초록 ▼

A thin film photovoltaic device (100) with a tunable, minimally conductive buffer (128) layer is provided. The photovoltaic device (100) may include a back contact (150), a transparent front contact stack (120), and an absorber (140) positioned between the front contact stack (120) and the back cont

A thin film photovoltaic device (100) with a tunable, minimally conductive buffer (128) layer is provided. The photovoltaic device (100) may include a back contact (150), a transparent front contact stack (120), and an absorber (140) positioned between the front contact stack (120) and the back contact (150). The front contact stack (120) may include a low resistivity transparent conductive oxide (TCO) layer (124) and a buffer layer (128) that is proximate to the absorber layer (140). The photovoltaic device (100) may also include a window layer (130) between the buffer layer (128) and the absorber (140). In some cases, the buffer layer (128) is minimally conductive, with its resistivity being tunable, and the buffer layer (128) may be formed as an alloy from a host oxide and a high-permittivity oxide. The high-permittivity oxide may further be chosen to have a bandgap greater than the host oxide.

대표청구항 ▼

1. A method comprising: determining, based on a desired electrical characteristic of an alloyed thin film buffer layer, an amount of an additive oxide precursor;injecting a host oxide precursor and the amount of the additive oxide precursor into a deposition chamber that contains a substrate coated

1. A method comprising: determining, based on a desired electrical characteristic of an alloyed thin film buffer layer, an amount of an additive oxide precursor;injecting a host oxide precursor and the amount of the additive oxide precursor into a deposition chamber that contains a substrate coated with a transparent conductive oxide (TCO) layer; andforming the alloyed thin film buffer layer on the TCO layer by reacting the host oxide precursor to form a host oxide and reacting the additive oxide precursor to form an additive oxide,wherein the additive oxide has a bandgap higher than approximately 3.5 eV, andwherein a molar ratio of additive oxide to host oxide in the alloyed thin film buffer layer is between about 0.2 and about 0.7. 2. The method of claim 1, wherein the forming comprises performing at least one of chemical vapor deposition (CVD), atmospheric pressure CVD, high pressure CVD, spray pyrolysis, sputtering, reactive sputtering, epitaxy, chemical solution deposition, plating, spraying, liquid processing steps, evaporation, or operation of a thermal evaporator. 3. The method of claim 2, wherein the forming comprises performing atmospheric pressure CVD. 4. The method of claim 1, wherein the substrate comprises at least one of a glass or a polymer, and wherein the TCO comprises at least one of tin oxide, fluorine doped tin oxide, zinc oxide, or indium tin oxide. 5. The method of claim 1, wherein at least one of the host oxide precursor or the additive oxide precursor comprises at least one of a chlorinated species or a fluorinated species, and wherein the alloyed thin film buffer layer comprises at least one of chlorine or fluorine. 6. The method of claim 5, wherein the host oxide precursor comprises at least one of dimethyltin chloride (DMTC), monobutyltin trichloride (MBTC), C8H18Cl2Sn (DBTC), [CH3(CH2)3]3 SnCl (TBTC), tetramethyltin, N,N′-Di-t-butyl-2,3-diamidobutanetin(II), Tetrakis(diethylamino)tin(IV), Tin(IV) t-butoxide, Tin(II) acetylacetonate, or Tin(II) hexaflouroacetylacetonate. 7. The method of claim 5, wherein the additive oxide precursor comprises at least one of Tetrakis(diethylamino)zirconium, Zirconium(IV) t-butoxide, Zirconium(IV) ethoxide, Tetrakis(2,2,6,6-tetramethyl-3,5-heptanedionato)zirconium, Zirconium(IV) hexafluoroacetylacetonate, Zirconium(IV) trifluoroacetylacetonate, Bis(cyclopentadienyl)dimethylzirconium, or Dimethylbis(t-butylcyclopentadienyl)zirconium. 8. The method of claim 1, wherein the host oxide comprises at least one of SnO2, ZnO, or In2O3. 9. The method of claim 1, wherein the additive oxide comprises at least one of an oxide of Zr, an oxide of Ta, an oxide of Ti, an oxide of Mo, an oxide of Hf, an oxide of V, an oxide of Y, or an oxide of Sc. 10. The method of claim 1, further comprising injecting an oxidizer into the deposition chamber, the oxidizer comprising at least one of oxygen or water. 11. The method of claim 1, further comprising injecting a fluorine precursor into the deposition chamber, the fluorine precursor comprising at least one of HF, trifluoroacetic acid, F2, SF6, C2F6, or CF4. 12. The method of claim 1, wherein the alloyed thin film buffer layer comprises at least one of Sn—Zr—O, Zn—Hf—O, Zn—Zr—O, Zn—Ta—O, Zn—V—O, Zn—Y—O, Zn—Sc—O, Sn—Ta—O, Sn—Hf—O, In—Zr—O, In—Ta—O, In—Hf—O, or In—Mo—O. 13. The method of claim 12, wherein the alloyed thin film buffer layer comprises Sn—Zr—O having a molar ratio of Zr to Sn between 0.2 and 0.5. 14. The method of claim 1, wherein the alloyed thin film buffer layer comprises at least one of chlorine or fluorine at a concentration between about 0.5 mol % and about 2 mol %. 15. The method of claim 1, further comprising depositing a window layer on the alloyed thin film buffer layer. 16. The method of claim 15, wherein the window layer comprises n-doped cadmium sulfide. 17. The method of claim 15, further comprising depositing an absorber layer on the window layer. 18. The method of claim 17, wherein the absorber layer comprises at least one of cadmium telluride (CdTe), copper indium gallium selenide (CIGS), or copper-zinc-tin-sulfide (CSTS). 19. The method of claim 18, wherein the absorber layer comprises p-doped CdTe. 20. The method of claim 17, further comprising applying a back contact to the absorber layer. 21. The method of claim 20, wherein the back contact comprises at least one of a carbon layer, a gold film, a gold foil, Cu—Au, or Ni—Al. 22. A method comprising: injecting, into an atmospheric chemical vapor deposition (CVD) deposition chamber that contains a glass substrate coated with a transparent conductive oxide (TCO) layer comprising at least one of SnO2 or SnO2:F, a host oxide precursor comprising at least one of dimethyltin chloride (DMTC), monobutyltin trichloride (MBTC), C8H18Cl2Sn (DBTC), [CH3(CH2)3]3SnCl (TBTC), tetramethyltin, N,N′-Di-t-butyl-2,3-diamidobutanetin(II), Tetrakis(dimethylamino)tin(IV), Tin(IV) t-butoxide, Tin(II) acetylacetonate, or Tin(II) hexaflouroacetylacetonate;injecting, into the atmospheric CVD deposition chamber, an additive oxide precursor comprising at least one of Tetrakis(diethylamino)zirconium, Zirconium(IV) t-butoxide, Zirconium(IV) ethoxide, Tetrakis(2,2,6,6-tetramethyl-3,5-heptanedionato)zirconium, Zirconium(IV) hexafluoroacetylacetonate, Zirconium(IV) trifluoroacetylacetonate, Bis(cyclopentadienyl)dimethylzirconium, or Dimethylbis(t-butylcyclopentadienyl)zirconium;injecting, into the atmospheric CVD deposition chamber, an oxidizer comprising at least one of oxygen or water; andforming an alloyed thin film buffer layer on the TCO layer by reacting the host oxide precursor to form SnO2 and reacting the additive oxide precursor to form ZrO,wherein the alloyed thin film buffer layer comprises Sn—Zr—O,wherein a molar ratio of additive oxide to host oxide in the alloyed thin film buffer layer is between about 0.2 and about 0.7, andwherein the alloyed thin film buffer layer has a concentration of at least one of chlorine or fluorine between about 0.5 mol % and about 2.0 mol %.