Systems and methods for transfer of ions for analysis
원문보기
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
H01J-049/04
H01J-049/26
H01J-049/10
출원번호
US-0340355
(2016-11-01)
등록번호
US-10008374
(2018-06-26)
발명자
/ 주소
Ouyang, Zheng
Cooks, Robert Graham
Garimella, Sandilya Venkata
Harper, Jason David
Charipar, Nicholas Alan
출원인 / 주소
Purdue Research Foundation
대리인 / 주소
Brown Rudnick LLP
인용정보
피인용 횟수 :
0인용 특허 :
49
초록▼
The invention generally relates to systems and methods for transferring ions for analysis. In certain embodiments, the invention provides a system for analyzing a sample including an ionizing source for converting molecules of a sample into gas phase ions in a region at about atmospheric pressure, a
The invention generally relates to systems and methods for transferring ions for analysis. In certain embodiments, the invention provides a system for analyzing a sample including an ionizing source for converting molecules of a sample into gas phase ions in a region at about atmospheric pressure, an ion analysis device, and an ion transfer member operably coupled to a gas flow generating device, in which the gas flow generating device produces a laminar gas flow that transfers the gas phase ions through the ion transfer member to an inlet of the ion analysis device.
대표청구항▼
1. A system for analyzing a sample, the system comprising: an ionizing source for converting molecules of a sample into sample ions;an ion analysis device;a pump external to the ion analysis device; andan ion transfer member external the ion analysis device, wherein the system is configured such tha
1. A system for analyzing a sample, the system comprising: an ionizing source for converting molecules of a sample into sample ions;an ion analysis device;a pump external to the ion analysis device; andan ion transfer member external the ion analysis device, wherein the system is configured such that there is a gap between the ion transfer member and an inlet of the ion analysis device and the pump produces a laminar gas flow without regions of recirculation that facilitates collection of the sample ions in the ion transfer member, and transfer of the sample ions through the ion transfer member to the inlet of the ion analysis device. 2. The system according to claim 1, wherein the ionizing source comprises a gas inlet port and an electrode positioned within the source to interact with a gas introduced through the gas inlet port and to generate a discharge that interacts with the sample to produce the sample ions. 3. The system according to claim 1, wherein the sample ions are produced in a region at about atmospheric pressure. 4. The system according to claim 1, wherein the ion transfer member is a tube. 5. The system according to claim 4, wherein the tube is composed of a rigid material. 6. The system according to claim 5, wherein the rigid material is metal or glass. 7. The system according to claim 4, wherein the tube is straight. 8. The system according to claim 1, wherein the ionizing source is selected from the group consisting of: an electrospray ionization source, a nano-electrospray ionization source, an atmospheric pressure matrix-assisted laser desorption ionization source, an atmospheric pressure chemical ionization source, a desorption electrospray ionization source, an atmospheric pressure dielectric barrier discharge ionization source, an atmospheric pressure low temperature plasma desorption ionization source, and an electrospray-assisted laser desorption ionization source. 9. The system according to claim 1, wherein the ion analysis device is selected from the group consisting of a mass spectrometer, a handheld mass spectrometer, and an ion mobility ion analysis device. 10. The system according to claim 9, wherein the mass spectrometer is selected from the group consisting of: a quadrupole ion trap, a rectilinear ion trap, a cylindrical ion trap, a ion cyclotron resonance trap, an orbitrap, a sector, and a time of flight mass spectrometer. 11. The system according to claim 1, further comprising a sample stage configured to hold the sample. 12. The system according to claim 11, wherein the ionizing source is arranged such that a distal tip of the ionizing source is pointed at the sample stage. 13. A system for analyzing a sample, the system comprising: a sample stage configured to hold a sample;an ionizing source arranged such that a distal tip of the ionizing source is pointed at the sample stage so that sample ions are generated from the sample;an ion analysis device;a pump external to the ion analysis device; andan ion transfer tube external the ion analysis device and that has a diameter greater than a diameter of an inlet of the ion analysis device, wherein the system is configured such that there is a gap between the ion transfer tube and the inlet of the ion analysis device and the pump facilitates collection of the sample ions in the ion transfer tube, which sample ions are transferred through the ion transfer tube to the inlet of the ion analysis device. 14. The system according to claim 13, wherein the ionizing source comprises a gas inlet port and an electrode positioned within the source to interact with a gas introduced through the gas inlet port and to generate a discharge that interacts with the sample to produce the sample ions. 15. The system according to claim 13, wherein the sample ions are produced in a region at about atmospheric pressure. 16. The system according to claim 13, wherein the tube is composed of a rigid material. 17. The system according to claim 16, wherein the rigid material is metal or glass.
연구과제 타임라인
LOADING...
LOADING...
LOADING...
LOADING...
LOADING...
이 특허에 인용된 특허 (49)
Park, Melvin A., Apparatus and method for parallel flow ion mobility spectrometry combined with mass spectrometry.
Chowdhury Swapan K. (New York NY) Katta Viswanatham (New York NY) Chait Brian T. (New York NY), Electrospray ionization mass spectrometer with new features.
Smith, Richard D.; Tang, Keqi; Shvartsburg, Alexandre A., High performance ion mobility spectrometry using hourglass electrodynamic funnel and internal ion funnel.
Smith, Richard D.; Tang, Keqi; Shvartsburg, Alexandre A., High performance ion mobility spectrometry using hourglass electrodynamic funnel and internal ion funnel.
Makarov, Alexander; Pesch, Reinhold; Malek, Robert; Kozlovskiy, Viacheslav, Ion transfer arrangement with spatially alternating DC and viscous ion flow.
Wouters, Eloy R.; Makarov, Alexander A.; Atherton, R. Paul; Dunyach, Jean Jacques, Ion transfer tube having single or multiple elongate bore segments and mass spectrometer system.
Splendore, Maurizio A.; Wouters, Eloy R.; Atherton, Paul R.; Dunyach, Jean Jacques, Method and apparatus for an ion transfer tube and mass spectrometer system using same.
Cooks, Robert G.; Gologan, Bogdan; Takáts, Zoltán; Wiseman, Justin M.; Cotte Rodriguez, Ismael, Method and system for desorption atmospheric pressure chemical ionization.
Ouyang, Zheng; Cooks, Robert Graham; Garimella, Sandilya Venkata; Harper, Jason David; Charipar, Nicholas Alan, Systems and methods for transfer of ions for analysis.
Ouyang, Zheng; Cooks, Robert Graham; Garimella, Sandilya Venkata; Harper, Jason David; Charipar, Nicholas Alan, Systems and methods for transfer of ions for analysis.
Ouyang, Zheng; Cooks, Robert Graham; Garimella, Sandilya Venkata; Harper, Jason David; Charipar, Nicholas Alan, Systems and methods for transfer of ions for analysis.
Ouyang, Zheng; Cooks, Robert Graham; Garimella, Sandilya Venkata; Harper, Jason David; Charipar, Nicholas Alan, Systems and methods for transfer of ions for analysis.
Ouyang, Zheng; Cooks, Robert Graham; Garimella, Sandilya Venkata; Harper, Jason David; Charipar, Nicholas Alan, Systems and methods for transfer of ions for analysis.
Ouyang, Zheng; Cooks, Robert Graham; Garimella, Sandilya Venkata; Harper, Jason David; Charipar, Nicholas Alan, Systems and methods for transfer of ions for analysis.
Ouyang, Zheng; Cooks, Robert Graham; Garimella, Sandilya Venkata; Harper, Jason David; Charipar, Nicholas Alan, Systems and methods for transfer of ions for analysis.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.