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SF6 and O2 Effects on PR Ashing in N2 Atmospheric Dielectric Barrier Discharge 원문보기

Transactions on electrical and electronic materials, v.7 no.4, 2006년, pp.204 - 209  

Jeong, Soo-Yeon (Department of Nuclear Engineering, Seoul National University) ,  Kim, Ji-Hun (Department of Nuclear Engineering, Seoul National University) ,  Hwang, Yong-Seuk (Department of Nuclear Engineering, Seoul National University) ,  Kim, Gon-Ho (Department of Nuclear Engineering, Seoul National University)

Abstract AI-Helper 아이콘AI-Helper

Photo Resist (PR) ashing process was carried out with the atmospheric pressure- dielectric barrier discharge (ADBD) using $SF_6/N_2/O_2$. Ashing rate (AR) was sensitive to the mixing ratio of the oxygen and nitrogen of the blower type of ADBD asher. The maximum AR of 5000 A/min was achiev...

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문제 정의

  • The properties of discharge and process are considered simultaneously to figure out the characteristics of the system, which play an important role in the development of the process system. Because the ashing process of photoresistor on the glass is the large scale of the process in the semiconductor or TFT- LCD fabrications, this study is focused on the development of the asher using DBD. The characteristics of DBD have been investigated with the operating frequency and the reactor capacitance, obtaining the design rule of DBD process reactor[6].

가설 설정

  • By Comparing experiment OES result with simulated Gaussian profile which is acquired using eq. (3), the vibration temperature and rotation temperature was meas나red. In this study, the temperature of nitrogen molecules is observed using nitrogen molecule spectrum (C3 IIu) from OES data[13].
  • As seen from eq. 4, the discharge cxirrent increases in accordance with the increase in the discharge density. And O radicals which strip the PR are generated more as discharge current is increased.
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참고문헌 (20)

  1. http://snf.stanford.edu/Process/WetProcessing/ResistStrip.html 

  2. J. Y. Jeong, S. E. Babayan, V. J. Tu, J. Park, I. Henins, R. F. Hicks, and G. S. Selwyn, 'Etching materials with an atmospheric-pressure plasma jet', Plasma Sources Sci. Technol., Vol. 7, p. 282, 1998 

  3. O. Goossens, E. Dekempeneer, D. Vangeneugden, R. Van de Leest, and C. Leys, 'Application of atmospheric pressure dielectric barrier discharges in deposition, cleaning and activation', Surface and Coatings technology, Vol. 142-144, p. 474, 2001 

  4. Y. H. Kim, J. M. Park, and S. H. Hong, 'Geometrical effects of the discharge system on the corona discharge and chemically active species generated in wire-cylinder and wire-plate reactors', J. Korean Phys. Soc., Vol. 44, p. 1458, 2004 

  5. Y.-H. Lee and G.-Y. Yeom, 'Characteristics of a pin-to-plate dielectric barrier discharge in helium', J. Korean Phys. Soc., Vol. 47, p. 74, 2005 

  6. S.-H. Song, D. Kwon, M. P. Hong, and G.-H. Kim, 'The characteristics of the atmospheric pressure plasma', The 12th Korean Conference on Semiconductors, Vol. 2, p. 415, 2005 

  7. S. G. Song, Patent No. 10-2004-0023877, Korea 

  8. Plasmart, Patent No. 10-2002-0019526, Korea 

  9. Sekisui Chemical, Patent No. 10-2003-7006459, Korea 

  10. SEM technology, Patent No. 10-0476136-0000, Korea 

  11. K. V. Kozlov, H.-E. Wagner, R. Brandenburg, and P. Michel, 'Spatio-temporally resolved spectroscopic diagnostics of the barrier discharge in air at atmospheric pressure', J. Phys. D: Appl. Phys., Vol. 34, p. 3164, 2001 

  12. H. J. Yoon and T. H. Chung, 'Calculation of radial profiles of oxygen atoms in high-density oxygen discharges', J. Korean Phys. Soc., Vol. 44, p. 1033, 2004 

  13. J. H. Kim and Y. Hwang, 'The measurement of the electron density and temperature using an OES', Physics of Plasma (submitted in 2006) 

  14. J. H. Kim, Y. H. Kim, Y. H. Choi. W. Choe, J. J. Choi, and Y. S. Hwang, 'Optical measurements of gas temperatures in atmospheric pressure RF cold plasmas', Surface and Coatings technology, Vol. 71, p. 211, 2003 

  15. C. de Izarra, 'UV OH spectrum used as a molecular pyrometer', J. Phys. D : Appl. Phys., Vol. 33, p. 1697, 2000 

  16. Q. Jin, Y. Duan, and J. A. Olivares, 'Development and investigation of microwave plasma techniques in analytical atomic spectrometry', Spectrochim. Acta B, Vol. 52, p. 131, 1997 

  17. G. Herzberg and J. W. T. Sprinks, 'Molecular spectra and molecular structure : I. Spectra of diatomic molecules 2nd Edition', Van Nostrand Reinhold Company, p. 200, 1964 

  18. E. C. M. Chen, J. R. Wiley, C. F. Batten, and W. E. Wentworth, 'Determination of the electron affinities of molecules using negative ion mass spectrometry', J. Phys. Chem., Vol. 98, p. 88, 1994 

  19. K. M. Ervin, I. Anusiewicz, P. Skurski, J. Simons, and W. Carl Lineberger, 'The only stable state of O2-Is the X 2 II g ground state and it (Still!) has an adiabatic electron detachment energy of 0.45 eV', J. Phys. Chem. A, Vol. 107, p. 8521, 2003 

  20. M. A. Lieberman and A. J. Lichenberg, 'Principles of plasma discharges and materials processing 2nd Edition', Wisley-interscience, p. 393 ,2005 

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