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15. Park, M. C., Kim, S. W., 'Compensation of phase change on reflection in white-light interferometry for step height measurement,' Optics Letters, Vol. 26, No.7, pp. 420-422, 2001 

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16. Ghim, Y. S., Kim, S.W., 'Phase change on reflection in a white-light interferometer as polarization is changed,' J. Opt. Soc. Korea, Vol. 15, No.4, pp. 331-336, 2004 

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17. Kim, S. W. and Kim, G. H., 'Thickness-profile measurement of transparent thin-film layers by white-light scanning interferometry,' Applied Optics, Vol. 378, No. 28, pp. 5968-5973, 1999 

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20. Kim, S. W., Ghim, Y. S., 'Low-coherence interferometry for 3D measurements of microelectronics packaging and integration,' Proc. SPIE Int. Soc. Opt. Eng., Vol. 5644, pp.429-443, 2005 

    

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