A package includes a device die, a first plurality of redistribution lines underlying the device die, a second plurality of redistribution lines overlying the device die, and a metal pad in a same metal layer as the second plurality of redistribution lines. A laser mark is in a dielectric layer that
A package includes a device die, a first plurality of redistribution lines underlying the device die, a second plurality of redistribution lines overlying the device die, and a metal pad in a same metal layer as the second plurality of redistribution lines. A laser mark is in a dielectric layer that is overlying the metal pad. The laser mark overlaps the metal pad.
대표청구항▼
1. A method comprising: forming a first package comprises: at least one first dielectric layer;a first plurality of redistribution lines in the at least one first dielectric layer;a device die over and electrically coupled to the first plurality of redistribution lines;a molding material molding the
1. A method comprising: forming a first package comprises: at least one first dielectric layer;a first plurality of redistribution lines in the at least one first dielectric layer;a device die over and electrically coupled to the first plurality of redistribution lines;a molding material molding the device die therein;a through-via penetrating through the molding material;at least one second dielectric layer over the device die;a second plurality of redistribution lines in the at least one second dielectric layer; anda metal pad in the at least one second dielectric layer; andperforming a laser marking to form a laser mark in a third dielectric layer over the metal pad, wherein a portion of the metal pad is exposed to the laser mark. 2. The method of claim 1 further comprising: forming openings in the third dielectric layer to expose a plurality of metal pads;disposing solder regions in the openings; andperforming a reflow on the solder regions to connect the solder regions with the plurality of metal pads. 3. The method of claim 1 further comprising: bonding a second package to the first package; andfilling an underfill into a gap between the first package and the second package, wherein the underfill is disposed into the laser mark. 4. The method of claim 3, wherein the underfill is in physical contact with the metal pad. 5. The method of claim 1, wherein the metal pad stops a laser beam used in the laser marking. 6. The method of claim 1 further comprising, when the metal pad is formed, simultaneously forming a seal ring encircling the metal pad. 7. The method of claim 1 further comprising forming a redistribution line in the at least one second dielectric layer, with the redistribution line electrically connecting the metal pad to the through-via. 8. The method of claim 1 further comprising electrically grounding the metal pad. 9. The method of claim 1, wherein the metal pad is electrically floating. 10. A method comprising: forming a first package comprising: forming a Redistribution Line (RDL) and a metal pad simultaneously, wherein the RDL and the metal pad are over a device die and an encapsulating material, and the device die is encapsulated by the encapsulating material; andperforming a laser drilling on a dielectric layer covering the RDL and the metal pad to form an opening and a laser mark, respectively, wherein the laser mark comprises information for identifying the first package;bonding a second package to the first package through a solder region disposed in the opening in the dielectric layer; andfilling the laser mark with an underfill. 11. The method of claim 10 further comprising, during the laser marking, conducting heat generated by the laser drilling to a through-via in the encapsulating material through an additional RDL electrically coupling the metal pad to the through-via. 12. The method of claim 10 further comprising, during the laser marking, conducting heat generated by the laser drilling to a metal seal ring encircling the metal pad. 13. The method of claim 12, wherein the metal pad and the metal seal ring are in a same metal layer. 14. The method of claim 10, wherein the laser mark comprises a letter, a digit, or combinations thereof. 15. The method of claim 10, wherein the metal pad is exposed through the laser mark. 16. A method comprising: forming a first package comprising: encapsulating a device die and a through-via in an encapsulating material;forming a plurality of dielectric layers over the device die, the through-via, and the encapsulating material;forming a Redistribution Line (RDL) and a metal pad in the plurality of dielectric layers; andperforming a laser drilling on a top dielectric layer in the plurality of dielectric layers to form an opening and a laser mark, with the RDL and the metal pad being exposed through the opening and the laser mark, respectively, wherein the top dielectric layer covers the RDL and the metal pad;filling a solder region into the opening to contact the RDL; andfilling a dielectric material into the laser mark to contact the metal pad. 17. The method of claim 16 further comprising: bonding a second package to the first package through the solder region; anddisposing an underfill into a gap between the first package and the second package, wherein the dielectric material filling the laser mark is a part of the underfill. 18. The method of claim 16, wherein the metal pad is fully enclosed in dielectric materials. 19. The method of claim 16 further comprising, during the laser marking, conducting heat generated by the laser drilling to the through-via through a heat path, with an entirety of the heat path being formed of metal. 20. The method of claim 16 further comprising, during the laser marking, conducting heat generated by the laser mark to a metal seal ring encircling the metal pad, wherein the metal seal ring is separated from the metal pad by a dielectric material, and no additional metal feature is between the metal pad and the metal seal ring.
연구과제 타임라인
LOADING...
LOADING...
LOADING...
LOADING...
LOADING...
이 특허에 인용된 특허 (4)
Goller, Bernd, Electronic component embedded within a plastic compound and including copper columns within the plastic compound extending between upper and lower rewiring layers, and system carrier and panel for producing an electronic component.
Farooq, Mukta G.; Skordas, Spyridon; Volant, Richard P.; Winstel, Kevin R., Three dimensional integrated circuit integration using alignment via/dielectric bonding first and through via formation last.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.