Disclosed herein are representative embodiments of methods, apparatus, and systems for determining the temperature of an object using an optical pyrometer. Certain embodiments of the disclosed technology allow for making optical temperature measurements that are independent of the surface emissivity
Disclosed herein are representative embodiments of methods, apparatus, and systems for determining the temperature of an object using an optical pyrometer. Certain embodiments of the disclosed technology allow for making optical temperature measurements that are independent of the surface emissivity of the object being sensed. In one of the exemplary embodiments disclosed herein, a plurality of spectral radiance measurements at a plurality of wavelengths is received from a surface of an object being measured. The plurality of the spectral radiance measurements is fit to a scaled version of a black body curve, the fitting comprising determining a temperature of the scaled version of the black body curve. The temperature is then output. The present disclosure is not to be construed as limiting and is instead directed toward all novel and nonobvious features and aspects of the various disclosed embodiments, alone or in various combinations and subcombinations with one another.
대표청구항▼
1. A method implemented by computing hardware, comprising the steps of: receiving a plurality of spectral radiance measurements at a plurality of wavelengths from a surface of an object;receiving a surface reflectance measurement from the surface of the object;correcting the received plurality of sp
1. A method implemented by computing hardware, comprising the steps of: receiving a plurality of spectral radiance measurements at a plurality of wavelengths from a surface of an object;receiving a surface reflectance measurement from the surface of the object;correcting the received plurality of spectral radiance measurements for surface reflectance changes by multiplying the plurality of spectral radiance measurements with a ratio of the surface reflectance measurement over a low-temperature material reflectance spectrum of the object to produce corrected spectral radiance measurements;fitting the plurality of the corrected spectral radiance measurements to a scaled version of a black body curve, with the computing hardware, wherein the fitting step comprises determining a temperature of the scaled version of the black body curve; andoutputting the temperature for the scaled version of the black body curve that fits the plurality of the corrected spectral radiance measurements. 2. The method of claim 1, wherein the wavelengths in the plurality of wavelengths are contiguous wavelengths. 3. The method of claim 1, further comprising the step of correcting the received plurality of spectral radiance measurements for one or more of dark noise, order overlap effects, or optical fiber absorption. 4. The method of claim 1, wherein the plurality of spectral radiance measurements is received from an indium gallium arsenide spectrometer. 5. The method of claim 1, wherein the fitting step comprises determining two or more scaling variables of the scaled version of the black body curve. 6. The method of claim 1, wherein the fitting step is performed using the Levenberg-Marquardt technique to fit data smoothed with a Savitsky-Golay filter. 7. The method of claim 1, wherein the fitting step is performed independent of emissivity variations on the surface of the object observed at one or more of the wavelengths. 8. The method of claim 1, wherein the method further comprises, before the fitting step, the step of obtaining one or more of a dark noise baseline measurement, an order overlap baseline measurement, or a fiber absorption baseline measurement. 9. The method of claim 8, wherein the method further comprises, before the fitting step, the step of obtaining the low-temperature surface reflectance measurement from the surface of the object when the object is at a temperature lower than at the time of the receiving the plurality of spectral radiance measurements. 10. One or more non-transitory computer-readable media storing computer-executable instructions which, when executed by a computer, cause the computer to perform the method of claim 1. 11. A system for performing optical pyrometry, comprising: an optical fiber, the optical fiber having a first end and a second end, the first end of the optical fiber being oriented toward, but not contacting, a surface of an object whose temperature is to be measured;a spectrometer, the spectrometer being coupled with the second end of the optical fiber and configured to receive light transmitted by the optical fiber and emitted by the surface of the object, the spectrometer being further configured to produce spectral radiance measurements across a range of different wavelengths, the spectrometer being further configured to receive light reflected by the surface of the object and produce spectral reflectance measurements; andcomputing hardware communicatively coupled to the spectrometer, the computing hardware being configured to receive the spectral radiance measurements from across the range of different wavelengths, correct the spectral radiance measurements for surface reflectance changes by multiplying the spectral radiance measurements with a ratio of the spectral reflectance measurements over a low-temperature material spectrum of the object to produce corrected spectral radiance measurements, and determine one or more variables of a black body curve model so that the black body curve model fits the corrected spectral radiance measurements, the one or more variables including temperature. 12. The system of claim 11, wherein the spectrometer is one of an indium gallium arsenide spectrometer, a silicon spectrometer, a lead selenide spectrometer, an indium antimonide spectrometer, a mercury cadmium telluride spectrometer, or a bolometer. 13. The system of claim 11, wherein the spectrometer is configured to produce spectral radiance measurements in a range from within 700 nm to 5000 nm. 14. The system of claim 13, wherein the spectrometer is configured to produce spectral radiance measurements in a range from within 900 nm to 2500 nm. 15. The system of claim 11, wherein the optical fiber has a pass band in a range from within 100 nm to 5000 nm. 16. The system of claim 11, wherein the different wavelengths in the range of different wavelengths are contiguous wavelengths. 17. A system for performing optical pyrometry, comprising: a bundle of one or more optical fibers, the bundle of optical fibers having an end oriented toward, but not contacting, a surface of an object whose temperature is to be measured, the bundle comprising a first set of one or more of the optical fibers having a first end opposite the end oriented toward the surface of the object, the bundle further comprising a second set of one or more of the optical fibers having a second end opposite the end oriented toward the surface of the object;an illumination source, the first end of the first set of one or more of the optical fibers being positioned adjacent to the illumination source such that light from the illumination source is transmissible through the first set of one or more of the optical fibers to illuminate the surface of the object;a spectrometer, the spectrometer being coupled to the second end of the second set of one or more of the optical fibers, the spectrometer being configured to receive light emitted by the surface of the object, the spectrometer being further configured to produce spectral radiance measurements across a range of different wavelengths; andcomputing hardware communicatively coupled to the spectrometer, the computing hardware being configured to receive the spectral radiance measurements from across the range of different wavelengths and determine one or more variables of a black body curve model so that the black body curve model fits the received spectral radiance measurements, the one or more variables including temperature. 18. The system of claim 17, wherein the different wavelengths in the range of different wavelengths are contiguous wavelengths. 19. The system of claim 17, wherein the illumination source is a broad spectrum light source. 20. The system of claim 17, wherein the one or more of the optical fibers in the first set are located central to the one or more optical fibers in the second set. 21. The system of claim 17, wherein the light from the illumination source can be selectively transmitted to the surface of the object. 22. A method implemented by computing hardware in an optical pyrometry system, comprising: receiving a spectrum of radiance measurements at a plurality of wavelengths from a surface of an object being measured;receiving a reflectance spectrum from the surface of the object being measured;correcting the radiance spectrum for (a) dark noise in the optical pyrometry system, (b) spectrometer order overlap, and (c) absorption in optical fibers used to transmit the radiance spectrum, and thereby producing a corrected radiance spectrum;further correcting the corrected radiance spectrum for surface reflectance changes by multiplying the corrected radiance spectrum with a ratio of the reflectance spectrum over a low-temperature material reflectance spectrum of the object; andfitting the corrected radiance spectrum to a black body curve model, wherein the fitting comprises determining a temperature of the black body curve model. 23. The method of claim 22, wherein the method further comprises, before the fitting, obtaining a dark noise baseline measurement, an order overlap baseline measurement, and a fiber absorption baseline measurement. 24. One or more non-transitory computer-readable media storing computer-executable instructions which when executed by a computer cause the computer to perform the method of claim 22. 25. A method implemented by computing hardware in an optical pyrometry system, comprising: receiving a first spectrum of radiance measurements at a plurality of wavelengths from a surface of an object being measured;transmitting light from an external light source onto the surface of the object being measured;receiving a second spectrum of radiance measurements at the plurality of wavelengths from the surface of the object being measured as the object is illuminated by the external light source;correcting the first spectrum for surface reflectance changes and thereby generating a corrected spectrum, the correcting the first spectrum being based at least in part on the second spectrum and including multiplying the corrected spectrum with a ratio of the second spectrum over a low-temperature material reflectance spectrum of the object; andfitting the corrected spectrum to a black body curve model, wherein the fitting comprises determining a temperature of the black body curve model. 26. The method of claim 25, wherein the correcting further comprises correcting the first spectrum for (a) dark noise in the optical pyrometry system, (b) spectrometer order overlap, and (c) absorption in optical fibers used to transmit the spectrum. 27. The method of claim 25, wherein the method further comprises, before the fitting, obtaining the low-temperature material reflectance spectrum of the object at room temperature. 28. The method of claim 25, wherein the method further comprises, before the fitting, obtaining a dark noise baseline measurement, an order overlap baseline measurement, and a fiber absorption baseline measurement. 29. One or more non-transitory computer-readable media storing computer-executable instructions which when executed by a computer cause the computer to perform the method of claim 25.
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이 특허에 인용된 특허 (5)
Brogardh Torgny (Vesteras SEX) Sander Lars (Vesteras SEX), Fiber optical temperature measurement devices.
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