Controlling a test instrument may include: determining a first value corresponding to power output by the test instrument; determining a second value based on the first value, where the second value corresponds to an amount of energy consumed by the test instrument; and placing at least part of the
Controlling a test instrument may include: determining a first value corresponding to power output by the test instrument; determining a second value based on the first value, where the second value corresponds to an amount of energy consumed by the test instrument; and placing at least part of the test instrument in a high-impedance state when the second value exceeds a threshold.
대표청구항▼
1. A method of controlling a test instrument; comprising: determining a first value corresponding to power output by the test instrument;determining a second value based on the first value, the second value corresponding to an amount of energy consumed by the test instrument; andplacing at least par
1. A method of controlling a test instrument; comprising: determining a first value corresponding to power output by the test instrument;determining a second value based on the first value, the second value corresponding to an amount of energy consumed by the test instrument; andplacing at least part of the test instrument in a high-impedance state when the second value exceeds a threshold;wherein the test instrument comprises multiple channels; andwherein the following are performed for a channel in the test instrument: determining the first value, determining the second value, and placing the test instrument in the high-impedance state. 2. The method of claim 1, wherein determining the first value comprises obtaining a product of an input voltage value and a voltage corresponding to an input current value and, based on the product, producing an output voltage corresponding to the first value. 3. The method of claim 2, wherein determining the second value comprises: generating an output current based on the output voltage; andintegrating the output current over time to produce the second value. 4. The method of claim 3, further comprising: comparing the second value to the threshold; andoutputting a comparison value based on the comparison;wherein the test instrument is placed in the high-impedance state by a latch in response to receipt of the comparison value, the latch outputting a control signal to place the test instrument in the high-impedance state. 5. The method of claim 4, wherein the threshold is a first threshold; and wherein the method further comprises:following placement of the test instrument into the high-impedance state, lowering the power output by the test instrument so that the output current is less than a fixed current;performing a reverse integration over time based on the fixed current to produce a third value;comparing the third value to a second threshold; andplacing at least part of the test instrument in an operational state when, based on the comparing, the third value exceeds the second threshold. 6. The method of claim 5, wherein comparing the third value to the second threshold results in a second comparison value; and wherein the test instrument is returned to the normal operational state by a resetting of the latch in response to receipt of the second comparison value, the latch outputting a control signal to place the test instrument in the operational state. 7. The method of claim 2, wherein the input voltage is based on a voltage across terminals of a power field-effect transistor; and wherein the input current is based on voltage across terminals of a current sense resistor. 8. The method of claim 2, wherein a multiplier circuit is used to determine the first value corresponding to an output voltage; wherein the output voltage is output to a resistor to produce a current that exceeds a fixed current; andwherein the second value is obtained by integrating the current over time. 9. The method of claim 1, further comprising: causing the test instrument to exit the high-impedance state following a decrease in the power output by the test instrument. 10. The method of claim 1, further comprising: following placing at least part of the test instrument in a high-impedance state, controlling the test instrument manually or programmatically to place the test instrument into an operational state. 11. Circuitry to control a test instrument, comprising: a multiplier circuit to receive an input voltage and a voltage corresponding to an input current and to provide an output voltage representing power output of the test instrument;an integrator circuit to output an integrated voltage based on a current corresponding to the output voltage, the integrated voltage representing energy consumed by the test instrument;a comparator circuit to perform a comparison of the integrated voltage to a threshold, and to output a result signal based on the comparison; anda latch to output a control signal to the test instrument based on the result signal, the control signal to place at least one of multiple channels of the test instrument in a high-impedance state. 12. The circuitry of claim 11, further comprising: a resistor to receive the output voltage, the current corresponding to the output voltage passing through the first resistor as a result of the output voltage received by the resistor. 13. The circuitry of claim 12, wherein the resistor is a first resistor, the current corresponding to the output voltage is a first current, the integrated voltage is a first integrated voltage, the threshold is a first threshold, and the control signal is a first control signal; and wherein the circuitry comprises: a second resistor connected to a voltage source, a second current passing through the second resistor;wherein, in a case that the second current is greater than the first current, the integrator circuit is configured to output a second integrated voltage based on the second current;wherein the comparator circuit is configured to perform a comparison of the second integrated voltage to a second threshold, and to output a second result signal based on the comparison; andwherein the latch is configured to output a second control signal to the test instrument based on the second result signal. 14. The circuitry of claim 13, wherein the first control signal is to put the at least one of multiple channels of the test instrument into the high-impedance state, and the second control signal is to put the at least part of the test instrument into operational mode. 15. The circuitry of claim 11, further comprising: a power field-effect transistor across which a voltage corresponding to the input voltage is measured; anda resistor through which a current corresponding to the input current is measured. 16. The circuitry of claim 11, further comprising: a power stage to output power from the instrument to a device under test, the power stage being configured to receive, and to respond to, the control signal. 17. The circuitry of claim 11, wherein the integrator circuit comprises an operational amplifier. 18. Circuitry to control a test instrument, comprising: an integrator circuit to output an integrated voltage based on a current corresponding primarily to an output power of the test instrument when the output power of the test instrument is above a threshold, the integrated voltage representing energy consumed by the test instrument;a comparator circuit to perform a comparison of the integrated voltage to a threshold, and to output a result signal based on the comparison; anda latch to output a control signal to the test instrument based on the result signal, the control signal to place at least one of multiple channels of the test instrument in a high-impedance state.
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