다음과 같은 기능을 한번의 로그인으로 사용 할 수 있습니다.
NTIS 바로가기
European journal of operational research, v.197 no.2, 2009년, pp.659 - 666
Seo, J.H. (Department of Industrial and Management Engineering, Myongji Univesity, San 38-2 Namdong, Cheoin-gu, Yongin-Si, Kyongi-Do 449-728, Republic of Korea) , Jung, M. , Kim, C.M.
AI-Helper
Accelerated life test sampling plans (ALTSPs) provide information quickly on the lifetime distribution of products by testing them at higher-than-usual stress level to induce early failures and reduce the testing efforts. In the traditional design of ALTSPs for Weibull distribution, it is assumed th...
Engineering Optimization Bai 21 197 1993 10.1080/03052159308940975 Design of failure-censored accelerated life tests sampling plans for lognormal and weibull Distribution
Reliability Engineering and System Safety Bai 50 61 1995 10.1016/0951-8320(95)00067-C Failure-censored accelerated life tests sampling plans for Weibull distribution under expected test time constraint
Journal of the Statistical Communication and Simulation Balasooriya 52 337 1995 10.1080/00949659508811684 Failure-censored reliability sampling plans for the exponential distribution
IEEE Transactions on Reliability Balasooriya 53 29 2004 10.1109/TR.2003.821947 Competing causes of failure and reliability tests for Weibull lifetimes under type I progressive censoring
Journal of Applied Statistics Balasooriya 25 707 1998 10.1080/02664769822927 Reliability sampling plans for the tow-parameter exponential distribution under progressive censoring
Technometrics Balasooriya 42 160 2000 10.2307/1271448 Progressively censored reliability sampling plans for the Weibull distribution
Technometrics Fertig 22 165 1980 10.2307/1268455 Life-test sampling plans for two-parameter Weibull populations
IEEE Transactions on Electron Devices Hiergeist 36 913 1989 10.1109/16.299673 Lifetime of oxide and oxide-nitro-oxide dielectrics within trench capacitors for DRAM’s
Communication in Statistics-Simulation Hsiesh 23 27 1994 10.1080/03610919408813154 Accelerated life test sampling plans for exponential distribution
Naval Research Logistics Quarterly Kockerlakota 33 513 1986 10.1002/nav.3800330315 One- and two-sided sampling plans based on the exponential distribution
Electric Letters Li 25 665 1989 10.1049/el:19890450 Time-dependent dielectric breakdown of chemical-vapour-deposited SiO2 gate dielectrics
Technometrics Meeter 36 71 1994 10.2307/1269200 Optimum accelerated life tests with a nonconstant scale parameter
Nelson 1990 Accelerated Testing-Statistical Models, Test Plans, and Data Analysis
Technometrics Nelson 18 105 1976 10.2307/1267923 Theory for optimum censored accelerated life tests for normal and lognormal life distributions
Technometrics Schneider 31 199 1989 10.2307/1268817 Failure-censored variable-sampling plans for lognormal and Weibull distributions
Communications in Statistics-Theory and Methodology Yum 19 2735 1990 10.1080/03610929008830343 Development of life-test sampling plans for exponential distribution based on accelerated life testing
*원문 PDF 파일 및 링크정보가 존재하지 않을 경우 KISTI DDS 시스템에서 제공하는 원문복사서비스를 사용할 수 있습니다.
Copyright KISTI. All Rights Reserved.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.