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NTIS 바로가기Journal of semiconductor technology and science, v.12 no.4, 2012년, pp.449 - 457
Kim, Dae Hwan (School of Electrical Engineering , Kookmin University) , Park, Sungwook (School of Electrical Engineering , Kookmin University) , Seo, Yujeong (Department of Electronics Engineering, Korea University) , Kim, Tae Geun (Department of Electronics Engineering, Korea University) , Kim, Dong Myong (School of Electrical Engineering , Kookmin University) , Cho, Il Hwan (Department of Electronic Engineering , Myongji University)
The program/erase (P/E) cyclic endurances including bias temperature instability (BTI) behaviors of Metal-
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