Transparent material cutting with ultrafast laser and beam optics
원문보기
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
C03B-033/02
B23K-026/00
B23K-026/382
B23K-026/0622
출원번호
US-0529801
(2014-10-31)
등록번호
US-9687936
(2017-06-27)
발명자
/ 주소
Marjanovic, Sasha
Piech, Garrett Andrew
Tsuda, Sergio
Wagner, Robert Stephen
출원인 / 주소
Corning Incorporated
대리인 / 주소
Panian, Michael G.
인용정보
피인용 횟수 :
1인용 특허 :
41
초록▼
A system for laser drilling of a material includes a pulsed laser configured to produce a pulsed laser beam having a wavelength less than or equal to about 850 nm, the wavelength selected such that the material is substantially transparent at this wavelength. The system further includes an optical a
A system for laser drilling of a material includes a pulsed laser configured to produce a pulsed laser beam having a wavelength less than or equal to about 850 nm, the wavelength selected such that the material is substantially transparent at this wavelength. The system further includes an optical assembly positioned in the beam path of the laser, configured to transform the laser beam into a laser beam focal line oriented along the beam propagation direction, on a beam emergence side of the optical assembly.
대표청구항▼
1. A method of laser drilling a material comprising: focusing a pulsed laser beam into a laser beam focal line oriented along a beam propagation direction, the laser beam having a wavelength less than or equal to about 850 nm, the laser beam focal line having a length extending along the beam propag
1. A method of laser drilling a material comprising: focusing a pulsed laser beam into a laser beam focal line oriented along a beam propagation direction, the laser beam having a wavelength less than or equal to about 850 nm, the laser beam focal line having a length extending along the beam propagation direction that is in a range of between about 0.1 mm and about 100 mm and an average spot diameter that is in a range of between about 0.1 μm and about 5 μm; anddirecting the laser beam focal line into the material, the laser beam focal line generating an induced absorption within the material, the induced absorption producing a defect line having a diameter less than or equal to about 300 nm along the laser beam focal line within the material. 2. The method of claim 1, wherein the laser beam has a wavelength less than or equal to about 775 nm. 3. The method of claim 2, wherein the laser beam has a wavelength less than or equal to about 600 nm. 4. The method of claim 3, wherein the laser beam has a wavelength less than or equal to about 532 nm. 5. The method of claim 1, wherein the pulsed laser produces pulse bursts with at least 2 pulses per pulse burst. 6. The method of claim 1, wherein the pulsed laser has laser power of 10 W-150 W and produces pulse bursts with at least 2 pulses per pulse burst. 7. The method of claim 6, wherein the pulsed laser has laser power of 10 W-100 W and produces pulse bursts with 2-25 pulses per pulse burst. 8. The method of claim 6, further comprising: translating the laser beam focal line and the material relative to each other such that an adjacent defect line is produced within the material, wherein the pulsed laser that produces the defect line and the adjacent defect line has laser power of 25 W-60 W, and produces pulse bursts with 2-25 pulses per burst, wherein a distance between the defect line and the adjacent defect line is 0.5-10 microns. 9. The method of claim 6, wherein the pulsed laser has laser power of 10 W-100 W and the workpiece or the laser beam is translated relative to one another at a rate of at least 0.25 msec. 10. The method of claim 6, wherein (i) the pulsed laser has laser power of 10 W-100 W; and (ii) the workpiece and the laser beam are translated relative to one another at a rate of at least 0.4 msec. 11. The method of claim 1, wherein the induced absorption produces subsurface damage up to a depth less than or equal to about 75 μm within the material. 12. The method of claim 1, wherein the induced absorption produces subsurface damage up to a depth less than or equal to about 40 μm within the material. 13. The method of claim 1, wherein the induced absorption produces an Ra surface roughness less than or equal to about 0.5 μm. 14. The method of claim 1, further including translating the material and the laser beam relative to each other, thereby drilling a plurality of defect lines within the material, the defect lines spaced apart so as to separate the material into at least two pieces. 15. The method of claim 1, wherein the pulse duration is in a range of between greater than about 1 picosecond and less than about 100 picoseconds. 16. The method of claim 15, wherein the pulse duration is in a range of between greater than about 5 picoseconds and less than about 20 picoseconds. 17. The method of claim 1, wherein the pulsed laser beam has a burst repetition rate in a range of between about 1 kHz and 2 MHz. 18. The method of claim 17, wherein the pulsed laser beam has a burst repetition rate in a range of between about 10 kHz and 650 kHz. 19. The method of claim 1, wherein the pulsed laser beam has an average laser power per burst measured at the material greater than 40 μJ per burst. 20. The method of claim 1, wherein the pulsed laser is configured to emit pulses produced in bursts of at least two pulses separated by a duration in a range of between about 1 nsec and about 50 nsec, and the burst repetition frequency is in a range of between about 1 kHz and about 2 MHz. 21. The method of claim 20, wherein the pulses are separated by a duration of about 20 nsec. 22. The method of claim 1, wherein the length of the laser beam focal line is in a range of between about 0.1 mm and about 8 mm. 23. The method of claim 1, further comprising: directing the pulsed laser beam to form a ring of laser radiation on a marginal area of a focusing optic element; andfocusing the ring of laser radiation with the focusing optic element into the laser beam focal line. 24. The method of claim 23, further comprising: directing the pulsed laser beam onto a circular aperture such that central beam bundles of the laser beam are absorbed by the aperture and marginal beam bundles of the laser beam pass around the aperture and form the ring of laser radiation on the marginal area of the focusing optic element. 25. The method of claim 23, further comprising: directing the pulsed laser beam through an axicon to form the ring of laser radiation on the marginal area of the focusing optic element. 26. The method of claim 25, further comprising: collimating the pulsed laser beam with a collimating lens positioned between the axicon and the focusing optic element. 27. A method of laser drilling a material comprising: focusing a pulsed laser beam into a laser beam focal line oriented along a beam propagation direction, the laser beam having a wavelength less than 850 nm, the laser beam focal line having a length extending along the beam propagation direction that is in a range of between about 0.1 mm and about 100 mm and an average spot diameter that is in a range of between about 0.1 μm and about 5 μm; anddirecting the laser beam focal line into the material, the laser beam focal line generating an induced absorption within the material, the induced absorption producing a defect line having an internal diameter less than 0.5 μm along the laser beam focal line within the material. 28. The method of claim 27, wherein producing the defect line includes producing the defect line with internal diameter of less than 0.4 μm. 29. The method of claim 28, wherein producing the defect line includes producing the defect line with internal diameter of less than 0.3 μm. 30. The method of claim 29, wherein producing the defect line includes producing the defect line with internal diameter of less than 0.2 μm. 31. The method of claim 27, further comprising: directing the pulsed laser beam to form a ring of laser radiation on a marginal area of a focusing optic element; andfocusing the ring of laser radiation with the focusing optic element into the laser beam focal line. 32. The method of claim 31, further comprising: directing the pulsed laser beam onto a circular aperture such that central beam bundles of the laser beam are absorbed by the aperture and marginal beam bundles of the laser beam pass around the aperture and form the ring of laser radiation on the marginal area of the focusing optic element. 33. The method of claim 31, further comprising: directing the pulsed laser beam through an axicon to form the ring of laser radiation on the marginal area of the focusing optic element. 34. The method of claim 33, further comprising: collimating the pulsed laser beam with a collimating lens positioned between the axicon and the focusing optic element. 35. A method of laser drilling a material comprising: directing a pulsed laser beam to form a ring of laser radiation on a marginal area of a focusing optic element, the laser beam having a wavelength less than 850 nm;focusing the ring of laser radiation with the focusing optic element into a laser beam focal line oriented along a beam propagation direction; anddirecting the laser beam focal line into the material, the laser beam focal line generating an induced absorption within the material, the induced absorption producing a defect line having an internal diameter less than 0.5 μm along the laser beam focal line within the material. 36. The method of claim 35, further comprising: directing the pulsed laser beam onto a circular aperture such that central beam bundles of the laser beam are absorbed by the aperture and marginal beam bundles of the laser beam pass around the aperture and form the ring of laser radiation on the marginal area of the focusing optic element. 37. The method of claim 35, further comprising: directing the pulsed laser beam through an axicon to form the ring of laser radiation on the marginal area of the focusing optic element. 38. The method of claim 37, further comprising: collimating the pulsed laser beam with a collimating lens positioned between the axicon and the focusing optic element. 39. The method of claim 35, wherein: the laser beam focal line has a length extending along the beam propagation direction that is in a range of between about 0.1 mm and about 100 mm. 40. The method of claim 35, wherein: the laser beam focal line has an average spot diameter that is in a range of between about 0.1 μm and about 5 μm. 41. The method of claim 35, wherein the laser beam focal line has a length extending along the beam propagation direction that is in a range of between about 0.1 mm and about 100 mm and an average spot diameter that is in a range of between about 0.1 μm and about 5 μm.
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