A clamp-type probe device comprises a first pressed member, a second pressed member and a probe head. The first pressed member comprises a first clamping portion and a first mounted portion connected to each other, and has a first and a second assembly holes. The second pressed member comprises a se
A clamp-type probe device comprises a first pressed member, a second pressed member and a probe head. The first pressed member comprises a first clamping portion and a first mounted portion connected to each other, and has a first and a second assembly holes. The second pressed member comprises a second clamping portion and a second mounted portion connected to each other. The second and the first mounted portions are connected to each other. The second and the first clamping portions are separated from each other. The probe head comprises a plurality of contacting members. Each contacting member comprises two bending portions. Two ends of each contacting member are respectively disposed through the first and the second assembly holes. The two bending portions are respectively pressed against an inner side surface of the first assembly hole and an inner side surface of the second assembly hole.
대표청구항▼
1. A clamp-type probe device, comprising: a first pressed member comprising a first clamping portion and a first mounted portion connected to each other, and the first pressed member having a first assembly hole and a second assembly hole;a second pressed member comprising a second clamping portion
1. A clamp-type probe device, comprising: a first pressed member comprising a first clamping portion and a first mounted portion connected to each other, and the first pressed member having a first assembly hole and a second assembly hole;a second pressed member comprising a second clamping portion and a second mounted portion connected to each other, the second mounted portion and the first mounted portion connected to each other, and the second clamping portion and the first clamping portion separated from each other; anda probe head comprising a plurality of contacting members, each of the plurality of contacting members comprising two bending portions connected to each other, two ends of each of the plurality of contacting members, which are opposite to each other, respectively disposed through the first assembly hole and the second assembly hole, and the two bending portions of each of the plurality of contacting members respectively pressed against an inner side surface of the first assembly hole and an inner side surface of the second assembly hole. 2. The clamp-type probe device according to claim 1, further comprising: a base;a first pushing member movably disposed on the base, and the first pushing member having a first edge; anda second pushing member movably disposed on the base, and the second pushing member having a second edge;wherein, the first pushing member and the second pushing member are movable relative to each other, the first pushing member is able to push the first pressed member with the first edge, and the second pushing member is able to push the second pressed member with the second edge; when the first pressed member and the second pressed member are respectively pushed by the first pushing member and the second pushing member, the probe head and the second clamping portion are moved close to each other. 3. The clamp-type probe device according to claim 2, wherein the base comprises a carrier and an electrically insulating member, the electrically insulating member is fixed to the carrier, and the first pressed member and the second pressed member are fixed to the carrier through the electrically insulating member. 4. The clamp-type probe device according to claim 2, wherein the first pushing member is movable in a first direction to push the first pressed member, and the second pushing member is movable in a second direction, which is opposite from the first direction, to push the second pressed member. 5. The clamp-type probe device according to claim 2, wherein the first pushing member has a first through hole, the second pushing member has a second through hole, the first edge is located in the first through hole, the second edge is located in the second through hole, and the first pressed member and the second pressed member are disposed through the first through hole and the second through hole. 6. The clamp-type probe device according to claim 2, further comprising a power source disposed on the base, wherein the first pushing member and the second pushing member are connected to the power source, and the power source is able to move the first pushing member and the second pushing member. 7. The clamp-type probe device according to claim 2, further comprising two guiding grooves disposed on the base, and the first pushing member and the second pushing member respectively disposed in the two guiding grooves. 8. The clamp-type probe device according to claim 1, wherein each of the first assembly hole and the second assembly hole has a plurality of engagement recesses located on the inner side surface thereof, and the plurality of contacting members are partially disposed in the plurality of engagement recesses, respectively. 9. The clamp-type probe device according to claim 1, further comprising: a base; anda pushing member movably disposed on the base, the pushing member being movable to push at least one of the first pressed member and the second pressed member, so as to move the probe head and the second clamping portion close to each other. 10. The clamp-type probe device according to claim 9, wherein the pushing member has a through hole, the first pressed member and the second pressed member are disposed through the through hole; when the pushing member is moved, two sides of the through hole, which are opposite to each other, respectively push the first pressed member and the second pressed member.
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이 특허에 인용된 특허 (3)
Schwartz Frederick W. (Providence RI), Battery testing system.
Slocum Alexander H. ; Ziegenhagen ; II Rodney Scott, Flexible shielded laminated beam for electrical contacts and the like and method of contact operation.
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