 (68) 인용/피인용 타임라인 분석

  1. Higa, Kazutomo, Apparatus for manufacturing printed wiring board and method for manufacturing printed wiring board using the same.
  2. Lin, Burn Jeng, Apparatus for method for immersion lithography.
  3. Tabarelli Werner (Schlosstr. 5 Vaduz LIX FL-9490) Lbach Ernst W. (Tonagass 374 Eschen LIX FL-9492), Apparatus for the photolithographic manufacture of integrated circuit elements.
  4. John Martin de Larios ; Mike Ravkin ; Glen Travis ; Jim Keller ; Wilbur Krusell, Capillary proximity heads for single wafer cleaning and drying.
  5. Takahashi Tomowaki (Yokohama JPX), Catadioptric optical system and exposure apparatus having the same.
  6. Oomura Yasuhiro (Oota-ku JPX), Catadioptric system and exposure apparatus having the same.
  7. Takahashi Tetsuo,JPX ; Omura Yasuhiro,JPX, Catadioptric system for photolithography.
  8. Ogata Kunie,JPX, Developing method.
  9. Kenichi Mitsumori JP; Nobuaki Haga JP, Drying nozzle and drying device and cleaning device using the same.
  10. Novak, W. Thomas; Hazelton, Andrew J.; Watson, Douglas C., Environmental system including a transport region for an immersion lithography apparatus.
  11. Novak, W. Thomas; Hazelton, Andrew J.; Watson, Douglas C., Environmental system including a transport region for an immersion lithography apparatus.
  12. Novak, W. Thomas; Hazelton, Andrew J.; Watson, Douglas C., Environmental system including a transport region for an immersion lithography apparatus.
  13. Novak, W. Thomas; Hazelton, Andrew J.; Watson, Douglas C., Environmental system including a transport region for an immersion lithography apparatus.
  14. Novak,W. Thomas; Hazelton,Andrew J.; Watson,Douglas C., Environmental system including a transport region for an immersion lithography apparatus.
  15. Novak,W. Thomas; Hazelton,Andrew J.; Watson,Douglas C., Environmental system including a transport region for an immersion lithography apparatus.
  16. Hazelton, Andrew J.; Sogard, Michael, Environmental system including vacuum scavenge for an immersion lithography apparatus.
  17. Hazelton,Andrew J.; Sogard,Michael, Environmental system including vacuum scavenge for an immersion lithography apparatus.
  18. Hazelton,Andrew J; Sogard,Michael, Environmental system including vacuum scavenge for an immersion lithography apparatus.
  19. Sogard,Michael, Environmental system including vacuum scavenge for an immersion lithography apparatus.
  20. Kameyama,Masaomi, Exposure apparatus and device fabrication method.
  21. Hirukawa, Shigeru, Exposure apparatus and device manufacturing method.
  22. Hirukawa, Shigeru, Exposure apparatus and device manufacturing method.
  23. Hirukawa,Shigeru, Exposure apparatus and device manufacturing method.
  24. Hirukawa,Shigeru, Exposure apparatus and device manufacturing method.
  25. Hirukawa,Shigeru; Tanaka,Issey, Exposure apparatus and device manufacturing method.
  26. Takahashi, Masato; Ito, Nobukazu, Exposure apparatus and exposure method, and device and method for producing the same.
  27. Ebihara,Akimitsu, Exposure apparatus, and device manufacturing method.
  28. Ebihara,Akimitsu, Exposure apparatus, and device manufacturing method.
  29. Nagasaka, Hiroyuki, Exposure apparatus, exposure method, and method for producing device.
  30. Nagasaka, Hiroyuki; Owa, Soichi; Nishii, Yasugumi, Exposure apparatus, exposure method, and method for producing device.
  31. Nagasaka,Hiroyuki, Exposure apparatus, exposure method, and method for producing device.
  32. Nagasaka,Hiroyuki; Owa,Soichi; Nishii,Yasugumi, Exposure apparatus, exposure method, and method for producing device.
  33. Nagaksaka,Hiroyuki, Exposure method, exposure apparatus, and method for producing device.
  34. Nagasaka,Hiroyuki, Exposure method, exposure apparatus, and method for producing device.
  35. Igeta Shunichi (Nagaokakyo JPX) Nakamura Koji (Nagaokakyo JPX) Ishizuka Makoto (Osaka JPX) Sugawara Tsunehiko (Funabashi JPX) Kida Otojiro (Yokohama JPX), Flat cathode-ray tube.
  36. Suwa Kyoichi,JPX, Focusing and tilting adjustment system for lithography aligner, manufacturing apparatus or inspection apparatus.
  37. Giacomelli Thomas P. (Simi CA), Focusing device for photo-exposure system.
  38. Lee Martin E. (Saratoga CA), Guideless stage with isolated reaction stage.
  39. Bleeker, Arno Jan; De Jager, Pieter Willem Herman; Hintersteiner, Jason Douglas; Kruizinga, Borgert; McCarthy, Matthew Eugene; Oskotsky, Mark; Ryzhikov, Lev; Sakin, Lev; Smirnov, Stanislav; Snijders,, Imaging apparatus.
  40. Krautschik, Christof Gabriel, Immersion lithography.
  41. Vogel, Herman; Simon, Klaus; Derksen, Antonius Theodorus Anna Maria, Immersion photolithography system and method using microchannel nozzles.
  42. Takahashi Kazuo (Utsunomiya JPX), Immersion type projection exposure apparatus.
  43. Tokita,Toshinobu, Liquid immersion type exposure apparatus.
  44. Lof, Joeri; Derksen, Antonius Theodorus Anna Maria; Hoogendam, Christiaan Alexander; Kolesnychenko, Aleksey; Loopstra, Erik Roelof; Modderman, Theodorus Marinus; Mulkens, Johannes Catharinus Hubertus, Lithographic apparatus and device manufacturing method.
  45. Lof,Joeri; Mulkens,Johannes Catharinus Hubertus; Mertens,Jeroen Johannes Sophia Maria; Van Der Net,Antonius Johannes; Van Der Ham,Ronald; Lallemant,Nicolas; Beckers,Marcel, Lithographic apparatus and device manufacturing method.
  46. Streefkerk, Bob; Baselmans, Johannes Jacobus Matheus; Cox, Henrikus Herman Marie; Derksen, Antonius Theodorus Anna Maria; Donders, Sjoerd Nicolaas Lambertus; Hoogendam, Christiaan Alexander; Lof, Joeri; Loopstra, Erik Roelof; Mertens, Jeroen Johannes Sophia Maria; Van Der Meulen, Frits; Mulkens, Johannes Catharinus Hubertus; Van Nunen, Gerardus Petrus Matthijs; Simon, Klaus; Slaghekke, Bernardus Antonius; Straaijer, Alexander; Van Der Toorn, Jan-Gerard Cornelis; Houkes, Martijn, Lithographic apparatus and device manufacturing method.
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  48. Streefkerk,Bob; Bakker,Levinus Pieter; Baselmans,Johannes Jacobus Matheus; Cox,Henrikus Herman Marie; Derksen,Antonius Theodorus Anna Maria; Donders,Sjoerd Nicolaas Lambertus; Hoogendam,Christiaan Alexander; Lof,Joeri; Loopstra,Erik Roelof; Mertens,Jeroen Johannes Sophia Maria; Van Der Meulen,Frits; Mulkens,Johannes Catharinus Hubertus; Van Nunen,Gerardus Petrus Matthijs; Simon,Klaus; Slaghekke,Bernardus Antonius; Straaijer,Alexander; Van Der Toorn,Jan Gerard Cornelis; Houkes,Martijn, Lithographic apparatus and device manufacturing method.
  49. Lof,Joeri; Derksen,Antonius Theodorus Anna Maria; Hoogendam,Christiaan Alexander; Kolesnychenko,Aleksey; Loopstra,Erik Roelof; Modderman,Theodorus Marinus; Mulkens,Johannes Catharinus Hubertus; Ritsema,Roelof Aeilko Siebrand; Simon,Klaus; De Smit,Joannes Theodoor; Straaijer,Alexander; Streefkerk,Bob; Van Santen,Helmar, Lithographic projection apparatus.
  50. Lee Neville K. S.,CNX ; Berg John S. ; Ho Easen, Method and apparatus for coupling an optical lens to a disk through a coupling medium having a relatively high index of refraction.
  51. Carroll,Allen, Method and device for immersion lithography.
  52. Taniguchi Tetsuo,JPX, Method of adjusting a scanning exposure apparatus and scanning exposure apparatus using the method.
  53. Garcia,James P.; de Larios,John M.; Ravkin,Michael; Redeker,Fred C.; Woods,Carl, Methods and systems for processing a substrate using a dynamic liquid meniscus.
  54. Davison John E ; Weiner Kurt W, Microchamber.
  55. Binnard, Mike; Watson, Douglas C., Multiple chamber fluid mount.
  56. Yuichi Aki JP; Takao Kondo JP; Masanobu Yamamoto JP, Optical recording medium manufacturing master recording apparatus.
  57. Takanashi Akihiro (Kokubunji JPX) Harada Tatsuo (Fuchu JPX) Akeyama Masamoto (Kokubunji JPX) Kondo Yataro (Koganei JPX) Kurosaki Toshiei (Tokyo JPX) Kuniyoshi Shinji (Tokyo JPX) Hosaka Sumio (Hachioj, Pattern forming apparatus.
  58. Tabarelli Werner (Schlossstr. 5 Vaduz LIX FL-9490) Lbach Ernst W. (Tonagass 374 Eschen LIX FL-9492), Photolithographic method for the manufacture of integrated circuits.
  59. Loopstra Erik R.,NLX ; Bonnema Gerrit M.,NLX ; Van Der Schoot Harmen K.,NLX ; Veldhuis Gerjan P.,NLX ; Kwan Yim-Bun P.,NLX, Positioning device having two object holders.
  60. Novak W. Thomas (Hillsborough CA) Premji Zahirudeen (Boulder CO) Nayak Uday G. (San Jose CA) Ebihara Akimitsu (San Mateo CA), Precision motion stage with single guide beam and follower stage.
  61. Kenji Nishi JP; Kazuya Ota JP, Projection exposure apparatus and method.
  62. Fukuda Hiroshi,JPX ; von Bunau Rudolf Murai,JPX, Projection exposure apparatus and method which uses multiple diffraction gratings in order to produce a solid state devi.
  63. Suwa Kyoichi,JPX, Projection exposure apparatus and method with workpiece area detection.
  64. Akimitsu Ebihara JP, Scanning exposure methods.
  65. Shiwen Li JP, Stage device and exposure apparatus.
  66. Loopstra Erik R.,NLX ; Bonnema Gerrit M.,NLX ; Van Der Schoot Harmen K.,NLX ; Veldhuis Gerjan P.,NLX ; Ter Beek Paulus M. H.,NLX, Two-dimensionally balanced positioning device with two object holders, and lithographic device provided with such a pos.
  67. Harris Ronald B., Vacuum loadable divided phase separator for liquid/solid separation.
  68. Lee Martin E., Window frame-guided stage mechanism.

이 특허를 인용한 특허 (2) 인용/피인용 타임라인 분석

  1. Novak, W. Thomas; Hazelton, Andrew J.; Watson, Douglas C., Environmental system including a transport region for an immersion lithography apparatus.
  2. Novak, W. Thomas; Hazelton, Andrew J.; Watson, Douglas C., Environmental system including a transport region for an immersion lithography apparatus.

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