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NTIS 바로가기Journal of applied physics, v.120 no.1, 2016년, pp.014101 -
Shekhter, P. (Technion-Israel Institute of Technology 1 Department of Materials Science and Engineering, , Haifa 32000, Israel) , Schwendt, D. (Leibniz University of Hannover 2 Institute of Electronic Materials and Devices, , Schneiderberg 32, 30167 Hannover, Germany) , Amouyal, Y. (Technion-Israel Institute of Technology 1 Department of Materials Science and Engineering, , Haifa 32000, Israel) , Wietler, T. F. (Leibniz University of Hannover 2 Institute of Electronic Materials and Devices, , Schneiderberg 32, 30167 Hannover, Germany) , Osten, H. J. (Leibniz University of Hannover 2 Institute of Electronic Materials and Devices, , Schneiderberg 32, 30167 Hannover, Germany) , Eizenberg, M. (Technion-Israel Institute of Technology 1 Department of Materials Science and Engineering, , Haifa 32000, Israel)
One of the approaches for realizing advanced high k insulators for metal oxide semiconductor field effect transistors based devices is the use of rare earth oxides. When these oxides are deposited as epitaxial thin films, they demonstrate dielectric properties that differ greatly from those that are...
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