[특허]Method and apparatus for verifying two dimensional mark quality

[미국특허] Method and apparatus for verifying two dimensional mark quality 원문보기

IPC분류정보
국가/구분	United States(US) Patent 등록
국제특허분류(IPC7판)	G06F-019/00 G06K-005/00
출원번호	US-0270370 (2011-10-11)
등록번호	US-9465962 (2016-10-11)
발명자 / 주소	Nadabar, Sateesha Gopalakrishnan, Venkat K. Gerst, III, Carl W.
출원인 / 주소	COGNEX CORPORATION
인용정보	피인용 횟수 : 0 인용 특허 : 159

초록 ▼

A method and system for applying a two dimensional mark on a first surface of a component and assessing mark quality, the method comprising the steps of positioning a component with a first surface at a first station, applying a two dimensional mark to the first surface at the first station wherein the applied mark is intended to codify a first information subset, obtaining an image of the applied two dimensional mark at the first station using a stationary camera that has a field of view that is centered along a trajectory that forms an obtuse angle with at least a portion of the first surface and that includes at least a portion of the first surface, performing a mark quality assessment on the obtained image and performing a secondary function as a result of the mark quality assessment.

대표청구항 ▼

1. A system for applying a two dimensional mark on a first surface of a first component and assessing a quality of the two dimensional mark, the system comprising: a two dimensional mark applier positioned proximate a first space for applying the two dimensional mark to the first surface of the first component when the first surface is located in the first space, the applied two dimensional mark containing a coded information subset;a stationary camera having a field of view and positioned adjacent the first space so that the first space is in the field of view, the stationary camera for obtaining an image of the two dimensional mark after the two dimensional mark is applied to the first surface; anda processor linked to the stationary camera for receiving the obtained image and performing a mark quality assessment on the obtained image by gleaning mark quality characteristics and generating a numerical applied mark quality value as a function of the gleaned mark quality characteristics and comparing the numerical applied mark quality value to a baseline assessment value, the processor performing a secondary function as a result of the mark quality assessment, the secondary function including, when the numerical applied mark quality value is below the baseline assessment value, indicating a low mark quality level. 2. The system of claim 1 wherein the processor performs the mark quality assessment by attempting to decode the coded information subset in the image of the two dimensional mark and, when decoding is successful, gleaning other mark quality characteristics from the image of the two dimensional mark. 3. The system of claim 1, wherein the stationary camera is positioned adjacent the first space and along a trajectory such that at least a portion of the field of view forms an obtuse angle with the first surface. 4. The system of claim 2 wherein the processor gleans other mark quality characteristics by obtaining information indicating the degree of at least one irregularity in the obtained image, the processor performing the mark quality assessment by further, where the degree of the at least one irregularity in the image exceeds a tolerable level, at least in part compensating for the irregularity thereby generating a compensated mark, gleaning mark quality characteristics from the compensated mark and generating an applied mark quality value as a function of the gleaned characteristics from the compensated mark. 5. The system of claim 4 wherein the processor performs the mark quality assessment by further comparing the applied mark quality value to a baseline assessment value and, when the applied mark quality value is below the baseline value, indicating a low mark quality level. 6. The system of claim 4 wherein the first surface may be warped, the at least one irregularity including at least a subset of non-uniform lighting, first surface warping, lens/optical distortion, perspective distortion, and perceived background texture. 7. The system of claim 4 wherein the at least one irregularity is geometric distortion, the processor compensating by using the decoded information to generate a synthetic ideal mark model, using the ideal mark model and the mark in the obtained image to generate a difference map and using the difference map to compensate the mark obtained in the image for at least a subset of non-optimal lighting, first surface warping, lens/optical distortion, perspective distortion, and perceived background texture.

이 특허에 인용된 특허 (159) 인용/피인용 타임라인 분석

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He Duanfeng ; Hunter Kevin ; Joseph Eugene, Techniques for reading two dimensional code, including maxicode.
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He Duanfeng ; Hunter Kevin ; Joseph Eugene, Techniques for reading two dimensional code, including maxicode.
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Iddan, Gavriel J.; Yahav, Giora, Three dimension imaging by dual wavelength triangulation.
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Tomioka Makoto (2-3-23 Soya Ichikawa JPX) Matsuda Masayuki (1-2-13 Hiyoshi-cho Kokubuji JPX), Two dimensional code for processing data.
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Longacre ; Jr. Andrew (Skaneateles NY) Hussey Rob (Liverpool NY), Two dimensional data encoding structure and symbology for use with optical readers.
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Sullivan,Paul; Kren,George; Rosengaus,Eliezer; Huet,Patrick; Piramuthu,Robinson; Plihal,Martin; Xiong,Yan, Wafer inspection systems and methods for analyzing inspection data.
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IPC	Description
A	생활필수품
A62	인명구조; 소방(사다리 E06C)
A62B	인명구조용의 기구, 장치 또는 방법(특히 의료용에 사용되는 밸브 A61M 39/00; 특히 물에서 쓰이는 인명구조 장치 또는 방법 B63C 9/00; 잠수장비 B63C 11/00; 특히 항공기에 쓰는 것, 예. 낙하산, 투출좌석 B64D; 특히 광산에서 쓰이는 구조장치 E21F 11/00)
A62B-1/08	.. 윈치 또는 풀리에 제동기구가 있는 것

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구성항목	기본정보 상세정보 관리번호, 국가코드, 자료구분, 상태, 출원번호, 출원일자, 공개번호, 공개일자, 등록번호, 등록일자, 발명명칭(한글), 발명명칭(영문), 출원인(한글), 출원인(영문), 출원인코드, 대표IPC 관리번호, 국가코드, 자료구분, 상태, 출원번호, 출원일자, 공개번호, 공개일자, 공고번호, 공고일자, 등록번호, 등록일자, 발명명칭(한글), 발명명칭(영문), 출원인(한글), 출원인(영문), 출원인코드, 대표출원인, 출원인국적, 출원인주소, 발명자, 발명자E, 발명자코드, 발명자주소, 발명자 우편번호, 발명자국적, 대표IPC, IPC코드, 요약, 미국특허분류, 대리인주소, 대리인코드, 대리인(한글), 대리인(영문), 국제공개일자, 국제공개번호, 국제출원일자, 국제출원번호, 우선권, 우선권주장일, 우선권국가, 우선권출원번호, 원출원일자, 원출원번호, 지정국, Citing Patents, Cited Patents
저장형식	Text(ASCII format) Excel format PIAS분석(.xls)
메일정보	받는사람 (필수) @ 보내는사람 (선택) @ 제목 내용 KISTI 검색결과 이메일 서비스
안내	총 건의 자료가 검색되었습니다. 다운받으실 자료의 인덱스를 입력하세요. (1-10,000) 검색결과의 순서대로 최대 10,000건 까지 다운로드가 가능합니다. 데이타가 많을 경우 속도가 느려질 수 있습니다.(최대 2~3분 소요) 다운로드 파일은 UTF-8 형태로 저장됩니다. 파일의 내용이 제대로 보이지 않을실 때는 웹브라우저 상단의 보기 -> 인코딩 -> 자동선택 여부를 확인하십시오. ~ Text(ASCII format) Excel format

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[미국특허] Method and apparatus for verifying two dimensional mark quality 원문보기

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