[보고서]광측정 세계 선도 연구

보고서 정보

주관연구기관

한국표준과학연구원
Korea Research Institute of Standards and Science

보고서유형

1단계보고서

발행국가

대한민국

언어

한국어

발행년월

2011-10

과제시작연도

2011

주관부처

미래창조과학부
Ministry of Science, ICT and Future Planning

등록번호

TRKO201300015255

과제고유번호

1345165311

사업명

한국표준과학연구원연구운영비지원

DB 구축일자

2014-01-13

키워드

광도.복사도.복사온도.교정측정능력.소급성.불확도.국제비교.Photometry.Radiometry.Radiation thermometry.Calibration and measurement capability.Traceability.Uncertainty.International comparison.

DOI

https://doi.org/10.23000/TRKO201300015255

표 Schematic diagram of KRISS　PLUS facility.
표 Physical properties of OPO source.
표 Pulse shape of OPO source.
표 Pulse power fluctuation of OPO source.
표 Schematic configuration of KRISS　PLUS set up for measurement of relative spectral responsivity (400∼1000 nm).
표 Relative pulse power of DUT and REF.
표 Ratio of DUT / REF out for 100 pulse as a function of REF integration value (circle : comparing peak value, triangle : comparing integration value).
표 Experimental set up of beam splitter power ratio measurement.
표 (a) BS Power ratio of REF(R) at the wavelength of 555 nm, (b) Spectral BS power ratio.
표 Schematic measurement method of integraion sphere Spectral distribution.
표 (a) Spectral distribution of integration sphere(blue line)and Super continuum source(red line) using CAS 140, (b) Nomalized Spectral distribution of integration sphere.
표 Relative spectral responsivity of silicon photodiode measured on previous (black line) versus KRISS PLUS facility(red scatter)
표 Schematic diagram of the integrating sphere light source facility.
표 Picture of the integrating sphere light source facility
표 Relationship between LP4 signal and Reference Detector signal
표 Contour plot of the sphere radiance uniformity within the exit port; 2% steps.
표 Schematic setup and photograph of the test system for spectral response of imaging sensors and cameras.
표 Output power of the LED-based tunable source as a function of wavelength.
표 Measured irradiance of the LED-based tunable source with integrating sphere as a function of wavelength (top) and the corresponding radiance calculated from the geometrical condition (bottom).
표 User interface of control and measurement software for the LED-based tunable integrating sphere source.
표 Spatial distribution of irradiance measured at 1 cm distance from the integrating sphere output port at 435 nm.
표 Temporal stability of the LED-based tunable source at different wavelengths.
표 User interface of image data analysis software for the LED-based tunable integrating sphere source.
표 Influence of reflectance from DUT to the REF signal measured at a distance of 4 cm from the IS port.
표 Change of repeatability uncertainty as the exposure time of the DUT CCD sensor changes.
표 Reproducibility uncertainty of the DUT signal as a function of SNR.
표 Repeatability and reproducibility uncertainty as a function of wavelength.
표 Ratio DUT/REF as a function of wavelength measured without (top) and with (bottom) power drift correction.
표 Spatial distribution of irradiance at different wavelengths.
표 Conceptual setup of the photon counter calibration system based on a tunable OPO.
표 Schematic setup of cw OPO to be used for calibration of Si and InGaAs photon counters.
표 Wavelength tuning range of the cw OPO based on quasi-phase matching in a MgO:PPLN crystal with different poling periods.
표 Output power of the cw OPO as a function of wavelength at a pump power of 2 W.
표 Threshold pump power of the cw OPO as a function of wavelength.
표 Comparison of output power characteristics at two different output wavelengths of the cw OPO.
표 Change of output beam profiles of the cw OPO showing a thermally induced distortion of the spatial modes.
표 Output characteristics as a function of cavity length in a cw OPO with self-guiding.
표 Output beam profiles as a function of cavity length in a cw OPO with self-guiding.
표 Temporal characteristics of a cw OPO in (a) normal and (b) self-guided operation.
표 Basic building blocks of a coincidence counting system.
표 Photograph of the FPGA-based coincidence counting system.
표 Counting results of test pulses swept from 1 kHz to 100 Hz for 1 s gate time.
표 Test of coincidence counting for TTL pulses with a width of 50 μs.
표 Schematic diagram of electrostatic levitation
표 Real picture of electrostatic levitation
표 UV image of levitated metallic liquids at high temperature for density measurement.
표 Labview program to determine, to fit, and to analyze the boundary of image for density measurement
표 Sixth order Legendre polynomial fit using the least approximation method.
표 Metalic liquid oscillating by electric field
표 Experimental set-up to determine the shape of metallic liquid by AC electric field.
표 Control and analysis program to measure surface tension and viscosity of metal liquid.
표 Time decay of the radius of metallic liquid excited by AC electric field.
표 Temperature change with power of heating laser
표 Temperature-time curve of Hf showing melting and freezing.
표 Temperature-time curve of Nb showing melting and freezing.
표 Temperature dependance of liquid Ti under stable and supercooled state.
표 Temperature dependance of density of Hf at liquid, supercooled liquid, and solid state
표 Tempepature dependance of density of liquid and solid Nb
표 Temperature dependance of viscosity of liquid Ti
표 Temperature dependance of viscosity of liquid Zr
표 Temperature dependance of surface tension of liquid Ti, Zr, Hf
표 Comparison of temperature dependance of surface tension on liquid Ti
표 Comparison of temperature dependance of surface tension on liquid Zr
표 Comparison of temperature dependance of surface tension on liquid Hf
표 Temperature-time curve of Ti
표 Relation of supercooling and plateau time
표 Maximum supercooling induced by known references.
표 Temperature dependance of heat capacity of liquid Ti
표 Absolute methods for spectral diffuse reflectance measurement as the national standards
표 Reflectance measurement instruments of national standard institutes
표 Drawing of the integrating sphere for the absolute diffuse reflectance measurement system.
표 Schematic drawing of an integrating sphere of Sharp-Little method. The physical quantities for calculation of Φs are described.
표 Schematic diagram used in the numerical calculation of the ratio k of the radiance of a sample to the radiance of an integrating sphere wall.
표 Absolute methods for spectral diffuse reflectance measurement as the national standards
표 Main window of the developed software for reflectance measurements.
표 Effective luminous intensity of the Blondel-Rey method for a rectangular pulse.
표 Effective luminous intensity of the Blondel-Rey method for a non rectangular pulse.
표 Effective luminous intensity of the Blondel-Rey method for a train of two pulses.
표 Schematic of the Form factor method.
표 Schematic of the Allard method.
표 RC low-pass filter circuit to achieve the convolution.
표 Effective intensity calculated by Blondel-Rey method for a rectangular pulse with the pulse duration of 0.01 s.
표 Effective intensity calculated by Form factor method for a rectangular pulse with the pulse duration of 0.01 s.
표 Effective intensity calculated by Allard method for a rectangular pulse with the pulse duration of 0.01 s.
표 Results of convolution used by Allard method for a rectangular pulse.
표 Results for rectangular pulses with different pulse duration.
표 Results for rectangular pulses with different pulse duration.
표 Effective intensity calculated by Blondel-Rey method for a sine pulse.
표 Results calculated by Blondel-Rey method for sine pulses with different pulse durations.
표 Results calculated by Blondel-Rey method for sine pulses with different pulse durations.
표 Effective intensity calculated by Form factor method for a sine pulse with the pulse duration of 0.1 s.
표 Results calculated by Form factor method for sine pulses with different pulse durations.
표 Results calculated by Form factor method for sine pulses with different pulse durations.
표 Effective intensity calculated by Allard method for a sine pulse with the pulse duration of 0.1 s.
표 Results calculated by Allard method for sine pulses with different pulse durations.
표 Results calculated by Allard method for sine pulses with different pulse durations
표 Results for sine wave pulses with different pulse duration.
표 Results for sine pulses with different pulse duration.
표 Schematic diagram of the measurement system for characterization of flashing light measurement equipments.
표 Photograph of the measurement system for characterization of flashing light measurement equipments.
표 Relative spectral distribution of the LED output.
표 Illuminance of LED with square pulses.
표 Illuminance of LED with sine pulses.
표 Illuminance of LED with triangular pulses.
표 Effective values of illuminances multiplied by pulse duration of 0,1 s for different wave shapes shown as figures above.
표 Spectral irradiance of the standard source at 50.0 cm.
표 TRT2 signal change at Mikron blackbody temperature of 60 °C according to the house temperature change of TRT2
표 Schematic diagram of TRT2 with a blackbody and an aperture plate
표 Measured SSE of the TRT2 in the low temperature mode
표 Measured temperature distributions across the aperture center of the Tin point blackbody at melting and freezing points by using a thermal imager
표 (a) TRT2 temperature change and (b) corresponding signal measured by TRT2 according to the temperature change of the 30 mm aperture plate measured by the Pt100
표 Measured TRT2 signal of TPW
표 Measured melting TRT2 signal of the gallium point
표 Measured freezing TRT2 signal of the indium point
표 Measured freezing TRT2 signal of the tin point
표 Uncertainty components for the FPBB and VTBB calibration schemes. The shaded boxes indicate the uncertainty components included under the respective schemes
표 Measured TRT2 signal and temperature distributions across the aperture center of the tin point blackbody at 197 ℃
표 Fixed point calibration data of TRT2
표 Long-term stability measurements of the TPW, Ga, In and Tin points
표 Uncertainty budget of TRT2 temperature scale
표 Measured TRT2 signal as a function of the distance from the bottom of Mikron M385 at 60 ℃
표 Comparison of TRT2 scale with SPRT(Fluke5699) scale installed in the water-bath-based blackbody(Mikron M385)
표 Geometry of (a) KRISS-type cavity and (b) ASTM-type cavity
표 Caculated right-conical effective emissivities of KRISS-type and ASTM-type cavities as a function of the full view angle of the incident ray bundles
표 Geometry of IR detectors in different tympanic thermometers
표 Radiance temperature difference between KRISS-type cavity and ASTM-type cavity at the reference temperature of 309.15 K
표 Radiance temperature difference measured by Genius1 between KRISS-type cavity and ASTM-type cavity
표 Definition of air mass for solar cell evaluation
표 Spectral irradiance of standard solar spectra
표 ICE standard documents for solar cell test
표 Equivalent circuit of solar cells
표 Effect of series resistance on I-V characteristic curves
표 Effect of shunt resistance on I-V characteristic curves
표 Effect of reverse saturation current on I-V characteristic curves
표 Effect of ideality factor on I-V characteristic curves
표 Parameters of photovoltaic cell to be determined
표 Traceability of reference photovoltaic cell calibrations
표 Schematic diagram of photovoltaic reference cell calibration facility
표 Calibration facility for photovoltaic reference cells
표 Cell holders for temperature control of PVRC
표 Attachment for linearity test
표 Drop-down sub-menu of Measure main manu
표 Measurement setup screen
표 Main measurement window of PVRCC program
표 Time constant of Pt100 of PVRC-95
표 Temperature stabilization after setting temperature
표 Thermistor resistance setting vs. stabilized temperature measured by Pt100
표 Stabilization of Pt100 after changing shutter status
표 Time constant of PVRC-95 after its exposure to solar simulator
표 Temperature stability improvement accompanying setting temp. change after operation of solar simulator shutter
표 Stabilization of solar simulator after turning lamp on
표 Solar irradiance as changing lamp current of solar simulator
표 Spatial uniformity of solar simulator irradiance
표 Linearity of PVRC-95 near an irradiance level of 1 kW/m2
표 Shunt resistance measurement results of photovoltaic reference cells
표 I-V characteristic curve of PVRC-93 for reverse voltages
표 I-V characteristic curve of PVRC-94 for reverse voltages
표 I-V characteristic curve of PVRC-95 for reverse voltages
표 PVRC-95의 직렬저항 측정결과: 0.09 Ω
표 Ratios of I sc between 3 PVRCs
표 Spectral irradiance of solar simulator with current of 7.4 A applied
표 Irradiance uniformity of solar simulator for correction of area difference between PVRC and light collecting sphere of spectroradiometer
표 Uncertainty of absolute calibration
표 I-V curves of PVRCs at irradiance of about 1 kW/m2
표 Excel VBA program for extracting PV cell parameter at STC
표 Fitting result of I-V curve of PVRC-95
표 I-V curve of PVRC-95 at STC
표 Difference of I-V curves between IEC method and Fit method
표 I sc of PVRCs for various relative spectral responsivity results
표 Comparison of PVRC calibrations among 3 institutes
표 Comparison of parameter measured by KRISS and Fraunhofer ISE
표 Unilateral DoE of APMP laboratories for measurements of luminous flux, relative to the CCPR.K4 KCRV
표 Schematic setup diagram of the KRISS goniophotometer used for the primary realization of the luminous flux scale at KRISS.
표 Calibration curves of the photocurrent meter unit for all the gain ranges.
표 Nonlinearity correction factor @100 μA
표 Nonlinearity correction factor @10 μA
표 Nonlinearity correction factor @1 μA
표 Nonlinearity correction factor @100 nA
표 Nonlinearity correction factor @10 nA
표 Angular offset in polar angle
표 Schematic diagram of the KRISS goniophotometer when the APMP-K4 Comparison had been performed. Note the post is shorter compared to Fig 9-1-1.
표 Effect of screening by the lamp axis module
표 Updated uncertainty budget of the goniophotometer measurement for a fairy uniform source
표 Schematic diagram of the 2 m absolute integrating sphere
표 SRDF of the 2 m absolute integrating sphere. (a) rear hemisphere (b) front hemisphere
표 Uncertainty budget of the 2 m absolute integrating sphere
표 Different coverage by the DUT illumination with respect to its size
표 Schematic diagram of 0.3 m absolute integrating sphere
표 SRDF of the 0.3 m absolute integrating sphere
표 Uncertainty budget of the 0.3 m absolute integrating sphere measurement
표 Traceability and comparison artefacts
표 Angular distribution of luminous intensity (a) 100W-X lamp (b) 5W-X lamp
표 Comparison results and their uncertainties
표 Schematic diagram of the specto-radiometer.
표 Photograph of display for electric ruler of the photometric bench.
표 Realization of the KRISS spectral irradiance with standard lamp.
표 Instruments for the KRISS spectral irradiance with standard lamp.
표 Summary of uncertainty for spectral irradiance at 250 nm
표 Results of calibration for secondary spectral irradiance lamp.
표 Standard LED set used as comparison artefacts of LED measurements.
표 Degrees of equivalence of APMP laboratories for measurements of luminous flux, relative to the CCPR K4 KCRV
표 Status of APMP.PR-S2 international comparison

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