[미국특허]
Targeted oven self-clean preheat temperature control
원문보기
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
F24D-019/10
F24C-003/12
F24C-014/02
F24F-011/49
F24F-110/10
출원번호
16290160
(2019-03-01)
등록번호
10865999
(2020-12-15)
발명자
/ 주소
Neal, Vern A.
출원인 / 주소
MIDEA GROUP CO., LTD.
대리인 / 주소
Middleton Reutlinger
인용정보
피인용 횟수 :
0인용 특허 :
0
초록
One or more cooking elements of a cooking appliance may be controlled during the preheat phase of an oven self-clean cycle to dynamically control a rate of temperature rise to reach a target temperature setpoint at a predetermined time in the oven self-clean cycle.
대표청구항▼
1. A cooking appliance, comprising: a housing including an oven cavity;a temperature sensor configured to sense an air temperature within the oven cavity;one or more electric cooking elements configured to generate heat within the oven cavity; anda controller in communication with the temperature se
1. A cooking appliance, comprising: a housing including an oven cavity;a temperature sensor configured to sense an air temperature within the oven cavity;one or more electric cooking elements configured to generate heat within the oven cavity; anda controller in communication with the temperature sensor and configured to control the one or more electric cooking elements to perform an oven self-clean cycle within the oven cavity, wherein the controller is configured to perform the oven self-clean cycle by regulating the one or more electric cooking elements to maintain the temperature within the oven cavity proximate a self-clean temperature setpoint, and wherein the controller is further configured to perform the oven self-clean cycle by, during a preheat phase of the oven self-clean cycle: regulating the one or more electric cooking elements to dynamically control a rate of temperature rise in the oven cavity to reach a first target temperature setpoint that is about 316° C. (about 600° F.) proximate a first predetermined time in the oven self-clean cycle; andthereafter regulating the one or more electric cooking elements to dynamically control the rate of temperature rise in the oven cavity to reach a second target temperature setpoint that is about 454° C. (about 850° F.) proximate a second predetermined time in the oven self-clean cycle;wherein the controller regulates the one or more electric cooking elements to provide a controlled rise time to the self-clean temperature setpoint that is substantially independent of any variance in output power of the one or more electric cooking elements. 2. A cooking appliance, comprising: a housing including a cooking cavity;a temperature sensor configured to sense a temperature within the oven cavity;one or more cooking elements configured to generate heat within the oven cavity; anda controller in communication with the temperature sensor and configured to control the one or more cooking elements to perform an oven self-clean cycle within the oven cavity, wherein the controller is configured to perform the oven self-clean cycle by regulating the one or more cooking elements to maintain the temperature within the oven cavity proximate a self-clean temperature setpoint, and wherein the controller is further configured to perform the oven self-clean cycle by, during a preheat phase of the oven self-clean cycle, regulating the one or more cooking elements to dynamically control a rate of temperature rise to reach a target temperature setpoint at a predetermined time in the oven self-clean cycle, wherein the target temperature setpoint is less than the self-clean temperature setpoint. 3. The cooking appliance of claim 2, wherein the controller is further configured to, after reaching the target temperature setpoint, initiate a clean phase of the oven self-clean cycle. 4. The cooking appliance of claim 2, wherein the target temperature setpoint is a first target temperature setpoint and the predetermined time is a first predetermined time, and wherein the controller is further configured to, after reaching the first target temperature setpoint, regulate the one or more cooking elements to dynamically control the rate of temperature rise to reach a second target temperature setpoint that is above the first target temperature setpoint at a second predetermined time in the oven self-clean cycle. 5. The cooking appliance of claim 4, wherein the self-clean temperature setpoint is associated with a first test waiver target temperature, wherein the first target temperature setpoint is associated with a second test waiver target temperature, wherein the first test waiver target temperature is above the second test waiver target temperature, and wherein the first and second test waiver target temperature are associated with a certification test waiver standard that waives one or more certification tests based upon similarity of the cooking appliance to a previously-certified cooking appliance. 6. The cooking appliance of claim 5, wherein the controller is configured to control the one or more cooking elements during the preheat phase to provide a controlled rise time from the second test waiver target temperature to the first test waiver target temperature that is substantially independent of any variance in output power of the one or more cooking elements. 7. The cooking appliance of claim 6, wherein the controller is further configured to control the one or more cooking elements during the preheat phase to provide a controlled rise time from room temperature to the first test waiver target temperature that is substantially independent of any variance in output power of the one or more cooking elements. 8. The cooking appliance of claim 5, wherein the first test waiver target temperature is the lesser of about 454° C. (about 850° F.) and a maximum oven cavity air temperature, and wherein the second test waiver target temperature is about 316° C. (about 600° F.). 9. The cooking appliance of claim 2, wherein the controller is configured to regulate the one or more cooking elements during the preheat phase to dynamically control the rate of temperature rise to reach the target temperature setpoint at the predetermined time in the oven self-clean cycle by dynamically determining a target temperature at each of a plurality of points in time using a curve fit to the target temperature setpoint and controlling the one or more cooking elements at each of the plurality of points in time using the target temperature at such point in time. 10. The cooking appliance of claim 9, wherein the curve includes one or more linear segments. 11. The cooking appliance of claim 9, wherein the curve includes one or more logarithmic curves. 12. The cooking appliance of claim 2, wherein the controller is configured to regulate the one or more cooking elements during the preheat phase to dynamically control the rate of temperature rise to reach the target temperature setpoint at the predetermined time in the oven self-clean cycle by dynamically determining a target temperature at each of a plurality of points in time using linear interpolation and controlling the one or more cooking elements at each of the plurality of points in time using the target temperature at such point in time. 13. The cooking appliance of claim 2, wherein the controller is configured to regulate the one or more cooking elements during the preheat phase to dynamically control the rate of temperature rise to reach the target temperature setpoint at the predetermined time in the oven self-clean cycle by regulating the one or more cooking elements to follow a target temperature curve comprising one or more linear segments. 14. The cooking appliance of claim 2, wherein the one or more cooking elements includes one or more electric cooking elements, and wherein the controller is configured to regulate the one or more cooking elements to dynamically control the rate of temperature rise by cycling the one or more electric cooking elements between active and inactive states. 15. A method of controlling a cooking appliance, the method comprising: sensing a temperature within an oven cavity of a cooking appliance;with a controller in communication with the temperature sensor, performing an oven self-clean cycle within the oven cavity by regulating one or more cooking elements that generate heat within the oven cavity to maintain the temperature within the oven cavity proximate a self-clean temperature setpoint; andwith the controller and during a preheat phase of the oven self-clean cycle, regulating the one or more cooking elements to dynamically control a rate of temperature rise to reach a target temperature setpoint at a predetermined time in the oven self-clean cycle, wherein the target temperature setpoint is less than the self-clean temperature setpoint. 16. The method of claim 15, wherein the target temperature setpoint is a first target temperature setpoint and the predetermined time is a first predetermined time, and wherein the method further comprises, after reaching the first target temperature setpoint, regulating the one or more cooking elements to dynamically control the rate of temperature rise to reach a second target temperature setpoint that is above the first target temperature setpoint at a second predetermined time in the oven self-clean cycle. 17. The method of claim 16, wherein the self-clean temperature setpoint is associated with a first test waiver target temperature that is the lesser of about 454° C. (about 850° F.) and a maximum oven cavity air temperature, wherein the first target temperature setpoint is associated with a second test waiver target temperature that is about 316° C. (about 600° F.), wherein the first and second test waiver target temperature are associated with a certification test waiver standard that waives one or more certification tests based upon similarity of the cooking appliance to a previously-certified cooking appliance, and wherein the method further comprises: controlling the one or more cooking elements during the preheat phase to provide a controlled rise time from the second test waiver target temperature to the first test waiver target temperature that is substantially independent of any variance in output power of the one or more cooking elements; andcontrolling the one or more cooking elements during the preheat phase to provide a controlled rise time from room temperature to the first test waiver target temperature that is substantially independent of any variance in output power of the one or more cooking elements. 18. The method of claim 15, wherein regulating the one or more cooking elements during the preheat phase to dynamically control the rate of temperature rise to reach the target temperature setpoint at the predetermined time in the oven self-clean cycle includes: dynamically determining a target temperature at each of a plurality of points in time using a curve fit to the target temperature setpoint; andcontrolling the one or more cooking elements at each of the plurality of points in time using the target temperature at such point in time. 19. The method of claim 15, wherein regulating the one or more cooking elements during the preheat phase to dynamically control the rate of temperature rise to reach the target temperature setpoint at the predetermined time in the oven self-clean cycle includes: dynamically determining a target temperature at each of a plurality of points in time using linear interpolation; andcontrolling the one or more cooking elements at each of the plurality of points in time using the target temperature at such point in time. 20. The method of claim 15, wherein regulating the one or more cooking elements during the preheat phase to dynamically control the rate of temperature rise to reach the target temperature setpoint at the predetermined time in the oven self-clean cycle includes regulating the one or more cooking elements to follow a target temperature curve comprising one or more linear segments.
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