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Abstract ▼ AI-Helper

This research proposes an accelerated aging test procedure for Static Random Access Memory Physically Unclonable Functions (SRAM PUFs). PUFs utilize semiconductor process variations to serve as a hardware security feature, akin to semiconductor device fingerprints. Thus, the proposed accelerated agi...

This research proposes an accelerated aging test procedure for Static Random Access Memory Physically Unclonable Functions (SRAM PUFs). PUFs utilize semiconductor process variations to serve as a hardware security feature, akin to semiconductor device fingerprints. Thus, the proposed accelerated aging test simulates a semiconductor's 10-year lifecycle, enabling the prediction of PUF characteristics after a decade of use, which is crucial for verifying the safety and stability of SRAM PUFs. This research introduces test procedures that simulate 10 years of aging in approximately 9 days by setting temperature and voltage higher than operational environments. These procedures allow for the quantitative evaluation of SRAM PUF characteristics. This research is expected to contribute to the advancement of design and maintenance testing techniques for systems based on SRAM PUFs.

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