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NTIS 바로가기Reliability engineering & system safety, v.72 no.1, 2001년, pp.1 - 8
Oh, Y.S. (Department of Industrial Engineering, Korea Advanced Institute of Science and Technology, Gusong-dong 373-1, Yusong-gu, Taejon 305-701, South Korea) , Bai, D.S. (Corresponding author. Tel.: +82-42-869-3111)
AbstractThis paper proposes methods of estimating the lifetime distribution for situations where additional field data can be gathered after the warranty expires in a parametric time to failure distribution. For satisfactory inference about parameters involved, it is desirable to incorporate these a...
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