Mechanisms for deriving an accurate timing signal from a noisy waveform
원문보기
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
G01P-003/00
G01P-003/64
G06F-017/14
G01P-003/48
G01P-003/489
G01M-007/02
출원번호
US-0285057
(2014-05-22)
등록번호
US-9829502
(2017-11-28)
발명자
/ 주소
Hall, Richard M.
Das, Sreerupa
출원인 / 주소
Lockheed Martin Corporation
대리인 / 주소
Withrow & Terranova, PLLC
인용정보
피인용 횟수 :
0인용 특허 :
13
초록▼
Deriving a clean timing signal from a waveform is disclosed. A sensor-of-interest (SOI) sample set and a waveform sample set that correspond to the SOI sample set in time is collected. The waveform sample set is partitioned into a plurality of waveform sample subsets, and the SOI sample set is parti
Deriving a clean timing signal from a waveform is disclosed. A sensor-of-interest (SOI) sample set and a waveform sample set that correspond to the SOI sample set in time is collected. The waveform sample set is partitioned into a plurality of waveform sample subsets, and the SOI sample set is partitioned into a plurality of SOI sample subsets, each SOI sample subset corresponding to one of the plurality of waveform sample subsets. A plurality of waveform sample subset angular speeds is determined, wherein each waveform sample subset angular speed corresponds to a different waveform sample subset. An aggregate mean angular speed based on the plurality of waveform sample subset angular speeds is determined. Each SOI sample subset is resampled to the aggregate mean angular speed based on the corresponding waveform sample subset angular speed to generate a plurality of resampled SOI subsets.
대표청구항▼
1. A method for deriving a timing signal from a waveform generated by a rotating machinery, comprising: receiving, by a processor, a waveform sample set of a voltage waveform or current waveform from a rotating machinery and a sensor-of-interest (SOI) sample set that corresponds to the waveform samp
1. A method for deriving a timing signal from a waveform generated by a rotating machinery, comprising: receiving, by a processor, a waveform sample set of a voltage waveform or current waveform from a rotating machinery and a sensor-of-interest (SOI) sample set that corresponds to the waveform sample set in time, the SOI sample set quantifying a sensed condition of the rotating machinery, wherein the waveform sample set comprises the voltage waveform or the current waveform from a three-phase alternator, a poly-phase alternator, a three-phase alternating current (AC) generator, a poly-phase AC generator, a single-phase alternator, or a single-phase AC generator;partitioning the waveform sample set into a plurality of waveform sample subsets, wherein each of the plurality of waveform sample subsets has a predetermined time period;determining a plurality of waveform sample subset angular speeds, wherein each waveform sample subset angular speed corresponds to a different waveform sample subset;determining an aggregate mean angular speed based on the plurality of waveform sample subset angular speeds; andresampling the SOI sample set utilizing the aggregate mean angular speed to generate a resampled SOI sample set. 2. The method of claim 1, wherein determining the plurality of waveform sample subset angular speeds further comprises: determining a predominant angular speed of the waveform sample set;for each waveform sample subset, determining an expected pulse length and an expected pulse length variance based on the predominant angular speed;for each waveform sample subset, determining a waveform sample subset pulse length that corresponds to each waveform sample subset based on the expected pulse length and the expected pulse length variance; andfor each waveform sample subset, determining the waveform sample subset angular speed based on the sample subset pulse length that corresponds to each waveform sample subset. 3. The method of claim 2, wherein determining the plurality of waveform sample subset angular speeds further comprises: determining a threshold level crossing detection window; andselecting an upper range value and a lower range value for the threshold level crossing detection window. 4. The method of claim 3, wherein determining a sample subset pulse length that corresponds to each waveform sample subset based on the expected pulse length and the expected pulse length variance further comprises for each waveform sample subset: processing each waveform sample subset to locate a waveform cycle based on the threshold level crossing detection window, and determining a preliminary pulse length of the waveform cycle;determining that the preliminary pulse length is within the expected pulse length variance of the expected pulse length; andsetting the sample subset pulse length to the preliminary pulse length. 5. The method of claim 2, wherein determining the plurality of waveform sample subset angular speeds further comprises: determining, for each waveform sample subset, a deviation from the aggregate mean angular speed;determining outlier waveform sample subsets by determining if a respective waveform sample subset angular speed is an outlier by determining that the respective waveform sample subset angular speed deviates from the aggregate mean angular speed by more than a predetermined threshold deviation;removing the outlier waveform sample subsets by replacing the waveform sample subset angular speeds of the outlier waveform sample subsets with an interpolated value derived from immediate neighboring waveform sample subsets. 6. The method of claim 2, wherein determining the predominant angular speed of the waveform sample set further comprises determining the predominant angular speed of the waveform sample set based on a Fast Fourier Transform (FFT) function of the waveform sample set. 7. The method of claim 1, wherein resampling the SOI sample set comprises: partitioning the SOI sample set into a plurality of SOI sample subsets, wherein each SOI sample subset corresponds to one of the waveform sample subset angular speeds; andresampling each SOI sample subset at the corresponding waveform sample subset angular speed to generate a plurality of resampled SOI sample subsets. 8. The method of claim 7, further comprising: processing, by a vibration analysis function or other phenomenon related to an angular position of a shaft, the plurality of resampled SOI sample subsets. 9. The method of claim 1, wherein the predetermined time period is less than a time period of a single rotation of the three-phase alternator, the poly-phase alternator, the three-phase AC generator, or the poly-phase AC generator. 10. The method of claim 1, wherein the predetermined time period is less than a time period of a single rotation of the single-phase alternator or the single-phase AC generator. 11. A device for deriving a timing signal from a waveform generated by a rotating machinery, comprising: a sensor interface configured to receive sensor data; anda processor coupled to the sensor interface and configured to: receive a waveform sample set of a voltage waveform or current waveform from a rotating machinery and a sensor-of-interest (SOI) sample set that corresponds to the waveform sample set in time, the SOI sample set quantifying a sensed condition of the rotating machinery, wherein the waveform sample set comprises the voltage waveform or the current waveform from a three-phase alternator, a poly-phase alternator, a three-phase alternating current (AC) generator, a poly-phase AC generator, a single-phase alternator, or a single-phase AC generator;partition the waveform sample set into a plurality of waveform sample subsets, wherein each of the plurality of waveform sample subsets has a predetermined time period;determine a plurality of waveform sample subset angular speeds, wherein each waveform sample subset angular speed corresponds to a different waveform sample subset;determine an aggregate mean angular speed based on the plurality of waveform sample subset angular speeds; andresample the SOI sample set utilizing the aggregate mean angular speed to generate a resampled SOI sample set. 12. The device of claim 11, wherein to determine the plurality of waveform sample subset angular speeds, the processor is further configured to: determine a predominant angular speed of the waveform sample set;for each waveform sample subset, determine an expected pulse length and an expected pulse length variance based on the predominant angular speed;for each waveform sample subset, determine a sample subset pulse length that corresponds to each waveform sample subset based on the expected pulse length and the expected pulse length variance; andfor each waveform sample subset, determine the waveform sample subset angular speed based on the sample subset pulse length that corresponds to each waveform sample subset. 13. The device of claim 12, wherein to determine the plurality of waveform sample subset angular speeds, the processor is further configured to: determine a threshold level crossing detection window; andselect an upper range value and a lower range value for the threshold level crossing detection window. 14. The device of claim 13, wherein to determine a sample subset pulse length that corresponds to each waveform sample subset based on the expected pulse length and the expected pulse length variance, for each waveform sample subset, the processor is further configured to: process each waveform sample subset to locate a waveform cycle based on the threshold level crossing detection window, and determine a preliminary pulse length of the waveform cycle;determine that the preliminary pulse length is within the expected pulse length variance of the expected pulse length; andset the sample subset pulse length to the preliminary pulse length. 15. The device of claim 12, wherein to determine the plurality of waveform sample subset angular speeds, the processor is further configured to: determine, for each waveform sample subset, a deviation from the aggregate mean angular speed;determine outlier waveform sample subsets by determining if a respective waveform sample subset angular speed is an outlier by determining that the respective waveform sample subset angular speed deviates from the aggregate mean angular speed by more than a predetermined threshold deviation;remove the outlier waveform sample subsets by replacing the waveform sample subset angular speeds of the outlier waveform sample subsets with an interpolated value derived from immediate neighboring waveform sample subsets. 16. The device of claim 12, wherein to determine the predominant angular speed of the waveform sample set, the processor is further configured to determine the predominant angular speed of the waveform sample set based on a Fast Fourier Transform (FFT) function of the waveform sample set. 17. The device of claim 11, wherein resampling the SOI sample set comprises: partitioning the SOI sample set into a plurality of SOI sample subsets, wherein each SOI sample subset corresponds to one of the waveform sample subset angular speeds; andresampling each SOI sample subset at the corresponding waveform sample subset angular speed to generate a plurality of resampled SOI sample subsets. 18. The device of claim 17, wherein the processor is further configured to: process, by a vibration analysis function or other phenomenon related to an angular position of a shaft, the plurality of resampled SOI sample subsets. 19. The device of claim 11, wherein the predetermined time period is less than a time period of a single rotation of the three-phase alternator, the poly-phase alternator, the three-phase AC generator, or the poly-phase AC generator. 20. The device of claim 11, wherein the predetermined time period is less than a time period of a single rotation of the single-phase alternator or the single-phase AC generator.
연구과제 타임라인
LOADING...
LOADING...
LOADING...
LOADING...
LOADING...
이 특허에 인용된 특허 (13)
Harmon Jack Douglas, Apparatus and method for providing an output signal indicative of engine rotational speed and/or generator rotational speed.
Dreiseitl Walter (Erlangen DEX) Koch Manfred (Bamberg DEX) Linden Wilhelm (Erlangen-Buechenbach DEX), Method and apparatus for determining rotational speed.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.