최소 단어 이상 선택하여야 합니다.
최대 10 단어까지만 선택 가능합니다.
다음과 같은 기능을 한번의 로그인으로 사용 할 수 있습니다.
NTIS 바로가기다음과 같은 기능을 한번의 로그인으로 사용 할 수 있습니다.
DataON 바로가기다음과 같은 기능을 한번의 로그인으로 사용 할 수 있습니다.
Edison 바로가기다음과 같은 기능을 한번의 로그인으로 사용 할 수 있습니다.
Kafe 바로가기국가/구분 | United States(US) Patent 등록 |
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국제특허분류(IPC7판) |
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출원번호 | US-0207858 (2014-03-13) |
등록번호 | US-9448059 (2016-09-20) |
발명자 / 주소 |
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출원인 / 주소 |
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대리인 / 주소 |
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인용정보 | 피인용 횟수 : 2 인용 특허 : 286 |
An assembly that includes a projector and camera is used with a processor to determine three-dimensional (3D) coordinates of an object surface. The processor fits collected 3D coordinates to a mathematical representation provided for a shape of a surface feature. The processor fits the measured 3D c
An assembly that includes a projector and camera is used with a processor to determine three-dimensional (3D) coordinates of an object surface. The processor fits collected 3D coordinates to a mathematical representation provided for a shape of a surface feature. The processor fits the measured 3D coordinates to the shape and, if the goodness of fit is not acceptable, selects and performs at least one of: changing a pose of the assembly, changing an illumination level of the light source, changing a pattern of the transmitted With the changes in place, another scan is made to obtain 3D coordinates.
1. A method of determining three-dimensional coordinates of points on a surface of an object, the method comprising: providing an assembly that includes a first projector and a first camera, the first projector and the first camera being fixed in relation to one another, there being a baseline dista
1. A method of determining three-dimensional coordinates of points on a surface of an object, the method comprising: providing an assembly that includes a first projector and a first camera, the first projector and the first camera being fixed in relation to one another, there being a baseline distance between the first projector and the first camera, the first projector having a light source, the first camera having a lens and a photosensitive array;providing a processor electrically coupled to the first projector and the first camera;providing a mathematical representation of a shape of a feature on the surface;providing a value for an acceptable goodness of fit;sending a first transmitted light from the first projector onto the object;acquiring by the first camera a first reflected light and sending a first signal to the processor in response, the first reflected light being a portion of the first transmitted light reflected from the surface;determining by the processor a first measured set of three-dimensional (3D) coordinates of first points on the surface, the first measured set based at least in part on the first transmitted light, the first signal and the baseline distance;determining by the processor a first measured subset of points, the first measured subset of points being a subset of the first points on the surface, the first measured subset of points being measured points corresponding to the feature;fitting by the processor 3D coordinates of the first measured subset of points to the provided mathematical representation of the shape of the feature, the fitting including comparing the 3D coordinates of the first measured subset of points to 3D coordinates of a first derived subset of points to obtain a collection of residual errors, the first derived subset of points being a collection of points lying on the shape of the feature, each of the residual errors from the collection of residual errors being a measure of a separation of corresponding 3D coordinates from the first measured subset and the first derived subset, the fitting further consisting of mathematically adjusting position and orientation of the shape to minimize the collection of residual errors according to a minimization rule;determining by the processor a measured goodness of fit, the measured goodness of fit being a mathematically derived quantity obtained from the collection of residual errors;determining by the processor whether the 3D coordinates of the first measured subset of points are acceptable based at least in part on a comparison of the measured goodness of fit to the acceptable goodness of fit;determining by the processor whether the first measured set of 3D coordinates is acceptable based at least in part on whether the 3D coordinates of the first measured subset of points are acceptable;if the first measured set of 3D coordinates is acceptable, storing the first measured set of 3D coordinates;if the first measured set of 3D coordinates is not acceptable, taking steps (a)-(e):(a) selecting by the processor at least one action to be taken and taking the action, the at least one action selected from the group consisting of: changing a pose of the assembly, changing an illumination level of the light source, changing a pattern of the transmitted light, and measuring the feature by illuminating a mechanical probe and imaging spots of light on the probe with the first camera;(b) sending a second transmitted light from a first projector onto the object or illuminating spots of light on the mechanical probe held in contact with the object;(c) acquiring by the first camera a second reflected light and sending a second signal to the processor in response, the second reflected light being a portion of the second transmitted light reflected from the surface or the mechanical probe;(d) determining by the processor a second measured set of 3D coordinates of second points on the surface, the second measured set of 3D coordinates based at least in part on the second transmitted light, the second signal and the baseline distance; and(e) storing the second measured set of 3D coordinates. 2. The method of claim 1 wherein, in the step of providing a mathematical representation of a feature on the surface, the feature is selected from the group consisting of: a circle, a cylindrical hole, a raised cylinder, a sphere, an intersection of two planes, and an intersection of three planes. 3. The method of claim 1 wherein, in the step of determining by the processor a measured goodness of fit, the measured goodness of fit is based on a chi-square test statistic. 4. The method of claim 1 wherein, in the step of fitting by the processor 3D coordinates of the first measured subset of points, the minimization rule is to minimize the sum of the square of each residual error from among the collection of residual errors. 5. The method of claim 1 wherein, in the step of selecting by the processor at least one action, changing the pose of the assembly includes changing the relative positions of the assembly and the object. 6. The method of claim 1 wherein, in the step of selecting by the processor at least one action, changing the pose of the assembly includes changing the relative orientations of the assembly and the object. 7. The method of claim 1 further including a step of providing a movable structure, the movable structure configured for attachment to the apparatus or to the object. 8. The method of claim 1 wherein, in the step of selecting by the processor at least one action, the changing an illumination level of the light source includes increasing or decreasing the emitted light multiple times to obtain multiple images with the first camera. 9. The method of claim 8 wherein, in the step of selecting by the processor at least one action, the multiple images are combined to obtain a high dynamic range image. 10. The method of claim 1 wherein, in the step of selecting by the processor at least one action, the changing an illumination level of the light source includes changing the illumination levels non-uniformly over a projected region. 11. The method of claim 1 wherein, in the step of selecting by the processor at least one action, the changing a pattern of the transmitted light includes changing from a structured pattern of light projected over an area to a stripe of light projected in a line, the stripe of light being projected in a plane perpendicular to the baseline. 12. The method of claim 11 wherein, in the step of selecting by the processor at least one action, the orientation of the apparatus is changed to change the direction of the stripe of light on the object. 13. The method of claim 1 wherein, in the step of selecting by the processor at least one action, the changing a pattern of the transmitted light includes changing from a coded, single-shot pattern of structured light to an uncoded, sequential pattern of structured light, the single-shot pattern of structured light enabling the first measured set of 3D coordinates using a single pattern, the sequential pattern of light enabling determining by the processor of a second measured set of 3D coordinates. 14. The method of claim 1 wherein, in the changing a pattern of the transmitted light in step (a) and the sending a second transmitted light in step (b), the second transmitted light is a spot of light swept over the surface of the object. 15. The method of claim 1 wherein the measuring the feature by illuminating a mechanical probe in step (a) further includes transmitting an indicator light with the first projector, the indicator light illuminating a region of the object to be brought into contact with the probe tip. 16. The method of claim 1 wherein, in the step of selecting by the processor at least one action, three actions are selected including changing a pose of the assembly, changing an illumination level of the light source, and changing a pattern of the transmitted light. 17. A method of determining three-dimensional coordinates of points on a surface of an object, the method comprising: providing an assembly that includes a first projector, a first camera, and a second camera, the first projector, the first camera, and the second camera being fixed in relation to one another, there being a first baseline distance between the first projector and the first camera, there being a second baseline distance between the first projector and the second camera, the first projector having a light source, the first camera having a first lens and a first photosensitive array, the second camera having a second lens and a second photosensitive array;providing a processor electrically coupled to the first projector, the first camera, and the second camera;providing a mathematical representation of a shape of a feature on the surface;providing a value for an acceptable goodness of fit;sending a first transmitted light from the first projector onto the object;acquiring by the first camera a first reflected light and sending a first signal to the processor in response, the first reflected light being a portion of the first transmitted light reflected from the surface;determining by the processor a first measured set of three-dimensional (3D) coordinates of first points on the surface, the first measured set based at least in part on the first transmitted light, the first signal and the first baseline distance;determining by the processor a first measured subset of points, the first measured subset of points being a subset of the first points on the surface, the first measured subset of points being measured points corresponding to the feature;fitting by the processor 3D coordinates of the first measured subset of points to the provided mathematical representation of the shape of the feature, the fitting including comparing the 3D coordinates of the first measured subset of points to 3D coordinates of a first derived subset of points to obtain a collection of residual errors, the first derived subset of points being a collection of points lying on the shape of the feature, each of the residual errors from the collection of residual errors being a measure of a separation of corresponding 3D coordinates from the first measured subset and the first derived subset, the fitting further consisting of mathematically adjusting position and orientation of the shape to minimize the collection of residual errors according to a minimization rule;determining by the processor a measured goodness of fit, the measured goodness of fit being a mathematically derived quantity obtained from the collection of residual errors;determining by the processor whether the 3D coordinates of the first measured subset of points are acceptable based at least in part on a comparison of the measured goodness of fit to the acceptable goodness of fit;determining by the processor whether the first measured set of 3D coordinates is acceptable based at least in part on whether the 3D coordinates of the first measured subset of points are acceptable;if the first measured set of 3D coordinates is acceptable, storing the first measured set of 3D coordinates;if the first measured set of 3D coordinates is not acceptable, taking steps (a)-(e):(a) selecting by the processor at least one action to be taken and taking the action, the at least one action selected from the group consisting of: changing an illuminated field-of-view of the assembly, changing a pose of the assembly, changing an illumination level of the light source, changing a pattern of the transmitted light, and measuring the feature by illuminating a mechanical probe and imaging spots of light on the probe with the first camera;(b) sending a second transmitted light from the first projector onto the object or illuminating spots of light on the mechanical probe held in contact with the object;(c) acquiring by an imager a second reflected light and sending a second signal to the processor in response, the second reflected light being a portion of the second transmitted light reflected from the surface or the mechanical probe, the imager being the first camera if the at least one action does not include changing an illuminated field-of-view of the assembly, the imager being the second camera if the at least one action includes changing an illuminated field-of-view of the assembly;(d) determining by the processor a second measured set of 3D coordinates of second points on the surface, the second measured set of 3D coordinates based at least in part on the second transmitted light and the second signal; and(e) storing the second measured set of 3D coordinates. 18. A method of determining three-dimensional coordinates of points on a surface of an object, the method comprising: providing an assembly that includes a first projector, a first camera, a second projector, and a second camera, the first projector, the first camera, the second projector, and the second camera being fixed in relation to one another, there being a first baseline distance between the first projector and the first camera, there being a second baseline distance between the second projector and the second camera, the first projector having a first light source, the first camera having a first lens and a first photosensitive array, the second projector having a second light source, the second camera having a second lens and a second photosensitive array;providing a processor electrically coupled to the first projector, the first camera, the second projector, and the second camera;providing a mathematical representation of a shape of a feature on the surface;providing a value for an acceptable goodness of fit;sending a first transmitted light from the first projector onto the object;acquiring by the first camera a first reflected light and sending a first signal to the processor in response, the first reflected light being a portion of the first transmitted light reflected from the surface;determining by the processor a first measured set of three-dimensional (3D) coordinates of first points on the surface, the first measured set based at least in part on the first transmitted light, the first signal and the first baseline distance;determining by the processor a first measured subset of points, the first measured subset of points being a subset of the first points on the surface, the first measured subset of points being measured points corresponding to the feature;fitting by the processor 3D coordinates of the first measured subset of points to the provided mathematical representation of the shape of the feature, the fitting including comparing the 3D coordinates of the first measured subset of points to 3D coordinates of a first derived subset of points to obtain a collection of residual errors, the first derived subset of points being a collection of points lying on the shape of the feature, the residual errors being a measure of the separation of corresponding 3D coordinates of the first measured subset and the first derived subset, the fitting further consisting of mathematically adjusting a pose of the shape to minimize the residual errors according to a minimization rule;determining by the processor a measured goodness of fit, the measured goodness of fit being a mathematically derived quantity obtained from the collection of residual errors;determining by the processor whether the first set is acceptable based on a comparison of the measured goodness of fit to the acceptable goodness of fit;if the first set for the measured feature is acceptable, storing the first set of 3D coordinates;if the first set for the measured feature is not acceptable, taking steps (a)-(e):(a) selecting by the processor at least one action to be taken and taking the action, the at least one action selected from the group consisting of: changing an illuminated field-of-view of the assembly, changing a pose of the assembly, changing an illumination level of the light source, changing a pattern of the transmitted light, and measuring the feature by illuminating a mechanical probe and imaging spots of light on the probe with the first camera;(b) sending a second transmitted light from a light transmitter onto the object or illuminating spots of light on the mechanical probe held in contact with the object, the light transmitter being the first projector if the at least one action does not include changing an illuminated field-of-view of the assembly, the light transmitter being the second projector if the at least one action includes changing an illuminated field-of-view of the assembly;(c) acquiring by an imager a second reflected light and sending a second signal to the processor in response, the second reflected light being a portion of the second transmitted light reflected from the surface or the mechanical probe, the imager being the first camera if the at least one action does not include changing an illuminated field-of-view of the assembly, the imager being the second camera if the at least one action includes changing an illuminated field-of-view of the assembly;(d) determining by the processor a second measured set of 3D coordinates of second points on the surface, the second measured set of 3D coordinates based at least in part on the second transmitted light and the second signal; and(e) storing the second measured set of 3D coordinates.
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