[논문]Real Time Investigation of the Interface between a P3HT:PCBM Layer and an Al Electrode during Thermal Annealing

Kim, Hyo Jung; Lee, Hyun Hwi; Kim, Jang-Joo

doi:10.1002/marc.200900224

[해외논문] Real Time Investigation of the Interface between a P3HT:PCBM Layer and an Al Electrode during Thermal Annealing

Macromolecular rapid communications, v.30 no.14, 2009년, pp.1269 - 1273

Kim, Hyo Jung (OLED Center and Department of Materials Science and Engineering, Seoul National University, Seoul 151-742, Korea) , Lee, Hyun Hwi (Pohang Accelerator Laboratory, Pohang, Kyungbuk 790-783, Korea) , Kim, Jang-Joo (OLED Center and Department of Materials Science and Engineering, Seoul National University, Seoul 151-742, Korea)

Abstract ▼ AI-Helper

Real time variation of the interfacial structure between an Al electrode and a poly(3-hexylthiophene) (P3HT):fullerene (PCBM) thin film during thermal annealing has been investigated using synchrotron X-rays. It is found that Al atoms diffuse into the organic layer to form a thin interlayer between the Al electrode and the organic layer even during the deposition of an Al layer. The interlayer thickness and the mass density of the interlayer increases if annealed above 120 °C. The interlayer thickness depends on the annealing processes and the inter-diffusion is accelerated by a fast annealing process. The Al diffusion reduces the preferred alignment of the (100) direction of the P3HT crystals from the surface normal direction and randomizes their orientation. The Al diffusion also helps to reduce the contact resistance in the P3HT:PCBM-based solar cells.Graphic AbstractThe interface between the Al electrode and the organic active layer in P3HT: PCBM-based organic photovoltaic devices is investigated using synchrotron X-rays. Thermal annealing induces the diffusion of Al into the organic layer to reduce the contact resistance and the preferred alignment of the (100) direction of the P3HT crystals from the surface normal direction, which results in an improved performance of the solar cells.

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[해외논문] Real Time Investigation of the Interface between a P3HT:PCBM Layer and an Al Electrode during Thermal Annealing

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[해외논문] Real Time Investigation of the Interface between a P3HT:PCBM Layer and an Al Electrode during Thermal Annealing

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