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| 국가/구분 | United States(US) Patent 등록 |
|---|---|
| 국제특허분류(IPC7판) |
|
| 출원번호 | US-0243122 (2014-04-02) |
| 등록번호 | US-10114497 (2018-10-30) |
| 발명자 / 주소 |
|
| 출원인 / 주소 |
|
| 대리인 / 주소 |
|
| 인용정보 | 피인용 횟수 : 0 인용 특허 : 337 |
An novel sensor is provided having a plurality of substantially parallel drive lines configured to transmit a signal into a surface of a proximally located object, and also a plurality of substantially parallel pickup lines oriented proximate the drive lines and electrically separated from the picku
An novel sensor is provided having a plurality of substantially parallel drive lines configured to transmit a signal into a surface of a proximally located object, and also a plurality of substantially parallel pickup lines oriented proximate the drive lines and electrically separated from the pickup lines to form intrinsic electrode pairs that are impedance sensitive at each of the drive and pickup proximal locations.
1. An impedance sensor configured to operate in a dual resolution processing mode for processing touch input at a touch screen device, the sensor comprising a processing unit configured to: determine, in a low resolution mode, whether an object creating the touch input has changed its position on th
1. An impedance sensor configured to operate in a dual resolution processing mode for processing touch input at a touch screen device, the sensor comprising a processing unit configured to: determine, in a low resolution mode, whether an object creating the touch input has changed its position on the touch screen device;in response to determining in the low resolution mode that the object has changed its position on the touch screen device, output the position of the object determined in the low resolution mode;in response to determining in the low resolution mode that the object has not changed its position on the touch screen device, compute a coarse position of the object and switch from the low resolution mode to a high resolution modecompute, in the high resolution mode, a fine position difference of the object relative to the coarse position; andoutput the coarse position of the object adjusted by the fine position difference. 2. The impedance sensor of claim 1, wherein the impedance sensor further comprises: a plurality of substantially parallel drive lines; anda plurality of substantially parallel pickup lines overlapping the drive lines and arranged perpendicularly to the drive lines,wherein the drive lines are arranged to form clusters of parallel drive lines, wherein a distance separating two adjacent drive lines in the same cluster is less than a distance separating two adjacent drive lines in different clusters, andwherein the pickup lines are arranged to form clusters of parallel pickup lines, wherein a distance separating two adjacent pickup lines in the same cluster is less than a distance separating two adjacent pickup lines in different clusters. 3. The impedance sensor of claim 2, wherein the processing unit is configured to detect movement between clusters in the low resolution mode, and is configured to detect movement between pickup lines of the same cluster in the high resolution mode. 4. The impedance sensor of claim 3, wherein the processing unit is configured to determine between using the high resolution mode and the low resolution mode based on a type of activity being performed by the object. 5. The impedance sensor of claim 2, wherein each overlap between each drive line and each pickup line forms a pixel, and wherein the processing unit is configured to process the touch input with a higher number of pixels in the high resolution mode than in the low resolution mode. 6. A dual resolution sensing system configured to operate in dual resolution processing modes for processing low resolution, high speed positioning and high resolution, slow speed motion tracking, said system comprising: a primary grid comprising overlapping grid lines spaced at a first spacing, wherein the primary grid comprises a plurality of substantially parallel primary drive lines spaced at the first spacing and a plurality of substantially parallel primary pickup lines arranged transversely to the primary drive lines and spaced at the first spacing;a secondary grid including each of the plurality of substantially parallel primary drive lines and each of the plurality of substantially parallel primary pickup lines of the primary grid and comprising overlapping groups of grid lines, wherein the grid lines in each group of the overlapping groups of grid lines of the secondary grid are spaced at a second spacing that is smaller than the first spacing and include (i) a primary drive line and at least one secondary drive line parallel to the primary drive line and spaced from the primary drive line at the second spacing and (ii) a primary pickup line and at least one secondary pickup line parallel to the primary pickup line and spaced from the primary pickup line at the second spacing, andwherein the overlapping groups of grid lines of the secondary grid define a plurality of sensing clusters, each sensing cluster being comprised of a plurality of overlapping grid lines spaced at the second spacing, andwherein the clusters are spaced from one another by a distance that is greater than the second spacing; anda processing unit configured to: determine, in a low resolution mode, whether an object contacting the system has changed its position based on data signals from the primary grid, anddetermine, in a high resolution mode, localized features of an object contacting the system based on data signals from one or more sensing clusters of the secondary grid. 7. The dual resolution sensing system of claim 6, wherein the plurality of substantially parallel primary drive lines are arranged perpendicularly to the plurality of substantially parallel primary pickup lines, andthe secondary grid comprises a plurality of substantially parallel groups of secondary drive lines and a plurality of substantially parallel groups of secondary pickup lines arranged perpendicularly to the groups of secondary drive lines. 8. The dual resolution sensing system of claim 7, further comprising: a rigid transparent substrate with the drive lines formed on a top surface thereof;a top layer with the pickup lines formed thereon; anda dielectric layer separating the rigid transparent substrate from the top layer. 9. The dual resolution sensing system of claim 8, further comprising: a chip comprising a circuit on the top surface of the rigid transparent substrate; anda plurality of routing lines connecting the chip to the drive lines. 10. The dual resolution sensing system of claim 8, wherein the top layer comprises thin glass. 11. The dual resolution sensing system of claim 8, wherein the top layer comprises strengthened glass. 12. The dual resolution sensing system of claim 8, wherein the top layer comprises chemically strengthened glass. 13. The dual resolution sensing system of claim 6, wherein the first spacing is 5 to 10 lines per inch and the second spacing is 500 lines per inch. 14. The dual resolution sensing system of claim 6, wherein the cluster spacing is from 1 to 3 millimeters. 15. The dual resolution sensing system of claim 6, further comprising: a fingerprint sensor connected to the processing unit and comprising:an area of high density pixels not coincident with said primary grid or said secondary grid and comprising a plurality of substantially parallel drive lines and a plurality of substantially parallel pickup lines arranged perpendicularly to the drive lines.
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