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NTIS 바로가기전기전자재료학회논문지 = Journal of the Korean institute of electronic material engineers, v.34 no.2, 2021년, pp.85 - 89
Xin, Dongxu (Department of Electrical and Computer Engineering, Sungkyunkwan University) , Cui, Ziyang (Department of Electrical and Computer Engineering, Sungkyunkwan University) , Kim, Taeyong (Department of Electrical and Computer Engineering, Sungkyunkwan University) , Yi, Junsin (Department of Electrical and Computer Engineering, Sungkyunkwan University)
High reliability thin film transistors are important factors for next-generation displays. The reliability of transparent a-IGZO semiconductors is being actively studied for display applications. A plasma treatment can fill the oxygen vacancies in the channel layer and the channel layer/insulating l...
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