In this study, we are concerned about a systematic and algorithmic approach for detecting and recognizing the Uniformity Diff. Mura Defect arising from the process inferior of a Color Filter ITO of an LCD, which is impossible for an operator to directly inspect or discriminate from Inspection Equipm...
In this study, we are concerned about a systematic and algorithmic approach for detecting and recognizing the Uniformity Diff. Mura Defect arising from the process inferior of a Color Filter ITO of an LCD, which is impossible for an operator to directly inspect or discriminate from Inspection Equipment. The Uniformity Diff.(Dfference) of an LCD color pattern concerned in this study is usually ranging from 200 to 500Å. Before this research device was available, the inspections were done by imaging with a high-speed camera. There were, however, some obstacles lying in this method that kept an Automatic Inspection nearly impossible: that is, the images were too small, and even if the resolution of camera was increased, or gray scale value of the image subdivided into Integral Number or double Number, it was still a troublesome and rather challenging task to develop an algorithm to detect and discriminate the defects occurring in their positions. Hence, with its aim being to overcome these problems, this device is consist of an LCD whose panel emits the light from its lower part, a Transmitter Aperture in which the light is collected and collimated, and a Receiver Aperture where the light that has passed through an LCD is eventually received. Furthermore, the device also contains a prism and a spectrometer sensor, which scatters the light and divide it into band by band, with respect to its wavelength, and a controlling unit (computer) which filters this light from each band to obtain Transmittance Data. Finally, in obtaining wavelength data from the Transmission rate with which the light transmitted an RGB Color Filter ITO, we suggested a new algorithmic flow to detect and recognize the defects, as followings: a data input from equidistant wavelength segments-Mean Filter-Variance Filter-MaxMin Filter(Noise Reduction). The result of detection of the sample, done by a means suggested above, was verified through an exact detection and raw data from defect positions of an RGB Color Filter. The verified data was built so that a customer could use it easily and reliably based on its accuracy and reproducibility, when it comes necessary to distinguish the RGB filters correctly and to exactly confirm the positional regions that are detected and recognized. A mass-productive evaluation will be applied soon, so as to supply this detector for a Uniformity Diff. Mura Defect in LCD Color Filter - which are undetectable by operators and field equipments, as mentioned above to product makers.
In this study, we are concerned about a systematic and algorithmic approach for detecting and recognizing the Uniformity Diff. Mura Defect arising from the process inferior of a Color Filter ITO of an LCD, which is impossible for an operator to directly inspect or discriminate from Inspection Equipment. The Uniformity Diff.(Dfference) of an LCD color pattern concerned in this study is usually ranging from 200 to 500Å. Before this research device was available, the inspections were done by imaging with a high-speed camera. There were, however, some obstacles lying in this method that kept an Automatic Inspection nearly impossible: that is, the images were too small, and even if the resolution of camera was increased, or gray scale value of the image subdivided into Integral Number or double Number, it was still a troublesome and rather challenging task to develop an algorithm to detect and discriminate the defects occurring in their positions. Hence, with its aim being to overcome these problems, this device is consist of an LCD whose panel emits the light from its lower part, a Transmitter Aperture in which the light is collected and collimated, and a Receiver Aperture where the light that has passed through an LCD is eventually received. Furthermore, the device also contains a prism and a spectrometer sensor, which scatters the light and divide it into band by band, with respect to its wavelength, and a controlling unit (computer) which filters this light from each band to obtain Transmittance Data. Finally, in obtaining wavelength data from the Transmission rate with which the light transmitted an RGB Color Filter ITO, we suggested a new algorithmic flow to detect and recognize the defects, as followings: a data input from equidistant wavelength segments-Mean Filter-Variance Filter-MaxMin Filter(Noise Reduction). The result of detection of the sample, done by a means suggested above, was verified through an exact detection and raw data from defect positions of an RGB Color Filter. The verified data was built so that a customer could use it easily and reliably based on its accuracy and reproducibility, when it comes necessary to distinguish the RGB filters correctly and to exactly confirm the positional regions that are detected and recognized. A mass-productive evaluation will be applied soon, so as to supply this detector for a Uniformity Diff. Mura Defect in LCD Color Filter - which are undetectable by operators and field equipments, as mentioned above to product makers.
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