Wide bandwidth read and write memory system and method
원문보기
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
G06F-013/00
G11C-016/26
G11C-016/08
G11C-016/10
G11C-007/10
G11C-008/16
G11C-011/419
출원번호
US-0518883
(2010-12-28)
등록번호
US-9299448
(2016-03-29)
우선권정보
CN-2009 1 0247456 (2009-12-28)
국제출원번호
PCT/CN2010/080378
(2010-12-28)
§371/§102 date
20120623
(20120623)
국제공개번호
WO2011/079780
(2011-07-07)
발명자
/ 주소
Lin, Kenneth Chenghao
Zhang, Bingchun
출원인 / 주소
SHANGHAI XIN HAO MICRO ELECTRONICS CO. LTD.
대리인 / 주소
Anova Law Group, PLLC
인용정보
피인용 횟수 :
0인용 특허 :
5
초록▼
A memory device includes a first memory array, a first read port, a second read port, and a control input port. The first memory array contains a plurality of memory cells arranged in an array configuration. The first read port is configured to read first data from a single memory cell during a sing
A memory device includes a first memory array, a first read port, a second read port, and a control input port. The first memory array contains a plurality of memory cells arranged in an array configuration. The first read port is configured to read first data from a single memory cell during a single read cycle, and the second read port is configured to read second data from a group of memory cells controlled by a common word line. Further, the control input is configured to receive a mode signal indicating a functional mode for the memory device including a first read mode and a second read mode. When the mode signal indicates the first read mode, the first read port is used to read the first data. When the mode signal indicates the second read mode, the first read port is used to read out the first data and the second read port is used to read the second data.
대표청구항▼
1. A memory device, comprising: a first memory array containing a plurality of memory cells arranged in an array configuration;a first read port configured to read first data from a single memory cell selected from a row of memory cells during a single reading cycle;a second read port configured to
1. A memory device, comprising: a first memory array containing a plurality of memory cells arranged in an array configuration;a first read port configured to read first data from a single memory cell selected from a row of memory cells during a single reading cycle;a second read port configured to synchronously read second data from unselected memory cells in the row of memory cells controlled by a common word line and in parallel;a control input port to receive a mode signal indicating a functional mode for the memory device including a first read mode and a second read mode, wherein when the mode signal indicates the first read mode, the first read port is used to read out the first data; andwhen the mode signal indicates the second read mode, the first read port is used to read out the first data of the selected memory cell in the row of memory cells and the second read port is used to read out the second data of the unselected memory cells in the row of memory cells such that the entire row of memory cells are read out; anda read module coupled to the first read port and the second read port, the read module including: a first read module coupled to the row of memory cells for reading out the single memory cell during the first read cycle; anda second read module coupled to the row of memory cells for reading out the unselected memory cells in parallel. 2. The memory device according to claim 1, further including: a write port configured to write data into the row of memory cells controlled by the common word line in parallel during the single writing cycle. 3. The memory device according to claim 1, further including: when the mode signal indicates the second read mode, the first data are read out from the first read port during a first reading cycle, and the second data are read out from the second read port during a second reading cycle. 4. The memory device according to claim 1, further including: a second memory array configured to share the read module with the first memory array such that an area of the memory device containing the first memory array and the second memory array is reduced. 5. The memory device according to claim 1, wherein: the first read port operates at a higher speed than the second read port. 6. A memory device, comprising: a memory array containing a plurality of memory cells arranged in an array configuration;a first write port configured to write first data into a single memory cell during a single writing cycle; anda second write port configured to write second data into a group of memory cells controlled by a common word line during the single writing cycle,a control input port to receive a mode signal indicating a functional mode for the memory device including a first write mode and a second write mode,when the mode signal indicates the first write mode, the first write port is used to write the first data;when the mode signal indicates the second write mode, the second write port is used to write the second data;a first read port configured to read data from a selected single memory cell from a row of memory cells during a single reading cycle;a second read port configured to synchronously read data from unselected memory cells in the row of memory cells controlled by a common word line; anda read module coupled to the first read port and the second read port, the read module including: a first read module coupled to the row of memory cells for reading out the single memory cell during the first read cycle; anda second read module coupled to the row of memory cells for reading out the unselected memory cells in parallel. 7. A memory device, comprising: a single-port memory array configured to receive word lines and bit lines, the memory array comprising a first number of rows and a second number of columns of memory cells, each row being controlled by a word line, each column being connected by a bit line and a complementary bit line for a first functional mode, every third number of adjacent columns being grouped as a logical column corresponding to a bit of data and every third number of adjacent memory cells on one row being grouped as a memory cell unit for a second functional mode;an address decoder configured to receive an address bus and to generate a word line and a column select signal;a read/write control module configured to receive control signals to generate a write mode control, a write enable and a read enable;a write module configured to receive the write mode control, the write enable, a column address, a first write input under the first functional mode and a second write input under the second functional mode and to connect to drive the bit lines and complementary bit lines, the write module selecting one or more sets of the third number of bit lines and complementary bit lines in every logic column to be written; anda read module coupled to a first read port and a second read port and configured to receive the read enable, the column address, the bit lines and the complementary bit lines and to generate a first read output from a single memory cell selected from a row of memory cells during a single reading cycle and a second read output from unselected memory cells in the row of memory cells controlled by a common word line, the read module multiplexing the third number of bit lines and complementary bit lines in every logic column. 8. The memory device according to claim 7, wherein: the second functional mode is a wide bandwidth write mode, and the memory device further includes a wide bandwidth write module controlled by the write mode control to refresh the third number of bit lines in one logic column with the wide bandwidth write input, the word line and the logic column being controlled by the address decoder. 9. The memory device according to claim 7, wherein the read module further comprises: a high-speed read module to generate the first read output. 10. The memory device according to claim 9, wherein the wide bandwidth read module further comprises: a plurality of low-speed read modules to generate the second read output, and each column of memory cells has a corresponding low-speed read module. 11. The memory device according to claim 10, wherein: the second functional mode is a wide bandwidth read mode, and data in one memory cell in a selected memory cell unit is read out to the first read port by the high-speed read module, and data in all memory cells in the selected memory cell unit are subsequently read out in parallel by the low-speed read modules to the second read port. 12. The memory device according to claim 10, wherein: the first functional mode is a sequential read mode, and data in one memory cell in a selected memory cell unit are outputted through the first read port by the high-speed read module, and the data in the other memory cells in the selected memory cell unit are subsequently read by the low-speed read module and stored in the read register module for outputting to the second read port sequentially.
Toshiya Uchida JP; Yasurou Matsuzaki JP, Semiconductor memory device having improved data transfer rate without providing a register for holding write data.
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