$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

[해외논문] Determination of Photoresist Degradation Products in O3/DI Processing

Ozone: science & engineering, v.24 no.5, 2002년, pp.391 - 398  

Vankerckhoven, H. (Department of Chemistry, Leuven, Belgium) ,  De Smedt, F. (Department of Chemistry, Leuven, Belgium) ,  Van Herp, B. (Department of Chemistry, Leuven, Belgium) ,  Claes, M. ,  De Gendt, S. ,  Heyns, M. M. ,  Vinckier, C.

Abstract AI-Helper 아이콘AI-Helper

Mainly because of cost-saving and environmental concerns, ozone has been introduced as a cleaning agent in semiconductor manufacturing in recent years. This work reports the determination of the most important degradation products formed after the stripping of two different types of photoresist (PR...

주제어

참고문헌 (30)

  1. Solid State Technology Heyns M. M. 37 42 1999 

  2. De Gendt, Stefan, Snee, P., Cornelissen, I., Lux, Marcel, Vos, Rita, Mertens, Paul W., Knotter, D. Martin, Meuris, M.M., Heyns, Marc M.. A Novel Resist and Post-Etch Residue Removal Process Using Ozonated Chemistry. Diffusion and defect data. SSP. [Pt. B], Solid state phenomena, vol.65, 165-168.

  3. Proc. Int. Environ. Sci. Kogure M. 380 39 1993 

  4. Hattori T. (ed.): Ultraclean Surface Processing of Silicon Wafers - Secrets of VLSI Processing ( London , U.K. : Springer , 1998 ), p. 474 

  5. Wolf S. , Tauber R. N. Silicon processing for the VLSI era, Vol. I: Process technology , ( California , USA : Lattice Press , l986 ) p. 407 - 455 

  6. Maly W. Atlas of IC Technology - An introduction to VLSI Processes , ( California , USA : Benjamin/Cummings Publishing Company , 1987 ), p. 1 - 8 

  7. Contamination Control in Submicron CMOS Devices, PhD thesis Rotondaro A. L. 

  8. Cleaning Technology in Semiconductor Device Manufacturing III (Proc.) Chooi S. Y. M. 1999 

  9. Cleaning Technology in Semiconductor Device Manufacturing III (Proc.) Haug R. 1999 

  10. Cleaning Technology in Semiconductor Device Manufacturing VI (Proc. De Gendt S. 2000 

  11. RCA Review Kern W. 197 31 1970 

  12. Cleaning Technology in Semiconductor Device Manufacturing III (Proc.) Christenson K. 1999 

  13. Ojima, Senri, Kubo, Kazuki, Kato, Masayuki, Toda, Masayuki, Ohmi, Tadahiro. Megasonic Excited Ozonized Water for the Cleaning of Silicon Surfaces. Journal of the Electrochemical Society : JES, vol.144, no.4, 1482-1487.

  14. De Smedt, F., De Gendt, S., Heyns, M. M., Vinckier, C.. The Application of Ozone in Semiconductor Cleaning Processes: The Solubility Issue. Journal of the Electrochemical Society : JES, vol.148, no.9, G487-.

  15. CRC Handbook of Chem. Phys. , ( Boca Raton , FL , 62nd Ed. , CRC Press Inc. , p. 135 - 138 , 1981 ) 

  16. Roth, John A., Sullivan, Daniel E.. Solubility of ozone in water. Industrial & engineering chemistry fundamentals, vol.20, no.2, 137-140.

  17. Hawkes, Stephen J.. What Should We Teach Beginners about Solubility and Solubility Products?. Journal of chemical education, vol.75, no.9, 1179-.

  18. Mehta, Y. M., George, C. E., Kuo, C. H.. Mass transfer and selectivity of ozone reactions. The Canadian journal of chemical engineering, vol.67, no.1, 118-126.

  19. Anselmi, G., Lignola, P.G., Raitano, C., Volpicelli, C.. Ozone Mass Transfer in Stirred Vessel. Ozone: science & engineering, vol.6, no.1, 17-28.

  20. Beltrán, F.J., García-Araya, J.F., Encinar, J.M.. Henry And Mass Transfer Coefficients In The Ozonation Of Wastewaters. Ozone: science & engineering, vol.19, no.3, 281-296.

  21. Staehelin, Johannes., Hoigne, Juerg.. Decomposition of ozone in water: rate of initiation by hydroxide ions and hydrogen peroxide. Environmental science & technology, vol.16, no.10, 676-681.

  22. Staehelin, Johannes., Hoigne, Juerg.. Decomposition of ozone in water in the presence of organic solutes acting as promoters and inhibitors of radical chain reactions. Environmental science & technology, vol.19, no.12, 1206-1213.

  23. Staehelin, J., Buehler, R. E., Hoigne, J.. Ozone decomposition in water studied by pulse radiolysis. 2. Hydroxyl and hydrogen tetroxide (HO4) as chain intermediates. The Journal of physical chemistry, vol.88, no.24, 5999-6004.

  24. Hoigne, J., Bader, H.. Rate constants of reactions of ozone with organic and inorganic compounds in water-II - Dissociating organic compounds. Water research, vol.17, no.2, 185-194.

  25. Hoigne, J., Bader, H., Haag, W.R., Staehelin, J.. Rate constants of reactions of ozone with organic and inorganic compounds in water-III. Inorganic compounds and radicals. Water research, vol.19, no.8, 993-1004.

  26. Ozonation in organic chemistry, Vol.1: Olefinic compounds Bailey Ph. S. 1982 

  27. Decoret, C., Royer, J., Legube, B., Dore, M.. Experimental and theoretical studies of the mechanism of the initial attack of ozone on some aromatics in aqueous medium. Environmental technology letters, vol.5, no.1, 207-218.

  28. Cleaning Technology in Semiconductor Device Manufacturing III (Proc.) Bergman E. 1999 

  29. Kuo, Ching-yuan. Improved application of ion chromatographic determination of carboxylic acids in ozonated drinking water. Journal of chromatography A, vol.804, no.1, 265-272.

  30. Ohmi, T., Isagawa, T., Imaoka, T., Sugiyama, I.. Ozone Decomposition in Ultrapure Water and Continuous Ozone Sterilization for a Semiconductor Ultrapure Water System. Journal of the Electrochemical Society : JES, vol.139, no.11, 3336-3345.

관련 콘텐츠

저작권 관리 안내
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로