최소 단어 이상 선택하여야 합니다.
최대 10 단어까지만 선택 가능합니다.
다음과 같은 기능을 한번의 로그인으로 사용 할 수 있습니다.
NTIS 바로가기品質經營學會誌 = Journal of Korean society for quality management, v.30 no.2, 2002년, pp.152 - 159
An acceptance sampling plan for products manufactured from a production process with variable fraction defective is developed. We consider a situation where defective products have short lifetimes and non-defective ones never fail during the technological life of the products. An acceptance criterio...
Bai, D.S., and Kwon, Y.I. (1994), 'An economic sequential screening procedure for limited failure population', Naval Research Logistics, 41, pp.523-535
Case, K.E., and Keats, J.B. (1982), 'On the Selection of a Prior Distribution in Bayesian Acceptance Sampling', Journal of Quality Technology, Vol. 14, No. 1, pp.10-18
Chien, W.K., and Kuo, W. (1997), 'A nonparametric Bayes Approach to decide system burn-in time', Naval Research Logistics, 44, pp.655-671
Kuo, W. and Kim, T. (1999), 'An Overview of Manufacturing Yield and Reliability Modeling for Semiconductor Products', Proceedings of the IEEE, Vol. 87, No. 8, pp.1329-1344
Kwon Y.I. (2002), 'Bayesian Bum-in Procedures for Limited Failure Populations', Internal Journal of Production Research, to appear
Leemis, L.M., and Beneke, M. (1990), 'Bum-in models and methods: a review', IIE Trans., 22, 2, pp.172-180
Marcus, R., and Blumenthal, S. (1974), 'A sequential screening procedure', Techmometrics, 16, 2, pp.229-234
Mi, J. (1997), 'Warranty policies and burn-in' , Naval Research Logistics, 44, pp.199-209
*원문 PDF 파일 및 링크정보가 존재하지 않을 경우 KISTI DDS 시스템에서 제공하는 원문복사서비스를 사용할 수 있습니다.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.